Abstract: A display control apparatus connected to a display apparatus, which is remotely controllable through wireless communication, generates a first video/audio signal for displaying a first image on the display apparatus, and outputs the first video/audio signal to the display apparatus. Either of a first signal pattern indicative of a command to cause the first image based on the first video/audio signal to be displayed on the display apparatus or a second signal pattern indicative of a command to cause a second image based on a second video/audio signal, which is obtained from a device different from the display control apparatus, to be displayed on the display apparatus is selected, and a wireless signal of the selected signal pattern is outputted to the display apparatus through the wireless communication. Information determined based on the signal pattern of the outputted wireless signal is informed from an apparatus different from the display apparatus.

Abstract: A display control apparatus connected to a display apparatus, which is remotely controllable through wireless communication, generates a first video/audio signal for displaying a first image on the display apparatus, and outputs the first video/audio signal to the display apparatus. Either of a first signal pattern indicative of a command to cause the first image based on the first video/audio signal to be displayed on the display apparatus or a second signal pattern indicative of a command to cause a second image based on a second video/audio signal, which is obtained from a device different from the display control apparatus, to be displayed on the display apparatus is selected, and a wireless signal of the selected signal pattern is outputted to the display apparatus through the wireless communication. Information determined based on the signal pattern of the outputted wireless signal is informed from an apparatus different from the display apparatus.

Abstract: The height of protuberances present on the surface of a product, typically a bump wafer, can be measured with a high accuracy irrespective of the state of the upper surfaces of the protuberances. In the signal processor of a bump height measuring apparatus, a bump height measurement area setting section set a bump height measurement area by the bump layout information, a statistical application section averages the height data in an statistical calculation within the measurement area, a contour line calculating section calculates a contour line of a section of the bump, and a bump height determining section determines a peak value in the contour line as the height of the bump.