Abstract: A sheet feeding apparatus includes first and second transport devices disposed at a transport guide with a distance in between for nipping and transporting a sheet, and a double feed detection device disposed between the first transport device and the second transport device for detecting a double feed of the sheet. A sheet end detection device is disposed at a downstream side of the first transport device for detecting a trailing end of the sheet, and a determination device is provided for determining the double feed based on a detection signal from the double feed detection device and a detection signal from the sheet end detection device.

Abstract: Time required for location registration is reduced and concentration of location update signals caused when a group moves is prevented. Each mobile node and a mobile router sends a location update request to a local location manager near to the area in which it exists, so that time required for location registration can be reduced, and it is possible to prevent pressure on wireless resources and temporary increase in communication traffic within a mobile network, which may be caused by concentration of location update signals when a group moves as in the case of a train with a lot of passengers having mobile nodes. Thereby, even if location registration is not correctly performed by a mobile router, which sends a location update request on behalf of mobile nodes existing in the space of a moving body, due to the communication condition or a failure, it can be dealt with.

Abstract: A measurement-facilitating method of measuring the breakdown voltage of a semiconductor epitaxial wafer, and a semiconductor epitaxial wafer whose breakdown voltage is superior are realized. In a method of measuring the breakdown voltage of a semiconductor epitaxial wafer having to do with the present invention, the breakdown voltage between contacts 14 and 18 is measured only through the Schottky contacts, without need for ohmic contacts. Inasmuch as the manufacturing process of forming ohmic contacts is accordingly omitted, the semiconductor epitaxial wafer 10 may be readily used in a breakdown-voltage measurement test. The measurement of the wafer-10 breakdown voltage thus may be readily carried out. Likewise, because the inter-contact breakdown voltage V2 of a wafer 10 can be measured prior to manufacturing a working device from it, unsuitable wafers 10 can be excluded before they are cycled through the working-device fabrication process.

Abstract: A data communications system which communicates data via a data communications network, includes: an information extraction unit configured to extract an extraction target from received data; an comparison information generator/transmitter unit configured to generate and transmit comparison information including the extraction target extracted by the information extraction unit; a comparison unit configured to compare the received comparison information with the received data; and a cancellation processor unit configured to delete the received data, when the received comparison information agrees with the received data.

Abstract: A method of expanding a mid-rise building to a high-rise building, where a quake-absorbing foundation (5) for a high-rise building is newly provided outside the foundation of an existing mid-rise building (19) support members (6) are stood on the newly provided quake-absorbing foundation, and new dwelling floors (10) are fabricated above the existing building using the support members. After the completion of the new dwelling floors, upper floors of the existing mid-rise building are dismantled and removed and remaining individual floors of the building are remodeled sequentially Thus, with the dwellers living in the building, a mid-rise building can be expanded to a high-rise building having excellent quake-resistance.

Abstract: A sheet conveying apparatus includes a sheet feed tray on which sheets of a plurality of sizes which differ in length in a sheet widthwise direction perpendicular to a sheet conveying direction, a conveying unit which conveys a sheet on the sheet feed tray to a predetermined processing position, a sheet position detector which has a plurality of light-emitting units respectively arranged at positions corresponding to different sheet widths and one light-receiving unit capable of moving to positions corresponding to the plurality of light-emitting units, a light reception position detector which detects the position of the light-receiving unit, and a control unit which selects one of the plurality of light-emitting units on the basis of a detection result from the light reception position detector.

Abstract: A sheet feeding device includes a stacker on which sheets are placed, a sheet feeding device for separating and feeding a sheet from other sheets on the stacker, a sheet overlap sensing device placed in a sheet conveying path at a downstream side of the sheet feeding device, and a sheet sensing device for detecting whether the sheet is located in the sheet overlap sensing device. An error determining device determines whether the sheet overlap sensing device is operating normally.

Abstract: A sheet feeding apparatus includes a stacker for stacking a sheet; a feeding device for feeding the sheet on the stacker to a predetermined processing position; a drive device for driving the feeding device; a double feed detection device having a sending element and a receiving element arranged at a downstream side of the feeding device for detecting a double feed of the sheet; a sensitivity adjustment device for comparing a detected value of the receiving element with a predetermined reference value for adjusting an output of the sending element; and a control device for controlling a transport speed of the feeding device. The sensitivity adjustment device adjusts the output of the sending element when the control device controls the drive device to stop the sheet or to decelerate the sheet at a predetermined speed.

Abstract: A sheet feeding apparatus includes first and second transport devices disposed at a transport guide with a distance in between for nipping and transporting a sheet, and a double feed detection device disposed between the first transport device and the second transport device for detecting a double feed of the sheet. A sheet end detection device is disposed at a downstream side of the first transport device for detecting a trailing end of the sheet, and a determination device is provided for determining the double feed based on a detection signal from the double feed detection device and a detection signal from the sheet end detection device.

Abstract: A sheet supplying device includes a stacker for placing sheets; a delivery device for separating and feeding the sheets on the stacker; a register device for temporarily holding a sheet; a sheet conveying guide for guiding the sheet from the register device to a processing position; a sheet sensor disposed between the delivery device and the register device for detecting the sheet; at least one driving device for driving the delivery device and the register device; a conveyance control device for controlling the driving device so that the delivery device and the register device form a loop of the sheet according to a signal from the sheet sensor and an overlap sensor disposed between the register device and the processing position for detecting overlapping of the sheet. An overlap determining device determines overlapping of the sheet according to signals from the sheet sensor and the overlap sensor.

Abstract: A measurement-facilitating method of measuring the breakdown voltage of a semiconductor epitaxial wafer, and a semiconductor epitaxial wafer whose breakdown voltage is superior are realized. In a method of measuring the breakdown voltage of a semiconductor epitaxial wafer having to do with the present invention, the breakdown voltage between contacts 12, 12 is measured only through the Schottky contacts, without need for ohmic contacts. Inasmuch as the manufacturing process of forming ohmic contacts is accordingly omitted, the semiconductor epitaxial wafer 10 may be readily used in a breakdown-voltage measurement test. The measurement of the wafer 10 breakdown voltage thus may be readily carried out. Likewise, because the inter-contact breakdown voltage V2 of a wafer 10 can be measured prior to manufacturing a working device from it, unsuitable wafers 10 can be excluded before they are cycled through the working-device fabrication process.

Abstract: A sheet feeding apparatus includes a stacking tray for stacking a sheet, a sheet feeding device for feeding the sheet, a register device for aligning a leading edge of the sheet fed by the sheet feeding device, a recognition device for recognizing a state that the sheets stacked on the stacking tray have different widths, and a setting device for setting a feeding distance according to a result of the recognition device. A control device controls the sheet feeding device to feed the sheet for the feeding distance.

Abstract: Use of finite wireless resources is minimized when paging is performed to an MN, even if a location manager does not retain correct location area information for the reason that a mobile router (MR), which performs location update (LU) on behalf of mobile nodes (MNs) existing in the space in a moving body, does not send an LU signal because it is active, for example. A flag indicating whether an MR#1 is dormant or active is retained in a location manager LM#1. When paging is performed to an MN#2 which is in a master-slave relationship with the MR#1, the LM#1 refers to the flag to determine the state of the MR#1. When the MR#1 is active, the LM#1 inquires of a routing manager RM#1 about routing address information for the MR#1 and performs paging using the information. Thus, it is possible to perform paging to the MN#2 which is in a master-salve relationship with the MR#1, without the MR#1, which is moving in an active state, sending an LU signal.

Abstract: Time required for location registration is reduced and concentration of location update signals caused when a group moves is prevented. Each mobile node and a mobile router sends a location update request to a local location manager near to the area in which it exists, so that time required for location registration can be reduced, and it is possible to prevent pressure on wireless resources and temporary increase in communication traffic within a mobile network, which may be caused by concentration of location update signals when a group moves as in the case of a train with a lot of passengers having mobile nodes. Thereby, even if location registration is not correctly performed by a mobile router, which sends a location update request on behalf of mobile nodes existing in the space of a moving body, due to the communication condition or a failure, it can be dealt with.

Abstract: A mobile communications control method of this invention controls mobile communication by a mobile terminal in a network in which a plurality of wireless systems are available. In the mobile communications control method, the mobile terminal performs location registration with a wireless system selected from among the wireless systems, based on at least one of a status of the network, a status of the mobile terminal, location information of the mobile terminal, a frequency of incoming call reception of the mobile terminal, and service area information of the wireless systems.

Abstract: A network management server includes an address manager and an address assignment direction transmitter. The address manager manages a first address, a second address and a third address of the destination mobile terminals in accordance with address assignment information received from a mobile node. The address assignment direction transmitter transmits an address assignment directions for directing a source access node to manage the first address and the second address of the destination mobile terminal, and to transmit an address assignment direction for directing a destination access node to manage the second address and the third address of the destination mobile terminal.

Abstract: Backgate-characteristics determination method and device that make for curtailing the fabrication of semiconductor circuit elements having defective backgate-characteristics. Initially a first C-V curve 30 representing the relation between a voltage applied to the obverse face of a wafer 20 serving as a substrate for semiconductor circuit elements, and its capacitance, is found. Next, a second C-V curve 32 is found through applying a voltage to the reverse face of the wafer 20. The backgate characteristics for the semiconductor circuit elements are determined based on a voltage-shift amount 34 for the wafer 20, found from the first C-V curve 30 and the second C-V curve 32.

Abstract: A sheet feeding apparatus includes a stacking tray for stacking a sheet, a sheet feeding device for feeding the sheet, a register device for aligning a leading edge of the sheet fed by the sheet feeding device, a recognition device for recognizing a state that the sheets stacked on the stacking tray have different widths, and a setting device for setting a feeding distance according to a result of the recognition device. A control device controls the sheet feeding device to feed the sheet for the feeding distance.

Abstract: Backgate-characteristics determination method and device that make for curtailing the fabrication of semiconductor circuit elements having defective backgate-characteristics. Initially a first C-V curve 30 representing the relation between a voltage applied to the obverse face of a wafer 20 serving as a substrate for semiconductor circuit elements, and its capacitance, is found. Next, a second C-V curve 32 is found through applying a voltage to the reverse face of the wafer 20. The backgate characteristics for the semiconductor circuit elements are determined based on a voltage-shift amount 34 for the wafer 20, found from the first C-V curve 30 and the second C-V curve 32.

Abstract: A fuel cell control apparatus for controlling the supply amount of oxidizing gas to a fuel cell for producing electric energy by reaction between fuel gas and oxidizing gas includes a smoother for smoothing the output related quantity of the fuel cell, and an oxidizing gas feed determining device for determining the supply amount of the oxidizing gas on the basis of the output related quantity smoothed by the smoother, and therefore when controlling the amounts of the fuel gas and oxidizing gas depending on the output demand of the fuel cell, the substantial power generation efficiency is enhanced and the output is stabilized at the same time.