Patents by Inventor Masanori Fukawa

Masanori Fukawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8547547
    Abstract: The present invention is to provide an optical surface defect inspection apparatus or an optical surface defect inspection method that can improve a signal-to-noise ratio according to a multi-segmented cell method without performing autofocus operations, and can implement highly sensitive inspection. The present invention is an optical surface defect inspection apparatus or an optical surface defect inspection method in which an inspection beam is applied onto a test subject, an image of a scattered light from the surface of the test subject is formed on a photo-detector, and a defect on the surface of the test subject is inspected based on an output from the photo-detector. The photo-detector has an optical fiber bundle. One end thereof forms a circular light receiving surface to receive the scattered light. The other end thereof is connected to a plurality of light receiving devices.
    Type: Grant
    Filed: August 19, 2011
    Date of Patent: October 1, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Shintaro Tamura, Masanori Fukawa, Ayumu Ishihara, Kenichi Shitara, Hiroshi Nakajima
  • Patent number: 8542453
    Abstract: An inspection method and inspection apparatus of a magnetic disk are provided. A gliding test and a certification test are performed at the same time by simultaneously moving a head for the certification test and a head for the gliding test with a heat distortion utilization mechanism (a micro thermal actuator) along a recording surface of the magnetic disk during rotation at a predetermined revolving speed. A flying height of the head for the gliding test is determined according to a revolving speed of the disk. When the flying height of the head for gliding test is determined according to the revolving speed at the certification test, the head for the gliding test is adjusted to a desired height by adjusting a variation of the heat distortion utilization mechanism disposed on the head for the gliding test. The gliding and certification inspections can be performed at the same time.
    Type: Grant
    Filed: January 9, 2012
    Date of Patent: September 24, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kyoichi Mori, Masanori Fukawa
  • Publication number: 20120176877
    Abstract: An inspection method and inspection apparatus of a magnetic disk are provided. A gliding test and a certification test are performed at the same time by simultaneously moving a head for the certification test and a head for the gliding test with a heat distortion utilization mechanism (a micro thermal actuator) along a recording surface of the magnetic disk during rotation at a predetermined revolving speed. A flying height of the head for the gliding test is determined according to a revolving speed of the disk. When the flying height of the head for gliding test is determined according to the revolving speed at the certification test, the head for the gliding test is adjusted to a desired height by adjusting a variation of the heat distortion utilization mechanism disposed on the head for the gliding test. The gliding and certification inspections can be performed at the same time.
    Type: Application
    Filed: January 9, 2012
    Publication date: July 12, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: KYOICHI MORI, MASANORI FUKAWA
  • Publication number: 20120075625
    Abstract: The present invention is to provide an optical surface defect inspection apparatus or an optical surface defect inspection method that can improve a signal-to-noise ratio according to a multi-segmented cell method without performing autofocus operations, and can implement highly sensitive inspection. The present invention is an optical surface defect inspection apparatus or an optical surface defect inspection method in which an inspection beam is applied onto a test subject, an image of a scattered light from the surface of the test subject is formed on a photo-detector, and a defect on the surface of the test subject is inspected based on an output from the photo-detector. The photo-detector has an optical fiber bundle. One end thereof forms a circular light receiving surface to receive the scattered light. The other end thereof is connected to a plurality of light receiving devices.
    Type: Application
    Filed: August 19, 2011
    Publication date: March 29, 2012
    Inventors: Shintaro TAMURA, Masanori Fukawa, Ayumu Ishihara, Kenichi Shitara, Hiroshi Nakajima
  • Patent number: 5936807
    Abstract: A magnetic head loading mechanism for loading two magnetic heads 2(A) and 2(B), each of which is attached at a tip of respective one of supporting arms 3 and 3, onto a surface of a magnetic disc 1 to be tested being rotated with high rotation speed, comprising: two adopters 71(A) and 71(B), on which are fixed the supporting arms 3 and 3 in a detachable manner; two head position adjusting mechanisms 74(A) and 74(B) for rotating the adopters 71(A) and 71(B) so as to bring the supporting arms 3 and 3 into either an escaping condition in which they are far away from the surfaces of the magnetic disc 1 each by a rotation angle of 90.degree.
    Type: Grant
    Filed: January 16, 1998
    Date of Patent: August 10, 1999
    Assignee: Hitachi Electronics Engineering Co., Ltd.
    Inventors: Masanori Fukawa, Tomomi Inoue