Patents by Inventor Masaru Tomioka

Masaru Tomioka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240126190
    Abstract: A powder replenisher includes a powder replenishment container to be replenished with powder. A pressure adjuster increases and decreases operating pressure applied to a variable capacity portion. A powder measuring instrument measures an amount of the powder that replenishes the powder replenishment container. A controller performs a precise replenishing mode in which, after the controller determines that the powder replenishment container is replenished with the powder in a predetermined amount, while the controller controls the powder measuring instrument to measure the amount of the powder inside the powder replenishment container, the controller controls the pressure adjuster to replenish the powder replenishment container with the powder in a target amount.
    Type: Application
    Filed: October 12, 2023
    Publication date: April 18, 2024
    Inventors: Yuki TAKANO, Masaru NARUSHIMA, Yasuaki TOMIOKA, Chika HIRABAYASHI
  • Patent number: 7186973
    Abstract: An “ion trap-TOF/MS” capable of calibrating the observed mass for each of an ion trap and a TOF. In the ion trap-TOF/MS, sample ions having known mass numbers and ionized by an ion source are trapped within an ion trap. Auxiliary AC voltages having a frequency component ? are applied to the end cap electrodes of the ion trap to expel unwanted ions out of the ion trap. A measurement process is carried out by applying DC voltages to the ring electrode and the end cap electrodes to expel an ion remaining within the ion trap, and measuring the mass number of the expelled ion by the time-of-flight mass spectrometer. The measurement process is repeated while changing the frequency component ?, and the ion signal intensity measured by the time-of-flight mass spectrometer is compared with a previously stored threshold, thereby making calibration of the frequency component ? for the ion having the known mass number. Thus, the calibrating of the observed mass can be realized for each of the ion trap and the TOF.
    Type: Grant
    Filed: June 10, 2005
    Date of Patent: March 6, 2007
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yasushi Terui, Toyoharu Okumoto, Tsukasa Shishika, Shinji Nagai, Masaru Tomioka
  • Patent number: 7053367
    Abstract: In a mass spectrometer utilizing an atmospheric pressure ion source, the amount of un-vaporized droplets that reach a mass spectrometric section is reduced. A mass spectrometer comprises: an ionization section for ionizing a sample at substantially atmospheric pressure; a first and a second intermediate pressure section in which the pressure is maintained lower than the pressure in said ionization section; a high vacuum section in which the pressure is maintained lower than the pressure in said intermediate pressure section and in which a mass spectrometric means for subjecting ions to mass spectrometry is disposed; a first pore electrode disposed between said ionization section and said first intermediate pressure section; an intermediate pore electrode disposed between said first intermediate pressure section and said second intermediate pressure section; and a second pore electrode disposed between said second intermediate pressure section and said high vacuum section.
    Type: Grant
    Filed: November 7, 2001
    Date of Patent: May 30, 2006
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tomoyuki Tobita, Toshihiro Ishizuka, Masaru Tomioka, Kiyomi Yoshinari, Masami Sakamoto
  • Publication number: 20050279926
    Abstract: An “ion trap-TOF/MS” capable of calibrating the observed mass for each of an ion trap and a TOF. In the ion trap-TOF/MS, sample ions having known mass numbers and ionized by an ion source are trapped within an ion trap. Auxiliary AC voltages having a frequency component ? are applied to the end cap electrodes of the ion trap to expel unwanted ions out of the ion trap. A measurement process is carried out by applying DC voltages to the ring electrode and the end cap electrodes to expel an ion remaining within the ion trap, and measuring the mass number of the expelled ion by the time-of-flight mass spectrometer. The measurement process is repeated while changing the frequency component ?, and the ion signal intensity measured by the time-of-flight mass spectrometer is compared with a previously stored threshold, thereby making calibration of the frequency component ? for the ion having the known mass number. Thus, the calibrating of the observed mass can be realized for each of the ion trap and the TOF.
    Type: Application
    Filed: June 10, 2005
    Publication date: December 22, 2005
    Inventors: Yasushi Terui, Toyoharu Okumoto, Tsukasa Shishika, Shinji Nagai, Masaru Tomioka
  • Patent number: 6977373
    Abstract: An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.
    Type: Grant
    Filed: May 17, 2004
    Date of Patent: December 20, 2005
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Tadao Mimura, Masaru Tomioka
  • Publication number: 20040262512
    Abstract: In a mass spectrometer utilizing an atmospheric pressure ion source, the amount of un-vaporized droplets that reach a mass spectrometric section is reduced. A mass spectrometer comprises: an ionization section for ionizing a sample at substantially atmospheric pressure; a first and a second intermediate pressure section in which the pressure is maintained lower than the pressure in said ionization section; a high vacuum section in which the pressure is maintained lower than the pressure in said intermediate pressure section and in which a mass spectrometric means for subjecting ions to mass spectrometry is disposed; a first pore electrode disposed between said ionization section and said first intermediate pressure section; an intermediate pore electrode disposed between said first intermediate pressure section and said second intermediate pressure section; and a second pore electrode disposed between said second intermediate pressure section and said high vacuum section.
    Type: Application
    Filed: April 30, 2004
    Publication date: December 30, 2004
    Inventors: Tomoyuki Tobita, Toshihiro Ishizuka, Masaru Tomioka, Kiyomi Yoshinari, Masami Sakamoto
  • Publication number: 20040211898
    Abstract: An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.
    Type: Application
    Filed: May 17, 2004
    Publication date: October 28, 2004
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Tadao Mimura, Masaru Tomioka
  • Patent number: 6759652
    Abstract: An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: July 6, 2004
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Tadao Mimura, Masaru Tomioka
  • Publication number: 20030150989
    Abstract: An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.
    Type: Application
    Filed: September 24, 2002
    Publication date: August 14, 2003
    Inventors: Kiyomi Yoshinari, Yoshiaki Kato, Tadao Mimura, Masaru Tomioka
  • Patent number: 6157030
    Abstract: Disclosed is an ion trap mass spectrometer improved to obtain a high sensitivity without the lowering of resolution. By fitting a mesh electrode to an aperture (an ion sampling aperture or an ion extracting aperture) made in endcap electrodes constituting an ion trap mass analysis region, a radio frequency electric field in the mass analysis region is not disturbed even if the diameter of the aperture is set to a large value to heighten ion transmission efficiency. By fitting a shield electrode for preventing collision of ions with an insulated ring constituting an outer wall of the mass analysis region, charging up of the insulated ring is prevented to improve stability of detection signals. Furthermore, by arranging a shield member for shielding stray charged particles detouring through the circumference of the mass analysis region to approach an ion detector, generation of noises based on these stray charged particles is prevented.
    Type: Grant
    Filed: August 28, 1998
    Date of Patent: December 5, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Minoru Sakairi, Tadao Mimura, Toshihiro Ishizuka, Masaru Tomioka, Yasuaki Takada, Takayuki Nabeshima
  • Patent number: 5081307
    Abstract: 2,2-Dimethoxy-2-phenylacetophenone is prepared by reacting benzil with dimethyl sulfate and alkali metal methylate in a nonpolar organic solvent (e.g. xylene, cyclohexane) in the presence of one or more of catalysts selected from the group consisting of polyethylene glycol, a polyethylene glycol dialkyl ether and a crown ether. The reaction can be carried out more preferably in the presence of diglyme or triglyme or a mixture of diglyme or triglyme and polyethylene glycol.
    Type: Grant
    Filed: July 5, 1990
    Date of Patent: January 14, 1992
    Assignee: Kawaguchi Chemical Co., Ltd.
    Inventors: Soichi Kitamura, Masaru Tomioka, Hidekuni Gotoh
  • Patent number: D522391
    Type: Grant
    Filed: September 28, 2004
    Date of Patent: June 6, 2006
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Onuma, Takuya Akashi, Masaru Tomioka, Yasushi Terui, Fumio Toyoda
  • Patent number: D356967
    Type: Grant
    Filed: February 4, 1994
    Date of Patent: April 4, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Isamu Takekoshi, Atsushi Ninomiya, Seiji Kamimura, Masaru Tomioka
  • Patent number: D691280
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: October 8, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kosuke Matoba, Mitsuru Oonuma, Masaru Tomioka, Kiyotoshi Mori, Akira Owada, Yoko Sato, Hiroyuki Noda
  • Patent number: D692155
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: October 22, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kosuke Matoba, Mitsuru Oonuma, Masaru Tomioka, Kiyotoshi Mori, Akira Owada, Yoko Sato, Hiroyuki Noda
  • Patent number: D692156
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: October 22, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kosuke Matoba, Mitsuru Oonuma, Masaru Tomioka, Kiyotoshi Mori, Akira Owada
  • Patent number: D692157
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: October 22, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kosuke Matoba, Mitsuru Oonuma, Masaru Tomioka, Kiyotoshi Mori, Akira Owada
  • Patent number: D692158
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: October 22, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kosuke Matoba, Mitsuru Oonuma, Masaru Tomioka, Kiyotoshi Mori, Akira Owada
  • Patent number: D693938
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: November 19, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kosuke Matoba, Mitsuru Oonuma, Masaru Tomioka, Kiyotoshi Mori, Akira Owada, Yoko Sato, Yoshimasa Yokoyama