Patents by Inventor Masami Nishio

Masami Nishio has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5377279
    Abstract: A method of displaying a defect appearing on an elongated object conveyed in one direction. The method comprises the steps of scanning the object in the width direction thereof by means of a sensor camera, and obtaining object image data corresponding to the object, processing the object image data, to detect a defect in the object, storing the object image data in an image memory in a scroll manner, stopping the scroll storing of the object image data in the image memory and storing the object image data output subsequently from the sensor camera in the other image memory in response to the detection of the defect, and retaining the object image data including the defect in the image memories as still image data, and displaying the still image data read out from the image memories on a monitor screen as a still image such that the defect is displayed at a predetermined position on the monitor screen.
    Type: Grant
    Filed: September 17, 1992
    Date of Patent: December 27, 1994
    Assignee: Futec Inc.
    Inventors: Hideyuki Hanafusa, Masami Nishio
  • Patent number: 5253306
    Abstract: A method for matching patterns includes the steps of optically scanning a master image and a to-be-recognized image and outputting master image data and to-be-recognized image data, extracting master outline data representing an outline of the master image from the master image data, extracting to-be-recognized outline data representing an outline of a to-be-recognized image from the to-be-recognized image data, performing an enlargement process for the to-be-recognized outline data to enlarge the to-be-recognized outline, thereby forming to-be-recognized outline data, and collating the master outline data with the to-be-recognized outline data, and if a portion of the master outline projects from the to-be-recognized outline, determining that the to-be-recognized image has a short-defect indicating an omission of the image
    Type: Grant
    Filed: December 31, 1990
    Date of Patent: October 12, 1993
    Assignee: Futec Inc.
    Inventor: Masami Nishio