Patents by Inventor Masaru Otsuka

Masaru Otsuka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patch and process for producing the same
    Publication number: 20050214352
    Abstract: The present invention relates to a patch containing a substrate, a non-crosslinked adhesive layer (A) containing DMAE or a pharmacologically acceptable salt thereof laminated on one surface of the substrate and a crosslinked adhesive layer (B) laminated on the adhesive layer (A). According to the present invention, the percutaneous absorbability of DMAE or a pharmacologically acceptable salt thereof can be improved, and a patch free of problems such as adhesive residue and adhesive bleed can be provided.
    Type: Application
    Filed: April 11, 2003
    Publication date: September 29, 2005
    Inventors: Mitsuhiko Hori, Keiji Yamamoto, Kensuke Matsuoka, Yoshihisa Nakano, Kenjirou Mimomi, Masashi Yamada, Masaru Otsuka, Yasunori Suzuki, Akihiro Kawashima
  • Comparator and voltage controlled oscillator circuit
    Patent number: 6456170
    Abstract: The inverter functioning as a comparator, dummy inverter having the same electric characteristics as the inverter, and control circuit are provided. Vth detecting input voltage output from the control circuit is input into the dummy inverter, Vth detecting output voltage output from the dummy inverter is input into the control circuit, and the threshold voltage of the dummy inverter is detected. The threshold voltage of the inverter is controlled by controlling the back gate voltages of the MOS transistors of the dummy inverter and the inverter in such a manner that the threshold voltage of the dummy inverter coincide with an external reference voltage.
    Type: Grant
    Filed: March 30, 2000
    Date of Patent: September 24, 2002
    Assignee: Fujitsu Limited
    Inventors: Yuji Segawa, Masaru Otsuka, Osamu Kikuchi, Akira Haga, Yoshinori Yoshikawa
  • Wavelength variation measuring apparatus
    Patent number: 5493395
    Abstract: A wavelength variation measuring apparatus is disclosed. A light beam from a light source device capable of controlling an oscillation wavelength is divided into two light beams by a light divider. A predetermined optical path length difference is imparted to the divided light beams to synthesize the beams by a light synthesizer. A part of the synthesized light is used as detection light and the rest of the synthesized light is used as measuring light. A beat signal is detected from the detection light by a photodetector. A feedback control is effected to the light source device by use of the beat signal to thereby stabilize the oscillated wavelength of the light source device and to direct the measuring light to an object to be measured. The beat signal is rendered as a measurement data correction signal, and measurement data obtained by directing the measuring light to the object to be measured is corrected.
    Type: Grant
    Filed: May 8, 1995
    Date of Patent: February 20, 1996
    Assignee: Canon Kabushiki Kaisha
    Inventor: Masaru Otsuka