Abstract: A nondestructive inspection apparatus includes a pair of guided wave sensors disposed on an outer surface of a piping and a guided wave inspection device connected to the pair of guided wave sensors which, outputs a transmitting signal for propagating a guided wave to the guided wave sensors, and obtains a receiving signal by receiving a propagated signal by the guided wave sensors. An inspection-result storage device stores the guided wave as a digitized signal of the received wave and an inspection-result diagnostic device performs arithmetic processing of judging whether or not a signal associated with a defect exists.

Abstract: Disclosed herein are an apparatus and a technique for quickly detecting a defective portion including wastage, which has occurred in piping having a straight piping portion or a bending zone, in the nondestructive inspection using a guided wave. A guided wave sensor 3 included in a guided wave inspection device 4 is mounted to the outer surface of piping 1. A guided wave is propagated to an inspection area of the piping 1. If a defective portion exists, the guided wave sensor 3 receives the guided wave that has been reflected from the defective portion. As a result, the guided wave inspection device 4 can acquire receive information including receive information derived from the defect.

Abstract: A nondestructive inspection apparatus includes a pair of guided wave sensors disposed on an outer surface of a piping and a guided wave inspection device connected to the pair of guided wave sensors which, outputs a transmitting signal for propagating a guided wave to the guided wave sensors, and obtains a receiving signal by receiving a propagated signal by the guided wave sensors. An inspection-result storage device stores the guided wave as a digitized signal of the received wave and an inspection-result diagnostic device performs arithmetic processing of judging whether or not a signal associated with a defect exists.

Abstract: Disclosed herein are an apparatus and a technique for quickly detecting a defective portion including wastage, which has occurred in piping having a straight piping portion or a bending zone, in the nondestructive inspection using a guided wave. A guided wave sensor 3 included in a guided wave inspection device 4 is mounted to the outer surface of piping 1. A guided wave is propagated to an inspection area of the piping 1. If a defective portion exists, the guided wave sensor 3 receives the guided wave that has been reflected from the defective portion. As a result, the guided wave inspection device 4 can acquire receive information including receive information derived from the defect.

Abstract: Electric conductivities of an aqueous solution under measurement are measured at two or more different temperatures in a range To to Tn, and a relationship between the electrical conductivity and the temperatures is obtained. A solute substance in the aqueous solution is determined by applying this relationship against a known temperature and electrical conductivity relationship of an individual substance. A concentration of the determined substance is estimated by applying the electrical conductivity at the lowest temperature To to a known relationship between an electrical conductivity and a concentration at the same temperature To with respect to an individual substance.