Patents by Inventor Masaru Takakura
Masaru Takakura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9874532Abstract: A scatter diagram display device includes a principal component analysis section that performs principal component analysis on intensity or concentration map data that represents each element, a priority level setting section that sets a priority level to each element based on the results of the principal component analysis performed by the principal component analysis section, and a display control section that performs a control process that arranges a plurality of scatter diagrams generated by combining each element based on the priority level that has been set to each element by the priority level setting section, and displays the plurality of scatter diagrams on a display section.Type: GrantFiled: October 19, 2015Date of Patent: January 23, 2018Assignee: JEOL Ltd.Inventors: Norihisa Mori, Masaru Takakura, Shinya Fujita, Shigeru Honda, Naoki Kato, Shuichi Sakamoto
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Patent number: 9518942Abstract: A phase analyzer includes a principal component analysis section that performs principal component analysis on elemental map data that represents an intensity or concentration distribution corresponding to each element to calculate a principal component score corresponding to each unit area of the elemental map data, a scatter diagram generation section that plots the calculated principal component score to generate a scatter diagram of the principal component score, a peak position detection section that detects a peak position from the scatter diagram, a clustering section that calculates a distance between each point and each peak position within the scatter diagram, and classifies each point within the scatter diagram into a plurality of groups based on the distance, and a phase map generation section that generates a phase map based on classification results of the clustering section.Type: GrantFiled: May 20, 2015Date of Patent: December 13, 2016Assignee: JEOL Ltd.Inventors: Naoki Kato, Masaru Takakura, Norihisa Mori, Shinya Fujita, Shigeru Honda
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Publication number: 20160110896Abstract: A scatter diagram display device includes a principal component analysis section that performs principal component analysis on intensity or concentration map data that represents each element, a priority level setting section that sets a priority level to each element based on the results of the principal component analysis performed by the principal component analysis section, and a display control section that performs a control process that arranges a plurality of scatter diagrams generated by combining each element based on the priority level that has been set to each element by the priority level setting section, and displays the plurality of scatter diagrams on a display section.Type: ApplicationFiled: October 19, 2015Publication date: April 21, 2016Inventors: Norihisa Mori, Masaru Takakura, Shinya Fujita, Shigeru Honda, Naoki Kato, Shuichi Sakamoto
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Patent number: 9234831Abstract: A particle analysis instrument is offered which can make a measurement in a shorter time than heretofore. The particle analysis instrument (100) is used to analyze a sample (S) containing plural particles by measuring the sample over plural fields of view. The instrument (100) includes a measuring section (10) for scanning primary rays (EB) over the sample (S) and detecting a signal emanating from the sample (S), a particle area totalizing portion (222) for finding the area of particles for each field of view from the results of the measurement made by the measuring section (10) and summing up such areas of particles for all of the fields of view to find a total area of particles, and a decision portion (226) for making a decision as to whether the measurement process should be ended, based on the ratio of the total area of particles to an area of the sample (S) measured to obtain the total area of particles.Type: GrantFiled: February 4, 2015Date of Patent: January 12, 2016Assignee: JEOL Ltd.Inventor: Masaru Takakura
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Publication number: 20150362446Abstract: A phase analyzer includes a principal component analysis section that performs principal component analysis on elemental map data that represents an intensity or concentration distribution corresponding to each element to calculate a principal component score corresponding to each unit area of the elemental map data, a scatter diagram generation section that plots the calculated principal component score to generate a scatter diagram of the principal component score, a peak position detection section that detects a peak position from the scatter diagram, a clustering section that calculates a distance between each point and each peak position within the scatter diagram, and classifies each point within the scatter diagram into a plurality of groups based on the distance, and a phase map generation section that generates a phase map based on classification results of the clustering section.Type: ApplicationFiled: May 20, 2015Publication date: December 17, 2015Inventors: Naoki Kato, Masaru Takakura, Norihisa Mori, Shinya Fujita, Shigeru Honda
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Publication number: 20150219547Abstract: A particle analysis instrument is offered which can make a measurement in a shorter time than heretofore. The particle analysis instrument (100) is used to analyze a sample (S) containing plural particles by measuring the sample over plural fields of view. The instrument (100) includes a measuring section (10) for scanning primary rays (EB) over the sample (S) and detecting a signal emanating from the sample (S), a particle area totalizing portion (222) for finding the area of particles for each field of view from the results of the measurement made by the measuring section (10) and summing up such areas of particles for all of the fields of view to find a total area of particles, and a decision portion (226) for making a decision as to whether the measurement process should be ended, based on the ratio of the total area of particles to an area of the sample (S) measured to obtain the total area of particles.Type: ApplicationFiled: February 4, 2015Publication date: August 6, 2015Inventor: Masaru Takakura
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Patent number: 7579591Abstract: Method and apparatus for performing sample analysis using both the WDS and an energy-dispersive X-ray spectrometer (EDS). The analysis starts with irradiating the sample with an electron beam. Characteristic X-rays emanating from the sample are spectrally dispersed and detected by the WDS. The intensities of the characteristic X-rays at positions where the characteristic X-ray peaks are detected are measured. At this time, the background intensities of the characteristic X-rays at the positions where the characteristic X-ray peaks are detected are found based on a mean atomic number calculated using values which are derived by quantitative analysis based on the characteristic X-ray intensities measured by the EDS at the corresponding analysis positions on the sample. The background intensities are subtracted from the peak intensities at the positions where the characteristic X-ray peaks are detected by the WDS. Thus, the net characteristic X-ray intensities are found.Type: GrantFiled: November 13, 2007Date of Patent: August 25, 2009Assignee: Jeol Ltd.Inventor: Masaru Takakura
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Publication number: 20090052620Abstract: A state analysis using characteristic X-rays of higher-order diffractions. The name of an element undergoing a state analysis, a species of characteristic X-rays, and a diffraction order are entered from an input device. A measurement control unit reads data about the wavelengths of first-order lines from a storage device in accordance with the specified species of the characteristic X-rays, and finds the actual spectral wavelength position and range of measured wavelengths based on the diffraction order.Type: ApplicationFiled: August 20, 2008Publication date: February 26, 2009Applicant: JEOL LTD.Inventor: Masaru TAKAKURA
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Publication number: 20080111072Abstract: Method and apparatus for performing sample analysis using both the WDS and an energy-dispersive X-ray spectrometer (EDS). The analysis starts with irradiating the sample with an electron beam. Characteristic X-rays emanating from the sample are spectrally dispersed and detected by the WDS. The intensities of the characteristic X-rays at positions where the characteristic X-ray peaks are detected are measured. At this time, the background intensities of the characteristic X-rays at the positions where the characteristic X-ray peaks are detected are found based on a mean atomic number calculated using values which are derived by quantitative analysis based on the characteristic X-ray intensities measured by the EDS at the corresponding analysis positions on the sample. The background intensities are subtracted from the peak intensities at the positions where the characteristic X-ray peaks are detected by the WDS. Thus, the net characteristic X-ray intensities are found.Type: ApplicationFiled: November 13, 2007Publication date: May 15, 2008Applicant: JEOL LTD.Inventor: Masaru Takakura