Patents by Inventor Masaru Watahiki

Masaru Watahiki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Charged-particle microscope and method for controlling same
    Patent number: 8934006
    Abstract: The present invention provides an intuitive and easy-to-operate graphical user interface environment for charged-particle microscopes. By restricting the operation items of charged-particle microscopes to the control button operations on GUI screen, excluding the charged-particle microscope specific technical terms, and unifying the observation conditions in the simple terminology with which the observation object can be intuitively understood, the operation environment which is intuitive and easy to understand for users not caring charged-particle microscopes is realized, and by restricting each of electron optical conditions in conjunction with the change of the observation condition to the fixed values and tabling them, it is possible to omit the operation workload of the user.
    Type: Grant
    Filed: November 15, 2010
    Date of Patent: January 13, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hajime Chino, Masaru Watahiki, Toru Iwaya
  • CHARGED-PARTICLE MICROSCOPE AND METHOD FOR CONTROLLING SAME
    Publication number: 20120287257
    Abstract: The present invention provides an intuitive and easy-to-operate graphical user interface environment for charged-particle microscopes. By restricting the operation items of charged-particle microscopes to the control button operations on GUI screen, excluding the charged-particle microscope specific technical terms, and unifying the observation conditions in the simple terminology with which the observation object can be intuitively understood, the operation environment which is intuitive and easy to understand for users not caring charged-particle microscopes is realized, and by restricting each of electron optical conditions in conjunction with the change of the observation condition to the fixed values and tabling them, it is possible to omit the operation workload of the user.
    Type: Application
    Filed: November 15, 2010
    Publication date: November 15, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Hajime Chino, Masaru Watahiki, Toru Iwaya