Patents by Inventor Masaki Tomiya

Masaki Tomiya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7934324
    Abstract: A linear scale that is used for displacement measurement is provided. The linear scale includes a scale board, a graduation unit, and an attachment unit. The scale board is made of low expansion ceramics. The graduation unit is fixed to an upper surface of the scale board. The graduation unit is read at the time of measurement. The attachment unit is a unit for attaching the scale board to a base member.
    Type: Grant
    Filed: March 23, 2010
    Date of Patent: May 3, 2011
    Assignee: Mitutoyo Corporation
    Inventors: Masaki Tomiya, Hiroaki Kawada
  • Publication number: 20100242295
    Abstract: A linear scale that is used for displacement measurement is provided. The linear scale includes a scale board, a graduation unit, and an attachment unit. The scale board is made of low expansion ceramics. The graduation unit is fixed to an upper surface of the scale board. The graduation unit is read at the time of measurement. The attachment unit is a unit for attaching the scale board to a base member.
    Type: Application
    Filed: March 23, 2010
    Publication date: September 30, 2010
    Applicant: MITUTOYO CORPORATION
    Inventors: Masaki Tomiya, Hiroaki Kawada
  • Patent number: 6956654
    Abstract: A displacement measuring device allows a plurality of light beams to be incident at positions on a scale or diffracted at points on a scale grating, which are farther spaced away from each other than the diameter of the light beams on the scale grating, and makes an angle of incidence of each light beam on the scale equal generally to an angle of transmission of the diffracted light beam of each light beam. This makes the strength of a detection signal impervious to variations in pitch angle and allows for providing good signals. Accordingly, it is possible to attach the device easily to an apparatus and provide improved ease of use for the device.
    Type: Grant
    Filed: February 3, 2003
    Date of Patent: October 18, 2005
    Assignee: Mitutoyo Corporation
    Inventors: Motohiro Osaki, Masaki Tomiya
  • Publication number: 20030160966
    Abstract: A displacement measuring device allows a plurality of light beams to be incident at positions on a scale or diffracted at points on a scale grating, which are farther spaced away from each other than the diameter of the light beams on the scale grating, and makes an angle of incidence of each light beam on the scale equal generally to an angle of transmission of the diffracted light beam of each light beam. This makes the strength of a detection signal impervious to variations in pitch angle and allows for providing good signals. Accordingly, it is possible to attach the device easily to an apparatus and provide improved ease of use for the device.
    Type: Application
    Filed: February 3, 2003
    Publication date: August 28, 2003
    Applicant: Mitutoyo Corporation
    Inventors: Motohiro Osaki, Masaki Tomiya
  • Patent number: 5424829
    Abstract: A lattice interference-type displacement detection device including a scale having a penetration-type diffraction lattice formed on one side thereof, and an optical system positioned adjacent to the diffraction lattice and remote from the scale. The optical system includes a light source which emits a light beam along a light source optical path, a light beam divergence arrangement for branching the light beam into first and second divergence beams along first and second optical paths, respectively, and for causing the first and second divergence beams to be incident at a diffraction point on the diffraction lattice, a light beam mixing arrangement for generating first and second mixing light beams from a first group of diffraction light beams generated at the diffraction point, and an arrangement for converting the first and second mixing light beams into respective electrical signals. The scale also includes a light reflection surface remote from the optical system with respect to the diffraction lattice.
    Type: Grant
    Filed: September 2, 1992
    Date of Patent: June 13, 1995
    Assignee: Mitutoyo Corporation
    Inventors: Soichi Sato, Masaki Tomiya, Tatsuo Itabashi
  • Patent number: 5386291
    Abstract: A displacement sensor is disclosed, which permits a semiconductor laser to be used as a light source with less thermal effects thereof. A spindle 18 with a scale 32 mounted thereon is disposed in a housing 11 or displacement. In the housing are also provided a semiconductor laser 35 for projecting a laser beam onto the scale and a transducer 36 for converting light form the scale into an electric signal. A heat insulation arrangement 41 is provided between the semiconductor laser 35 and the scale 32 to prevent transmission of heat from the semiconductor laser 35 to the scale 32. A heat radiation arrangement for radiating heat from the semiconductor laser 35 to the outside of the housing 11 is mounted in the housing 11. Thus, thermal effects of the semiconductor laser 35 on the scale 32 are reduced, and thus the accuracy of measurement is improved.
    Type: Grant
    Filed: November 22, 1993
    Date of Patent: January 31, 1995
    Assignee: Mitutoyo Corporation
    Inventors: Soichi Sato, Masaki Tomiya, Tatsuo Itabashi
  • Patent number: 5058119
    Abstract: A laser measuring apparatus is provided with an air stirring means for making the temperature of the air in the casing uniform at every portion. The linearity of laser light in the casing is maintained regardless of generation of heat or cold transmitted to the casing, and the optical path is maintained as predetermined, thereby producing a measuring result including no error caused by the influence of heat.
    Type: Grant
    Filed: January 12, 1990
    Date of Patent: October 15, 1991
    Assignee: Mitutoyo Corporation
    Inventors: Masamichi Suzuki, Masaki Tomiya, Yoshiharu Kuwabara