Patents by Inventor Masako Nishimura

Masako Nishimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10020163
    Abstract: For a novice user to easily recognize a difference between imaging results caused by a difference between observation conditions, a computer has an operation screen display observation target setting buttons for changing an observation condition for a specimen including a combination of parameter setting values of a charged particle beam apparatus. The processing unit has the operation screen display a radar chart including a characteristic, indicated by three or more incompatible items, of an observation condition for each of the observation target setting buttons. The radar chart indicates at least items of high resolution, emphasis on surface structure and emphasis on material difference.
    Type: Grant
    Filed: August 2, 2016
    Date of Patent: July 10, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yayoi Konishi, Mitsugu Sato, Masaki Takano, Shotaro Tamayama, Masako Nishimura, Shunya Watanabe, Mami Konomi
  • Patent number: 9741526
    Abstract: Disclosed is a charged particle beam apparatus wherein a partitioning film capable of transmitting a charged particle beam is provided between a charged particle optical system and a sample, said charged particle beam apparatus eliminating a contact between the sample and the partitioning film even in the cases where the sample has recesses and protrusions. On the basis of detection signals or an image generated on the basis of the detection signals, a distance between a sample and a partitioning film is monitored, said detection signals being outputted from a detector that detects secondary charged particles discharged from the sample due to irradiation of a primary charged particle beam.
    Type: Grant
    Filed: March 10, 2014
    Date of Patent: August 22, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yusuke Ominami, Masako Nishimura, Shinsuke Kawanishi, Hiroyuki Suzuki
  • Publication number: 20160343542
    Abstract: For a novice user to easily recognize a difference between imaging results caused by a difference between observation conditions, a computer has an operation screen display observation target setting buttons for changing an observation condition for a specimen including a combination of parameter setting values of a charged particle beam apparatus. The processing unit has the operation screen display a radar chart including a characteristic, indicated by three or more incompatible items, of an observation condition for each of the observation target setting buttons. The radar chart indicates at least items of high resolution, emphasis on surface structure and emphasis on material difference.
    Type: Application
    Filed: August 2, 2016
    Publication date: November 24, 2016
    Inventors: Yayoi KONISHI, Mitsugu SATO, Masaki TAKANO, Shotaro TAMAYAMA, Masako NISHIMURA, Shunya WATANABE, Mami KONOMI
  • Patent number: 9443694
    Abstract: For a novice user to easily recognize a difference between imaging results caused by a difference between observation conditions, a computer has an operation screen display observation target setting buttons for changing an observation condition for a specimen including a combination of parameter setting values of a charged particle beam apparatus. The processing unit has the operation screen display a radar chart including a characteristic, indicated by three or more incompatible items, of an observation condition for each of the observation target setting buttons. The radar chart indicates at least items of high resolution, emphasis on surface structure and emphasis on material difference.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: September 13, 2016
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yayoi Konishi, Mitsugu Sato, Masaki Takano, Shotaro Tamayama, Masako Nishimura, Shunya Watanabe, Mami Konomi
  • Publication number: 20160203944
    Abstract: Disclosed is a charged particle beam apparatus wherein a partitioning film capable of transmitting a charged particle beam is provided between a charged particle optical system and a sample, said charged particle beam apparatus eliminating a contact between the sample and the partitioning film even in the cases where the sample has recesses and protrusions. On the basis of detection signals or an image generated on the basis of the detection signals, a distance between a sample and a partitioning film is monitored, said detection signals being outputted from a detector that detects secondary charged particles discharged from the sample due to irradiation of a primary charged particle beam.
    Type: Application
    Filed: March 10, 2014
    Publication date: July 14, 2016
    Inventors: Yusuke OMINAMI, Masako NISHIMURA, Shinsuke KAWANISHI, Hiroyuki SUZUKI
  • Patent number: 9086343
    Abstract: Disclosed is a method for enabling flexibility of the exoskeletons or joints of aquatic organisms immersed in an ion liquid water solution to be maintained without destroying their original forms by reducing the difference in osmotic pressure between the inside and outside of the aquatic organisms, preventing dehydration of biological samples. First, the aquatic organism is put into a low-concentration ionic liquid to increase continuously the concentration of the ionic liquid, enabling the water content of the aquatic organism to be substituted by a high-concentration ionic liquid in their original forms. The use of the increasing method that gentle increase in temperature of the ionic liquid by means of natural seasoning reduces the osmotic pressure difference between the inside and outside of the aquatic organism, increasing the concentration of the ionic liquid inside of the aquatic organism.
    Type: Grant
    Filed: February 20, 2013
    Date of Patent: July 21, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Masamichi Shiono, Masako Nishimura, Mami Konomi
  • Patent number: 9058957
    Abstract: A charged particle beam apparatus is provided with a parameter adjustment practice function for allowing any user to easily learn manual focus adjustment and stigma adjustment. Control conditions of the focus arrangement of an objective lens, an X-stigmator and a Y-stigmator are set according to the user's operation. According to a group of the focus adjustment, an X-stigma adjustment and a Y-stigma adjustment which are set, a practice-purpose image corresponding to the control conditions is read out from a storage device and is displayed on a screen.
    Type: Grant
    Filed: May 28, 2012
    Date of Patent: June 16, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kunji Shigeto, Mitsugu Sato, Noriko Iizumi, Hiroyuki Noda, Masako Nishimura, Shunya Watanabe, Mami Konomi, Shinichi Tomita, Ryuichiro Tamochi
  • Publication number: 20150076348
    Abstract: For a novice user to easily recognize a difference between imaging results caused by a difference between observation conditions, a computer has an operation screen display observation target setting buttons for changing an observation condition for a specimen including a combination of parameter setting values of a charged particle beam apparatus. The processing unit has the operation screen display a radar chart including a characteristic, indicated by three or more incompatible items, of an observation condition for each of the observation target setting buttons. The radar chart indicates at least items of high resolution, emphasis on surface structure and emphasis on material difference.
    Type: Application
    Filed: March 15, 2013
    Publication date: March 19, 2015
    Inventors: Yayoi Konishi, Mitsugu Sato, Masaki Takano, Shotaro Tamayama, Masako Nishimura, Shunya Watanabe, Mami Konomi
  • Publication number: 20140370540
    Abstract: Disclosed is a method for enabling flexibility of the exoskeletons or joints of aquatic organisms immersed in an ion liquid water solution to be maintained without destroying their original forms by reducing the difference in osmotic pressure between the inside and outside of the aquatic organisms, preventing dehydration of biological samples. First, the aquatic organism is put into a low-concentration ionic liquid to increase continuously the concentration of the ionic liquid, enabling the water content of the aquatic organism to be substituted by a high-concentration ionic liquid in their original forms. The use of the increasing method that gentle increase in temperature of the ionic liquid by means of natural seasoning reduces the osmotic pressure difference between the inside and outside of the aquatic organism, increasing the concentration of the ionic liquid inside of the aquatic organism.
    Type: Application
    Filed: February 20, 2013
    Publication date: December 18, 2014
    Inventors: Masamichi Shiono, Masako Nishimura, Mami Konomi
  • Publication number: 20140131590
    Abstract: In recent years, a range of users for a charged particle beam apparatus such as a scanning electron microscope has been broadened. All users want to learn a manual adjustment technology, but it is very difficult to adjust all parameters for observation to have an appropriate value. Therefore, a beginner is unlikely to sufficiently show a performance of an apparatus. This disclosure aims to provide the charged particle beam apparatus including a parameter adjustment practice function for allowing any user to easily learn the manual adjustment technology. In order to solve the above-described problem, there is provided means for practicing a focus adjustment and a stigma adjustment. Control conditions of the focus arrangement of an objective lens, an X-stigmator and a Y-stigmator are set according to the user's operation.
    Type: Application
    Filed: May 28, 2012
    Publication date: May 15, 2014
    Inventors: Kunji Shigeto, Mitsugu Sato, Noriko Iizumi, Hiroyuki Noda, Masako Nishimura, Shunya Watanabe, Mami Konomi, Shinichi Tomita, Ryuichiro Tamochi
  • Patent number: 8698079
    Abstract: A micro sample floating on the surface of an ionic liquid is observed by scanning electron microscopy without the sample being covered with the ionic liquid. A floating or hydrophobic sample is floated on the surface of a hydrophilic ionic liquid aqueous solution to prevent the micro sample from being covered with the ionic liquid. A hydrophobic ionic liquid is used for hydrophilic samples. With the use of an ionic liquid aqueous solution of low viscosity and large flowability, the micro sample is allowed to freely aggregate, disperse, and align on the surface of the ionic liquid, and to refloat even when settled in the ionic liquid. For easy observation with a scanning electron microscope, the ionic liquid aqueous solution is dried to lower the flowability of the ionic liquid aqueous solution, after the form of the micro sample has stabilized and before electron microscope observation.
    Type: Grant
    Filed: September 16, 2011
    Date of Patent: April 15, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Masamichi Shiono, Masako Nishimura, Mami Konomi, Susumu Kuwabata
  • Publication number: 20130221217
    Abstract: A micro sample floating on the surface of an ionic liquid is observed by scanning electron microscopy without the sample being covered with the ionic liquid. A floating or hydrophobic sample is floated on the surface of a hydrophilic ionic liquid aqueous solution to prevent the micro sample from being covered with the ionic liquid. A hydrophobic ionic liquid is used for hydrophilic samples. With the use of an ionic liquid aqueous solution of low viscosity and large flowability, the micro sample is allowed to freely aggregate, disperse, and align on the surface of the ionic liquid, and to refloat even when settled in the ionic liquid. For easy observation with a scanning electron microscope, the ionic liquid aqueous solution is dried to lower the flowability of the ionic liquid aqueous solution, after the form of the micro sample has stabilized and before electron microscope observation.
    Type: Application
    Filed: September 16, 2011
    Publication date: August 29, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Masamichi Shiono, Masako Nishimura, Mami Konomi, Susumu Kuwabata
  • Publication number: 20120326033
    Abstract: Firstly, displacement between an electron microscope image and an optical image is minimized; secondly, color information obtained by an optical image device having a digital picture function is added to an electron0 microscope image; and thirdly, a whole structure of equipment is simplified. The main character is that a mirror and backscattered electron detector is used and an electron beam to strike on a specimen and an optical axis from the optical image device coincide with each other. Addition of a function of an optical mirror to a backscattered electron detector permits a whole structure of equipment to be simplified, and a beam axis of an electron microscope and the optical axis of the optical image device to coincide with each other.
    Type: Application
    Filed: November 8, 2010
    Publication date: December 27, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Masamichi Shiono, Masako Nishimura
  • Publication number: 20060011834
    Abstract: High resolution observation is achieved at a low acceleration voltage of 5 kV or below under a high pressure condition of a sample chamber. A sample chamber has a double structure and an inner sample chamber for keeping low vacuum is arranged inside an outer sample chamber having high vacuum. A relatively high negative voltage such as ?1 to ?9 kV for decelerating electrons immediately before a sample is applied between the outer sample chamber and the inner sample chamber. When an incident electron beam passes through an objective lens, an electron beam keeping high energy and having small aberration is formed and is decelerated immediately before the sample to acquire high resolution at a low acceleration voltage.
    Type: Application
    Filed: July 12, 2005
    Publication date: January 19, 2006
    Inventors: Masako Nishimura, Mitsuhiko Yamada
  • Patent number: D774045
    Type: Grant
    Filed: December 23, 2013
    Date of Patent: December 13, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPROATION
    Inventors: Yayoi Konishi, Naoko Ushio, Masako Nishimura, Mami Konomi, Shunya Watanabe
  • Patent number: D774046
    Type: Grant
    Filed: December 23, 2013
    Date of Patent: December 13, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yayoi Konishi, Masako Nishimura, Shunya Watanabe
  • Patent number: D774074
    Type: Grant
    Filed: December 23, 2013
    Date of Patent: December 13, 2016
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yayoi Konishi, Shotaro Tamayama, Masako Nishimura
  • Patent number: D778920
    Type: Grant
    Filed: December 23, 2013
    Date of Patent: February 14, 2017
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yayoi Konishi, Masaki Takano, Shotaro Tamayama, Kunji Shigeto, Masako Nishimura