Patents by Inventor Masao Takayanagi

Masao Takayanagi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ion attachment mass spectrometry apparatus, ionization apparatus, and ionization method
    Patent number: 6768108
    Abstract: An ion attachment mass spectrometry apparatus provided with a first chamber and a second chamber separated by a partition having an aperture (nozzle), an emitter, a mass spectrometer, a vacuum pump, and a sample gas introduction mechanism for introducing a sample gas and making metal ions attach to sample gas molecules to make the sample gas positive ions. Further, the Knudsen number of the aperture is made not more than 0.01, the pressure of the second chamber is not more than {fraction (1/10)}th of the first chamber, gas of the sample gas in the first chamber is blown out from the aperture to the second chamber, and a supersonic jet formed in the second chamber is provided. Sample gas and metal ions are injected into the supersonic jet region and metal ions are made to attach to the sample gas molecules.
    Type: Grant
    Filed: July 2, 2003
    Date of Patent: July 27, 2004
    Assignee: Anelva Corporation
    Inventors: Yoshiki Hirano, Yoshiro Shiokawa, Toshihiro Fujii, Munetaka Nakata, Masao Takayanagi
  • Ion attachment mass spectrometry apparatus, ionization apparatus, and ionization method
    Publication number: 20040011955
    Abstract: An ion attachment mass spectrometry apparatus provided with a first chamber and a second chamber separated by a partition having an aperture (nozzle), an emitter, a mass spectrometer, a vacuum pump, and a sample gas introduction mechanism for introducing a sample gas and making metal ions attach to sample gas molecules to make the sample gas positive ions. Further, the Knudsen number of the aperture is made not more than 0.01, the pressure of the second chamber is not more than {fraction (1/10)}th of the first chamber, gas of the sample gas in the first chamber is blown out from the aperture to the second chamber, and a supersonic jet formed in the second chamber is provided. Sample gas and metal ions are injected into the supersonic jet region and metal ions are made to attach to the sample gas molecules.
    Type: Application
    Filed: July 2, 2003
    Publication date: January 22, 2004
    Inventors: Yoshiki Hirano, Yoshiro Shiokawa, Toshihiro Fujii, Munetaka Nakata, Masao Takayanagi