Abstract: A plasma atomic layer deposition apparatus includes: a source gas supply port functioning also as a cleaning gas supply port provided on a first side wall of a film-forming container; and a source gas exhaust port functioning also as a cleaning gas exhaust port provided on a second side wall opposed to the first side wall of the film-forming container.

Abstract: An object is to improve performance of a protection film for an organic EL device. A forming method of the protection film for an organic EL device includes the steps of: (a) forming an organic EL device over a flexible substrate; and (b) forming a protection film including an SiOC film so as to cover the organic EL device. Moreover, the SiOC film is formed by an ALD method using a compound containing Si and C as a material, the compound containing Si and C has at least one or more C atoms in a main chain between Si atom and Si atom, and amino groups are respectively bonded to the Si atoms on both ends of the main chain. According to this method, carbon (C) can be effectively taken into an SiO film to be formed. This SiOC film has a moisture barrier property and flexibility. Thus, it is possible to protect the organic EL device from moisture, and its bending resistance can be improved.

Abstract: A plasma atomic layer deposition apparatus includes: a source gas supply port functioning also as a cleaning gas supply port provided on a first side wall of a film-forming container; and a source gas exhaust port functioning also as a cleaning gas exhaust port provided on a second side wall opposed to the first side wall of the film-forming container.