Patents by Inventor Masaru Furukaya

Masaru Furukaya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ATM test equipment operable as source and responder for conducting multiple tests
    Patent number: 6925062
    Abstract: ATM test equipment are used as a source node and a responder node for conducting a test in a number of modes. At the source node, a test cell is formulated according to a selected test mode with a header identifying the source node and a responder node and a test mode value identifying the selected test mode, and transmits the test cell to an ATM network, and receives a response cell from the network to analyze data contained in the received response cell according to the test mode value of the response cell. The response cell is formulated at the responder node with a header identifying the responder node and the source node and the test mode value of the received test cell. At the responder node, data contained in the received test cell is also analyzed according to the test mode value of the test cell.
    Type: Grant
    Filed: December 18, 2000
    Date of Patent: August 2, 2005
    Assignees: NEC Corporation, NTT DoCoMo, Inc.
    Inventors: Hironao Tanaka, Hiroshi Kawakami, Shin Nakamura, Masaru Furukaya
  • ATM test equipment operable as source and responder for conducting multiple tests
    Publication number: 20010053130
    Abstract: ATM test equipment are used as a source node and a responder node for conducting a test in a number of modes. At the source node, a test cell is formulated according to a selected test mode with a header identifying the source node and a responder node and a test mode value identifying the selected test mode, and transmits the test cell to an ATM network, and receives a response cell from the network to analyze data contained in the received response cell according to the test mode value of the response cell. The response cell is formulated at the responder node with a header identifying the responder node and the source node and the test mode value of the received test cell. At the responder node, data contained in the received test cell is also analyzed according to the test mode value of the test cell.
    Type: Application
    Filed: December 18, 2000
    Publication date: December 20, 2001
    Inventors: Hironao Tanaka, Hiroshi Kawakami, Shin Nakamura, Masaru Furukaya