Patents by Inventor Masashi Akutsu
Masashi Akutsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250083428Abstract: A decorative sheet includes a primary film layer and a surface protective layer, in which the surface protective layer has a gloss level of 15 or less; the surface protective layer has on its surface a ridged portion to form an uneven shape; the surface protective layer contains as a main material an ionizing radiation-curable resin; the ionizing radiation-curable resin contains as a main component an acrylic resin containing a repeating structure; the repeating structure is one of an alkylene structure, an ethylene oxide structure, a propylene oxide structure, and an ?-caprolactone structure; and an acrylic monomer forming the acrylic resin has two or more and four or less acryloyl groups, and a shaping parameter expressed by Formula 1 is in a range of 0.8 or more and 3.4 or less.Type: ApplicationFiled: November 19, 2024Publication date: March 13, 2025Applicant: TOPPAN HOLDINGS INC .Inventors: Masashi HATTORI, Erika AKUTSU
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Patent number: 12186758Abstract: Provided is an automated analysis device with which sufficient reaction process data can be acquired irrespective of the scale of the device, and with which it is possible to ensure freedom of the device configuration. An automated analysis device 100 is provided with: a reaction disk 1 which circumferentially accommodates a plurality of reaction vessels 2; a specimen dispensing mechanism 11 which dispenses a specimen into the reaction vessels 2; a reagent dispensing mechanism 7 which dispenses a reagent into the reaction vessels 2; a measuring unit 4 which measures a reaction process of a mixture of the specimen and the reagent in the reaction vessels 2; and a cleaning mechanism 3 which cleans the reaction vessels 2 after measurement.Type: GrantFiled: September 29, 2023Date of Patent: January 7, 2025Assignee: Hitachi High-Tech CorporationInventors: Akihiro Yasui, Akihisa Makino, Masashi Akutsu, Hiroyuki Mishima, Yoshihiro Suzuki
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Publication number: 20240377421Abstract: Provided is an automatic analyzer including: an operation terminal; an analyzer having an active examination function of executing, in parallel with an initial examination, a re-examination possibly required after the initial examination on the same specimen; and a computer configured to communicate with the analyzer, in which the computer executes determination processing as to whether an analysis time is shorter when the active examination function is enabled than when the active examination function is disabled based on performance data of an examination executed in the past, and outputs determination data of the determination processing to the operation terminal or the analyzer.Type: ApplicationFiled: September 13, 2022Publication date: November 14, 2024Applicant: HITACHI HIGH-TECH CORPORATIONInventors: Naohiko Fukaya, Masayuki Ito, Masashi Akutsu
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Publication number: 20240353435Abstract: The objective of the present invention is to provide an automated analyzing device which enables an improvement in analysis processing speed. This automated analyzing device is provided with an analysis module for analyzing a sample, and a control unit for controlling the analysis module, characterized in that the control unit controls the analysis module such that, among a plurality of measurement items registered in the analysis module, analysis of a biological sample supplied from a subject is prohibited with respect to measurement items for which calibration or accuracy control measurement is indicated, and analysis of the biological sample is permitted with respect to measurement items for which calibration and accuracy control measurement are not indicated.Type: ApplicationFiled: June 30, 2022Publication date: October 24, 2024Inventors: Hirobumi SHIOHATA, Masashi AKUTSU, Masaki CHIKAHISA
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Automatic analyzer with a control unit for displaying background maintenance operation notifications
Patent number: 12111327Abstract: The automatic analyzer is capable of performing other operations concurrently with a maintenance operation and notifying a user when a user action is required in executing maintenance and displaying guidance. Automatic analyzer includes analysis modules and that analyze a sample, a display device that displays information related to maintenance in the analyzer including the analysis modules and, and an overall management computer that controls a constant display area to be displayed on a display screen of the display device, in which when there is a need to notify a user of a maintenance status at a timing when the maintenance in the analyzer is executed in a background and a screen other than a maintenance screen is displayed on the display device, the overall management computer displays notification information on the screen including global areas and of the display device.Type: GrantFiled: November 13, 2019Date of Patent: October 8, 2024Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Satoru Chida, Masashi Akutsu, Chikook Ha, Satoshi Yokotsuka -
Patent number: 12085582Abstract: The present invention comprises: an incubator disk 22 upon which a plurality of reaction containers holding a reaction solution being an analyte and a reagent that have been mixed and reacted are mounted; a immunoassay unit 23 that measures the physical properties of the reaction solution; and a planning unit 103 that determines the order for measurement of analyte requested to be executed by the immunoassay unit 23. Measurement by the immunoassay unit 23 includes items having different measurement times. When measurement of sequence items having the longest measurement time will occur at least a prescribed number of times in a row, said prescribed number being at least two, the planning unit 103 provides at least one empty cycle after measurement has occurred at least the prescribed number of times.Type: GrantFiled: December 2, 2019Date of Patent: September 10, 2024Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Tsukasa Suenari, Masashi Akutsu, Hiroyuki Mishima, Takeshi Setomaru, Akihiro Yasui
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Patent number: 12019085Abstract: An automatic analysis device and an automatic analysis system capable of executing separate operations by respective analysis units even in a device configuration where a same control part controls two or more analysis units, the automatic analysis device including a biochemistry analysis unit; an electrolyte analysis unit; one analysis unit control CPU for controlling operations of the biochemistry analysis unit and the electrolyte analysis unit; and a storage part for storing time charts of operations having different purposes for the biochemistry analysis unit and the electrolyte analysis units. Two or more of the biochemistry analysis units and the electrolyte analysis units operate independently to each other based on the time charts stored in the storage part.Type: GrantFiled: May 28, 2019Date of Patent: June 25, 2024Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Kunio Enta, Masashi Akutsu
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Publication number: 20240201215Abstract: [Problem] To provide an automatic analyzer capable of reducing dispensing accuracy defect caused by reagent adhered or concentrated in measuring a sample as compared with a prior art. [Solution] A control computer 24 of an automatic analyzer 100 executes analysis while switching a reagent used according to an analysis item, and, when a predetermined condition is fulfilled during an analysis operation, controls reagent dispensing mechanisms 11, 13 to execute a conditioning operation of lowering reagent nozzles 12, 14 to pass through an aspiration port of a reagent container 4 of a target and lifting the reagent nozzles 12, 14.Type: ApplicationFiled: April 22, 2022Publication date: June 20, 2024Inventors: Masashi FUKAYA, Masashi AKUTSU, Naoto SUZUKI, Maki FURUKAWA
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Patent number: 11971423Abstract: An automatic analyzer is capable of transporting a sample at an optimum timing and a method of transporting the sample. An automatic analyzer includes an analysis unit which measures a sample, a transport unit which transports the sample to the analysis unit, and a control unit which controls the analysis unit and the transport unit. A sample is transported to the analysis unit by a time of starting an aspirating operation on the sample by allowing the analysis unit to perform a pre-measurement operation for each measuring method which needs to be performed before aspirating the sample even when the sample is still in the transport unit.Type: GrantFiled: May 16, 2019Date of Patent: April 30, 2024Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Naoto Suzuki, Masashi Akutsu, Akihiro Yasui
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Publication number: 20240017263Abstract: Provided is an automated analysis device with which sufficient reaction process data can be acquired irrespective of the scale of the device, and with which it is possible to ensure freedom of the device configuration. An automated analysis device 100 is provided with: a reaction disk 1 which circumferentially accommodates a plurality of reaction vessels 2; a specimen dispensing mechanism 11 which dispenses a specimen into the reaction vessels 2; a reagent dispensing mechanism 7 which dispenses a reagent into the reaction vessels 2; a measuring unit 4 which measures a reaction process of a mixture of the specimen and the reagent in the reaction vessels 2; and a cleaning mechanism 3 which cleans the reaction vessels 2 after measurement.Type: ApplicationFiled: September 29, 2023Publication date: January 18, 2024Applicant: Hitachi High-Tech CorporationInventors: Akihiro YASUI, Akihisa MAKINO, Masashi AKUTSU, Hiroyuki MISHIMA, Yoshihiro SUZUKI
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Publication number: 20240003924Abstract: There is provided an automatic analysis system and an information takeover method in the automatic analysis system, in which repair and maintenance can be accurately executed at an appropriate timing even when a change occurs in a system configuration.Type: ApplicationFiled: November 22, 2021Publication date: January 4, 2024Inventors: Satoshi YOKOTSUKA, Masashi AKUTSU, Hiroyuki MISHIMA
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Patent number: 11826759Abstract: Provided is an automated analysis device with which sufficient reaction process data can be acquired irrespective of the scale of the device, and with which it is possible to ensure freedom of the device configuration. An automated analysis device 100 is provided with: a reaction disk 1 which circumferentially accommodates a plurality of reaction vessels 2; a specimen dispensing mechanism 11 which dispenses a specimen into the reaction vessels 2; a reagent dispensing mechanism 7 which dispenses a reagent into the reaction vessels 2; a measuring unit 4 which measures a reaction process of a mixture of the specimen and the reagent in the reaction vessels 2; and a cleaning mechanism 3 which cleans the reaction vessels 2 after measurement.Type: GrantFiled: December 20, 2021Date of Patent: November 28, 2023Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Akihiro Yasui, Akihisa Makino, Masashi Akutsu, Hiroyuki Mishima, Yoshihiro Suzuki
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Publication number: 20230258672Abstract: This automated analysis device is provided with a plurality of analysis units for analyzing a specimen, a buffer portion which holds a plurality of specimen racks on which are placed specimen containers holding the specimen, a sampler portion which conveys the specimen racks held in the buffer portion to the analysis units, and a control portion which, when performing a process to deliver the specimen racks to the plurality of analysis units, outputs synchronization signals to all the plurality of analysis units, wherein the analysis unit performs a delivery process starting from the synchronization signal, and the analysis unit performs a delivery process starting from the synchronization signal.Type: ApplicationFiled: April 19, 2023Publication date: August 17, 2023Inventors: Masashi AKUTSU, Naoto SUZUKI, Hiroki FUJITA, Akihiro YASUI
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Publication number: 20230228777Abstract: An operator can perform exchange work of a reagent container without including a mechanism for reagent exchange and interrupting an analysis operation. An automatic analyzer includes: an analysis unit including a plurality of operation units for performing analysis of a specimen; and a control unit for controlling the analysis unit. The control unit allows the analysis unit to set to at least (a) an analysis operation mode in which a first and a second operation unit are operated for the analysis of the specimen, (b) a partial operation mode in which only the first operation unit is continuously operated after the analysis of the specimen is completed in the analysis operation mode, and (c) a reagent exchange mode in which consumables containing a reagent are exchangeable in the analysis unit. The control unit allows the analysis unit to shift from the partial operation mode to the reagent exchange mode.Type: ApplicationFiled: February 16, 2021Publication date: July 20, 2023Applicant: HITACH HIGH-TECH CORPORATIONInventors: Shunsuke Sasaki, Kenta Imai, Masashi Akutsu, Osamu Watabe, Satoshi Shibuya
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Patent number: 11662357Abstract: This automated analysis device is provided with a plurality of analysis units for analyzing a specimen, a buffer portion which holds a plurality of specimen racks on which are placed specimen containers holding the specimen, a sampler portion which conveys the specimen racks held in the buffer portion to the analysis units, and a control portion which, when performing a process to deliver the specimen racks to the plurality of analysis units, outputs synchronization signals to all the plurality of analysis units, wherein the analysis unit performs a delivery process starting from the synchronization signal, and the analysis unit performs a delivery process starting from the synchronization signal.Type: GrantFiled: October 29, 2018Date of Patent: May 30, 2023Assignee: Hitachi High-Technologies CorporationInventors: Masashi Akutsu, Naoto Suzuki, Hiroki Fujita, Akihiro Yasui
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Patent number: 11619639Abstract: The present invention reduces the turnaround time of an automated analyzer. During a period when cyclic measurement by a measurement unit is unnecessary, a controller washes a reaction vessel using a washing cycle having a cycle time shorter than that of an analysis cycle. A single analysis cycle and a single washing cycle both include a reaction disc stopping period and rotation period. In the washing cycle, there is no time during the stopping period when a sample dispensing mechanism, reagent dispensing mechanism, or stirring mechanism operates but there is a time when a washing mechanism operates. The washing cycle stopping period is shorter than the analysis cycle stopping period. The amount of rotation of the reaction disk in the analysis cycle rotation period is the same as the amount of rotation of the reaction disk in the washing cycle rotation period.Type: GrantFiled: August 23, 2018Date of Patent: April 4, 2023Assignee: Hitachi High-Technologies CorporationInventors: Akihiro Yasui, Tatsuya Fukugaki, Masashi Akutsu, Naoto Suzuki
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Publication number: 20230056397Abstract: A first screen for displaying information of at least two analysis modules and a second screen for displaying information of only the specific analysis module among the analysis modules are separately displayed based on at least one piece of information among angle information of a display section, position information of the display section, and information of an operation performed on the analysis modules. Thus, the screen corresponding to a situation of an automatic analysis device can be accurately and reliably provided by a user as compared with the conventional one.Type: ApplicationFiled: November 11, 2020Publication date: February 23, 2023Inventors: Kazuaki SHIBA, Satoshi YOKOTSUKA, Masashi AKUTSU, Masaki CHIKAHISA
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Patent number: 11486887Abstract: The present invention is provided with a sample rack insertion unit 12 that is capable of holding one or more sample racks 5 having mounted therein one or more sample containers 6 accommodating a sample to be analyzed, one or more analysis devices 2, 3 for analyzing the sample accommodated in the sample containers 6, a sample rack conveyance unit 14 for conveying the sample racks 5 from the sample rack insertion unit 12 to the analysis devices 2, 3, and a control device 4 for acquiring, for each analysis device 2, 3, load information that is information expressing an operating condition of the analysis device 2, 3, and, if there is an analysis device 2, 3 for which the load information is larger than a predetermined conveyance permission value, carrying out control so as to stop the conveyance of the sample racks 5 from the sample rack insertion unit 12 to the analysis device(s) 2, 3.Type: GrantFiled: November 13, 2017Date of Patent: November 1, 2022Assignee: Hitachi High-Tech CorporationInventors: Masashi Akutsu, Akihisa Makino, Hiroyuki Mishima, Akihiro Yasui
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Publication number: 20220260601Abstract: Provided are an automatic analyzer that satisfies both rapid measurement start and water consumption reduction, and a method of operating the automatic analyzer. When the automatic analyzer (100) is in a standby state where measurement of a sample is acceptable, a supply amount of cleaning water supplied to a sample dispensing probe (113) that dispenses the sample to a reaction vessel for reaction of the sample and a reagent, a sample dispensing probe cleaning tank (113A) that cleans an outer periphery of the sample dispensing probe (113) after the sample is dispensed, a reagent dispensing probe (116) that dispenses the reagent to the reaction vessel, a reagent dispensing probe cleaning tank (116A) that cleans an outer periphery of the reagent dispensing probe (116) after the reagent is dispensed, and a cleaning mechanism (115A) that cleans the reaction vessel after the measurement is completed, is reduced to be smaller than a supply amount during the measurement of the sample.Type: ApplicationFiled: March 13, 2020Publication date: August 18, 2022Inventors: Maki FURUKAWA, Masashi AKUTSU, Naoto SUZUKI
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Patent number: 11391750Abstract: A sample-processing system that improves total system processing efficiency, and reduces a sample-processing time, by establishing a functionally independent relationship between a rack conveyance block with rack supply, conveyance, and recovery functions, and a processing block with sample preprocessing, analysis, and other functions. A buffer unit with random accessibility to multiple racks standing by for processing is combined with each of multiple processing units to form a pair, and the system is constructed to load and unload racks into and from the buffer unit through the rack conveyance block so that one unprocessed rack is loaded into the buffer unit and then upon completion of process steps up to automatic retesting, unloaded from the buffer unit. Functional dependence between any processing unit and a conveyance unit is thus eliminated.Type: GrantFiled: July 6, 2018Date of Patent: July 19, 2022Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Hitoshi Tokieda, Yoshimitsu Takagi, Takeshi Shibuya, Masashi Akutsu