Patents by Inventor Masanobu Higashide

Masanobu Higashide has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8229584
    Abstract: An abnormality detection system includes a measurement unit, a decision unit, an alarm unit, and storage units, and serves to detect the abnormality in a control characteristic value of a plurality of products manufactured on the same production line. The decision unit receives the control characteristic value stored in the storage unit, and decides whether an abnormality exists, based on that value. More specifically, the decision unit decides that the control characteristic value is abnormal when, with respect to m (m is a natural number) pieces of the products that are consecutively manufactured, an absolute value of a difference in control characteristic value between each of the products and another manufactured immediately before the former is equal to or less than a predetermined constant.
    Type: Grant
    Filed: January 16, 2007
    Date of Patent: July 24, 2012
    Assignees: Renesas Electronics Corporation, NEC Corporation
    Inventors: Masanobu Higashide, Gouki Sadakuni
  • Patent number: 7636609
    Abstract: In a method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, it is determined whether or not a successive-decrease (or increase) tendency has occurred in a plurality of sequentially-obtained characteristic values of the products. Also, it is determined whether or not at least a last one of the characteristic values is located within a control region narrower than an allowable region and outside a normal region narrower than the control region. Further, when the successive-decrease or increase tendency has occurred and the last characteristic value is located within the control region outside the normal region, an alarm state is detected.
    Type: Grant
    Filed: March 10, 2006
    Date of Patent: December 22, 2009
    Assignee: NEC Electronics Corporation
    Inventor: Masanobu Higashide
  • Patent number: 7590465
    Abstract: In a method for detecting abnormal characteristic values of at least three products sequentially manufactured in the same manufacturing line, it is determined whether or not a successively-alternate increase/decrease tendency has occurred in a plurality of sequentially-obtained characteristic values of the products. Also, it is determined whether or not at least one of the characteristic values is located within a control region narrower than an allowable region and outside a normal region narrower than the control region. Further, when the successively-alternate increase/decrease tendency has occurred and the at least one characteristic value is located within the control region outside the normal region, an alarm state is detected.
    Type: Grant
    Filed: July 12, 2006
    Date of Patent: September 15, 2009
    Assignee: NEC Electronics Corporation
    Inventor: Masanobu Higashide
  • Publication number: 20070203603
    Abstract: An abnormality detection system includes a measurement unit, a decision unit, an alarm unit, and storage units, and serves to detect the abnormality in a control characteristic value of a plurality of products manufactured on the same production line. The decision unit receives the control characteristic value stored in the storage unit, and decides whether an abnormality exists, based on that value. More specifically, the decision unit decides that the control characteristic value is abnormal when, with respect to m (m is a natural number) pieces of the products that are consecutively manufactured, an absolute value of a difference in control characteristic value between each of the products and another manufactured immediately before the former is equal to or less than a predetermined constant.
    Type: Application
    Filed: January 16, 2007
    Publication date: August 30, 2007
    Applicants: NEC ELECTRONICS CORPORATION, NEC CORPORATION
    Inventors: Masanobu Higashide, Gouki Sadakuni
  • Publication number: 20070012085
    Abstract: In a method for detecting abnormal characteristic values of at least three products sequentially manufactured in the same manufacturing line, it is determined whether or not a successively-alternate increase/decrease tendency has occurred in a plurality of sequentially-obtained characteristic values of the products. Also, it is determined whether or not at least one of the characteristic values is located within a control region narrower than an allowable region and outside a normal region narrower than the control region. Further, when the successively-alternate increase/decrease tendency has occurred and the at least one characteristic value is located within the control region outside the normal region, an alarm state is detected.
    Type: Application
    Filed: July 12, 2006
    Publication date: January 18, 2007
    Applicant: NEC ELECTRONICS CORPORATION
    Inventor: Masanobu Higashide
  • Publication number: 20060224267
    Abstract: In a method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, it is determined whether or not a successive lower or upper tendency with respect to a control center value has occurred in a plurality of sequentially-obtained characteristic values of the products. Also, it is determined whether or not at least one of the characteristic values is located within a control region narrower than an allowable region and outside a normal region narrower than the control region. Further, when the successive lower or upper tendency has occurred and the at least one characteristic value is located within the control region outside the normal region, an alarm state is detected.
    Type: Application
    Filed: March 20, 2006
    Publication date: October 5, 2006
    Applicant: NEC ELECTRONICS CORPORATION
    Inventor: Masanobu Higashide
  • Publication number: 20060206230
    Abstract: In a method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, it is determined whether or not a successive-decrease (or increase) tendency has occurred in a plurality of sequentially-obtained characteristic values of the products. Also, it is determined whether or not at least a last one of the characteristic values is located within a control region narrower than an allowable region and outside a normal region narrower than the control region. Further, when the successive-decrease tendency has occurred and the last characteristic value is located within the control region outside the normal region, an alarm state is detected.
    Type: Application
    Filed: March 10, 2006
    Publication date: September 14, 2006
    Applicant: NEC ELECTRONICS CORPORATION
    Inventor: Masanobu Higashide