Patents by Inventor Masamune Takeda
Masamune Takeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20120168625Abstract: A millimeter wave imaging sensor includes a plurality of millimeter wave sensors disposed on one plane intersecting an incoming direction of millimeter waves emitted from a subject. Each of the plurality of millimeter wave sensors includes an antenna portion, a wave detection unit, a transmission path, and a shielding member. Adjacent millimeter wave sensors, among the plurality of millimeter wave sensors, are positioned according to outer peripheral shape of the shielding members of the adjacent millimeter wave sensors.Type: ApplicationFiled: June 4, 2010Publication date: July 5, 2012Applicants: MASPRODENKOH KABUSHIKIKAISHA, TOHOKU UNIVERSITY, CHUO ELECTRONICS CO., LTDInventors: Jun Uemura, Masamune Takeda, Kota Yamada, Junichi Takahashi, Tsuyoshi Hasegawa, Haruyuki Hirai, Hirotaka Niikura, Tomohiko Matsuzaki, Hiroyasu Sato, Kunio Sawaya, Koji Mizuno
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Patent number: 8208687Abstract: A millimetric wave imaging device includes: a lens antenna; a polygon mirror; a receiving portion; a scanning unit; and an image data generating unit. The receiving portion receives millimetric wave radiated from an object, transmitted through the lens antenna, and reflected on a mirror surface of the polygon mirror rotated by the scanning unit to detect a signal level of the millimetric wave. The image data generating unit generates image data representing an object image by receiving a detection signal from the receiving portion while driving the polygon mirror through the scanning unit.Type: GrantFiled: March 13, 2008Date of Patent: June 26, 2012Assignee: Masprodenkoh KabushikikaishaInventors: Masamune Takeda, Masatoshi Sugita, Jun Uemura
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Publication number: 20120075479Abstract: There is provided a millimeter wave imaging apparatus including: a lens antenna forming a subject image based on the millimeter waves from a subject; a line sensor including a plurality of millimeter wave sensors and capturing an image for one line of a predetermined width of the whole subject; a reflector having a reflecting surface reflecting millimeter waves; a reflection angle change device changing an angle of the reflecting surface; an image generation device generating an image of the whole subject from the respective subject images for one line; a millimeter wave radiation unit radiating a reference millimeter wave; a correction value setting device setting correction values with respect to the detected values by the millimeter wave sensors based on the millimeter wave from the millimeter wave radiation unit; and a detected value correction device correcting the detected values by the millimeter wave sensors with the correction values.Type: ApplicationFiled: June 4, 2010Publication date: March 29, 2012Applicants: MASPRODENKOH KABUSHIKIKAISHA, TOHOKU UNIVERSITY, CHUO ELECTRONICS CO., LTDInventors: Jun Uemura, Masamune Takeda, Kota Yamada, Junichi Takahashi, Tsuyoshi Hasegawa, Haruyuki Hirai, Hirotaka Niikura, Tomohiko Matsuzaki, Hiroyasu Sato, Kunio Sawaya, Koji Mizuno
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Publication number: 20110260905Abstract: A millimeter wave imaging apparatus includes: an imaging device including a plurality of millimeter wave sensors that are arranged in a planar manner and receive millimeter waves radiated from a subject to detect signal levels thereof; a temperature sensor that detects a temperature of the imaging device; a storage device that stores, with respect to the each of the millimeter wave sensors, temperature characteristics data indicating a relationship between the temperature detected by the temperature sensor and the output from the millimeter wave sensor; and an image data generation device that obtains a deviation of an output from the each of the millimeter wave sensors from reference temperature characteristics based on the temperature detected by the temperature sensor and the temperature characteristics data stored by the storage device, corrects the output from the each of the millimeter wave sensors based on the deviation, and thereby generates the image data.Type: ApplicationFiled: June 26, 2009Publication date: October 27, 2011Applicants: MASPRODENKOH KABUSHIKIKAISHA, TOHOKU UNIVERSITY, CHUO ELECTRONICS CO., LTD.Inventors: Jun Uemura, Masamune Takeda, Kota Yamada, Tsuyoshi Hasegawa, Haruyuki Hirai, Hirotaka Niikura, Tomohiko Matsuzaki, Hiroyasu Sato, Kunio Sawaya, Koji Mizuno
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Publication number: 20110234783Abstract: A millimeter wave imaging apparatus includes: an imaging device provided with a millimeter wave sensor that receives millimeter waves radiated from a subject; an image data generation device that generates image data of the subject based on an output from the millimeter wave sensor constituting the imaging device; a storage device that stores inspection target object data indicating, with respect to each object to be an inspection target object, a shape of the object and a size of the object relative to the subject; a detection device that compares the inspection target object data stored by the storage device and the image data generated by the image data generation device, thereby to detect an inspection target object hidden in the subject; and an output device that outputs results of detection by the detection device.Type: ApplicationFiled: June 26, 2009Publication date: September 29, 2011Applicants: MASPRODENKOH KABUSHIKIKAISHA, CHUO ELECTRONICS CO., LTD., TOHOKU UNIVERSITYInventors: Jun Uemura, Masamune Takeda, Junichi Takahashi, Tsuyoshi Hasegawa, Haruyuki Hirai, Hirotaka Niikura, Tomohiko Matsuzaki, Hiroyasu Sato, Kunio Sawaya, Koji Mizuno
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Patent number: 7999560Abstract: An interference exclusion capability testing apparatus is provided for use in testing interference exclusion capability of a specimen by radiating an electromagnetic wave toward the specimen from a radiating antenna. The radiating antenna includes an electromagnetic horn, and a waveguide plate that guides an electromagnetic wave radiated from the electromagnetic horn to the specimen.Type: GrantFiled: October 26, 2006Date of Patent: August 16, 2011Assignee: Masprodenkoh KabushikikaishaInventors: Toshihiro Sugiura, Masamune Takeda, Junichi Takahashi
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Publication number: 20110163876Abstract: A millimeter wave imaging apparatus includes: an imaging device having a plurality of millimeter wave sensors that are arranged in a planar manner and receive millimeter waves radiated from a subject to detect signal levels thereof; an image data generation device that generates image data of the subject based on an output from each of the millimeter wave sensors constituting the imaging device; and a case that has a placement surface on which the subject can be placed and which permits transmission of the millimeter waves. The imaging device is arranged below the placement surface of the case, so that the millimeter waves, which are radiated from a bottom part of the subject placed on the placement surface of the case, are received by the plurality of millimeter wave sensors.Type: ApplicationFiled: June 26, 2009Publication date: July 7, 2011Applicants: MASPRODENKOH KABUSHIKIKAISHA, CHUO ELECTRONICS CO., LTD., TOHOKU UNIVERSITYInventors: Jun Uemura, Masamune Takeda, Junichi Takahashi, Tsuyoshi Hasegawa, Haruyuki Hirai, Hirotaka Niikura, Tomohiko Matsuzaki, Hiroyasu Sato, Kunio Sawaya, Koji Mizuno
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Publication number: 20100104193Abstract: A millimetric wave imaging device includes: a lens antenna; a polygon mirror; a receiving portion; a scanning unit; and an image data generating unit. The receiving portion receives millimetric wave radiated from an object, transmitted through the lens antenna, and reflected on a mirror surface of the polygon mirror rotated by the scanning unit to detect a signal level of the millimetric wave. The image data generating unit generates image data representing an object image by receiving a detection signal from the receiving portion while driving the polygon mirror through the scanning unit.Type: ApplicationFiled: March 13, 2008Publication date: April 29, 2010Applicant: MASPRODENKOH KABUSHIKIKAISHAInventors: Masamune Takeda, Masatoshi Sugita, Jun Uemura
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Publication number: 20090140750Abstract: An interference exclusion capability testing apparatus is provided for use in testing interference exclusion capability of a specimen by radiating an electromagnetic wave toward the specimen from a radiating antenna. The radiating antenna includes an electromagnetic horn, and a waveguide plate that guides an electromagnetic wave radiated from the electromagnetic horn to the specimen.Type: ApplicationFiled: October 26, 2006Publication date: June 4, 2009Applicant: MASPRODENKON KABUSHIKIKAISHAInventors: Toshihiro Sugiura, Masamune Takeda, Junichi Takahashi
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Patent number: D611459Type: GrantFiled: June 19, 2008Date of Patent: March 9, 2010Assignee: Masprodenkoh KabushikikaishaInventors: Masamune Takeda, Kota Yamada