Abstract: The vehicle electronic control apparatus includes two or more FPGAs that each receive information from the sensor, a nonvolatile memory that holds a bit stream for determining a configuration for the FPGA, an MCU that incorporates two or more nonvolatile memories, in each of which a program code for calculating the control command is installed, and an error control module that outputs an error signal to the outside at a time when an abnormality occurs in at least one of the FPGA and the nonvolatile memory incorporated in the MCU; the nonvolatile memory that holds the bit stream and the nonvolatile memory incorporated in the MCU can be accessed from the outside.

Abstract: The vehicle electronic control apparatus includes two or more FPGAs that each receive information from the sensor, a nonvolatile memory that holds a bit stream for determining a configuration for the FPGA, an MCU that incorporates two or more nonvolatile memories, in each of which a program code for calculating the control command is installed, and an error control module that outputs an error signal to the outside at a time when an abnormality occurs in at least one of the FPGA and the nonvolatile memory incorporated in the MCU; the nonvolatile memory that holds the bit stream and the nonvolatile memory incorporated in the MCU can be accessed from the outside.

Abstract: Provided is a gain control amplification device having a wide range and high accuracy and configured to adapt measurement target current to the input range of an A/D converter. The gain control amplification device includes: a plurality of differential amplifiers having different gains with respect to measurement target current or voltage; a threshold control circuit for comparing output of the differential amplifier with threshold voltage; a switch for selecting output of one of the plurality of differential amplifiers on the basis of output of the threshold control circuit; and an offset control circuit OF and an addition circuit for adding offset voltage to output of one of the differential amplifiers.

Abstract: Even when parts having individual differences among identical parts or differences in deterioration speed between parts, or a part that does not have a non-volatile memory such as an EEPROM in a chip of the part itself, are mixed, there is no deterioration diagnosis device that can appropriately diagnose a state of deterioration due to temporal change or the like, because of which a mechanism (correction methodology) for evaluating and correcting deterioration in the precision or performance of an electronic part that has low precision or considerable temporal deterioration, and does not have a correction function, is incorporated in a deterioration diagnosis device, and a deterioration state is diagnosed using incorporated deterioration determination means when using a product after shipping.

Abstract: Provided is a gain control amplification device having a wide range and high accuracy and configured to adapt measurement target current to the input range of an A/D converter. The gain control amplification device includes: a plurality of differential amplifiers having different gains with respect to measurement target current or voltage; a threshold control circuit for comparing output of the differential amplifier with threshold voltage ; a switch for selecting output of one of the plurality of differential amplifiers on the basis of output of the threshold control circuit ; and an offset control circuit OF and an addition circuit for adding offset voltage to output of one of the differential amplifiers.

Abstract: Even when parts having individual differences among identical parts or differences in deterioration speed between parts, or a part that does not have a non-volatile memory such as an EEPROM in a chip of the part itself, are mixed, there is no deterioration diagnosis device that can appropriately diagnose a state of deterioration due to temporal change or the like, because of which a mechanism (correction methodology) for evaluating and correcting deterioration in the precision or performance of an electronic part that has low precision or considerable temporal deterioration, and does not have a correction function, is incorporated in a deterioration diagnosis device, and a deterioration state is diagnosed using incorporated deterioration determination means when using a product after shipping.

Abstract: A driving device 5 includes: a fault detection device 11 that determines a fault in an actuator 6; a serial interface 7 that communicates with an MCU 2; a memory device 10 that stores a program received from the MCU 2 and a fault determination result by the fault detection device 11; a CPU 9 that causes the fault detection device 11 to execute the fault determination according to a fault determination request from the MCU 2; a timer device 16 that measures a limit time over which fault determination is performed and a determination period of fault determination; and a counter device 17 that counts the number of repeats of fault determination and the number of fault occurrences in the actuator 6.

Abstract: A driving device 5 includes: a fault detection device 11 that determines a fault in an actuator 6; a serial interface 7 that communicates with an MCU 2; a memory device 10 that stores a program received from the MCU 2 and a fault determination result by the fault detection device 11; a CPU 9 that causes the fault detection device 11 to execute the fault determination according to a fault determination request from the MCU 2; a timer device 16 that measures a limit time over which fault determination is performed and a determination period of fault determination; and a counter device 17 that counts the number of repeats of fault determination and the number of fault occurrences in the actuator 6.

Abstract: The present invention provides a semiconductor designing apparatus realizing dispersed power consumption timings without causing a setup violation and a hold violation. An STA unit calculates a setup slack as a margin of setup time of a flip-flop on the basis of a present design value of a clock latency of the flip-flop. Based on the calculated setup slack, an HSLD unit adjusts the clock latency of the flip-flop so as to be advanced more than a present design value without causing a timing violation. When a peak equal to or larger than a threshold value remains in the number of synchs in a clock latency distribution as a result of the latency control of the HSLD unit, a PAS unit smoothes the clock latency of the flip-flop without causing a timing violation on the basis of the timing information recalculated by the HSLD unit.

Abstract: An object of the present invention is to provide a semiconductor device capable of recognizing circuit malfunction in an actual operation and of specifying a point of the circuit malfunction, and the semiconductor device, which does not induce the malfunction in the circuit of a subsequent stage when restoring the malfunction. The present invention is the semiconductor device provided with a plurality of logic circuits and a plurality of judging circuits for judging malfunction based on data from the logic circuits, wherein each of the judging circuits is provided with a first register, delay unit, a second register, a comparator and scanning unit, which makes the second register a shift register to allow to transmit an error signal held in the second register to the subsequent stage, while allowing the comparator to hold a comparison result.

Abstract: An object of the present invention is to provide a semiconductor device capable of recognizing circuit malfunction in an actual operation and of specifying a point of the circuit malfunction, and the semiconductor device, which does not induce the malfunction in the circuit of a subsequent stage when restoring the malfunction. The present invention is the semiconductor device provided with a plurality of logic circuits and a plurality of judging circuits for judging malfunction based on data from the logic circuits, wherein each of the judging circuits is provided with a first register, delay unit, a second register, a comparator and scanning unit, which makes the second register a shift register to allow to transmit an error signal held in the second register to the subsequent stage, while allowing the comparator to hold a comparison result.

Abstract: An object of the present invention is to provide a semiconductor device capable of recognizing circuit malfunction in an actual operation and of specifying a point of the circuit malfunction, and the semiconductor device, which does not induce the malfunction in the circuit of a subsequent stage when restoring the malfunction. The present invention is the semiconductor device provided with a plurality of logic circuits and a plurality of judging circuits for judging malfunction based on data from the logic circuits, wherein each of the judging circuits is provided with a first register, delay unit, a second register, a comparator and scanning unit, which makes the second register a shift register to allow to transmit an error signal held in the second register to the subsequent stage, while allowing the comparator to hold a comparison result.

Abstract: An object of the present invention is to provide a semiconductor device capable of recognizing circuit malfunction in an actual operation and of specifying a point of the circuit malfunction, and the semiconductor device, which does not induce the malfunction in the circuit of a subsequent stage when restoring the malfunction. The present invention is the semiconductor device provided with a plurality of logic circuits and a plurality of judging circuits for judging malfunction based on data from the logic circuits, wherein each of the judging circuits is provided with a first register, delay unit, a second register, a comparator and scanning unit, which makes the second register a shift register to allow to transmit an error signal held in the second register to the subsequent stage, while allowing the comparator to hold a comparison result.

Abstract: An object of the present invention is to provide a semiconductor device capable of recognizing circuit malfunction in an actual operation and of specifying a point of the circuit malfunction, and the semiconductor device, which does not induce the malfunction in the circuit of a subsequent stage when restoring the malfunction. The present invention is the semiconductor device provided with a plurality of logic circuits and a plurality of judging circuits for judging malfunction based on data from the logic circuits, wherein each of the judging circuits is provided with a first register, delay unit, a second register, a comparator and scanning unit, which makes the second register a shift register to allow to transmit an error signal held in the second register to the subsequent stage, while allowing the comparator to hold a comparison result.

Abstract: An object of the present invention is to provide a semiconductor device capable of recognizing circuit malfunction in an actual operation and of specifying a point of the circuit malfunction, and the semiconductor device, which does not induce the malfunction in the circuit of a subsequent stage when restoring the malfunction. The present invention is the semiconductor device provided with a plurality of logic circuits and a plurality of judging circuits for judging malfunction based on data from the logic circuits, wherein each of the judging circuits is provided with a first register, delay unit, a second register, a comparator and scanning unit, which makes the second register a shift register to allow to transmit an error signal held in the second register to the subsequent stage, while allowing the comparator to hold a comparison result.

Abstract: An object of the present invention is to provide a semiconductor device capable of recognizing circuit malfunction in an actual operation and of specifying a point of the circuit malfunction, and the semiconductor device, which does not induce the malfunction in the circuit of a subsequent stage when restoring the malfunction. The present invention is the semiconductor device provided with a plurality of logic circuits and a plurality of judging circuits for judging malfunction based on data from the logic circuits, wherein each of the judging circuits is provided with a first register, delay unit, a second register, a comparator and scanning unit, which makes the second register a shift register to allow to transmit an error signal held in the second register to the subsequent stage, while allowing the comparator to hold a comparison result.

Abstract: A logic simulation apparatus is provided with a circuit dividing unit (6) that selects and defines logic cones each of which carries out a logic operation in synchronization with one clock domain as target portions to be speeded up from logic cones extracted by a logic cone extracting unit (5), and that defines logic cones each of which carries out a logic operation based on a plurality of clock domains as nontarget portions not to be speeded up, and a logic compressing unit (7) that compresses the logic of each of the target portions, and performs a logic simulation on each of the target portions whose logic is compressed and also on performs a logic simulation on each of the nontarget portions.

Abstract: The outputting of an output pulse produced in response to the inputting of a data pulse and a clock pulse to a D type flip-flop circuit is repeatedly simulated in a simulation process to extract a pulse time difference between the data pulse and the clock pulse as a timing verification checking value in a checking value extracting process on condition that the level of the output pulse becomes higher than a reference voltage until a simulation completion time and the pulse time difference is within a prescribed range. After the first simulation, an optimum simulation completion time, at which the levels of the data pulse, the clock pulse and the output pulse are respectively set to a constant high value, is determined to be place the optimum simulation completion time between a simulation start time and the simulation completion time, and the level of the output pulse is checked at the optimum simulation completion time in simulations following the first simulation.

Abstract: A logic simulation apparatus is provided with a circuit dividing unit (6) that selects and defines logic cones each of which carries out a logic operation in synchronization with one clock domain as target portions to be speeded up from logic cones extracted by a logic cone extracting unit (5), and that defines logic cons each of which carries out a logic operation based on a plurality of clock domains as nontarget portions not to be speeded up, and a logic compressing unit (7) that compresses the logic of each of the target portions, and performs a logic simulation on each of the target portions whose logic is compressed and also on performs a logic simulation on each of the nontarget portions.