Patents by Inventor Masataka MIDORI
Masataka MIDORI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240110962Abstract: A computer-readable medium capable of estimating a distribution of an electromagnetic field intensity of radiant interference waves on a virtual surface surrounding a test piece with high accuracy while inhibiting an increase of a time required for a radiant interference wave test for radiant interference waves having a frequency included in a wider frequency band is provided. A computer-readable medium storing instructions which, when executed by a computer, cause the computer to execute a first calculation step of calculating an upper limit value of a measurement interval of radiant interference waves using an antenna based on positions of a plurality of electromagnetic wave sources according to a test piece radiating the radiant interference waves and a relative positional relation between the antenna measuring the radiant interference waves and the test piece.Type: ApplicationFiled: August 29, 2023Publication date: April 4, 2024Applicant: TDK CORPORATIONInventors: Masataka MIDORI, Tomohiro HONYA, Hiroshi KURIHARA
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Patent number: 11789056Abstract: An electromagnetic stirrer including: a shaft body extending in a first direction; and a plurality of stirring blades disposed on the shaft body, in which the plurality of stirring blades include a first stirring blade and a second stirring blade, the first stirring blade and the second stirring blade are aligned from a reference position of the shaft body in the first direction in order of the first stirring blade and the second stirring blade, a shape of the first stirring blade and a shape of the second stirring blade are similar to each other, and a size of the first stirring blade is different from a size of the second stirring blade.Type: GrantFiled: July 15, 2020Date of Patent: October 17, 2023Assignee: TDK CORPORATIONInventors: Masataka Midori, Hiroshi Kurihara, Yutaka Sakai, Hiroyuki Nedate
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Publication number: 20230296665Abstract: A electromagnetic wave test device includes: a reverberation chamber; a first antenna installed inside the chamber and radiating electromagnetic waves of a frequency lower than the chamber's first resonance frequency; a second antenna installed inside the chamber and radiating electromagnetic waves of a frequency equal to or higher than first resonance frequency; a power supply device connected between a grounding member and first antenna and feeding power to the first antenna; a dummy load connected between the grounding member and first antenna; a first power loss inhibiting unit having an impedance corresponding to an allowed value for power loss according to first antenna in a case wherein electromagnetic waves are radiated from the second antenna; and a switching unit including a first switching unit that switches a connection destination of first antenna to one of the dummy load and the first power loss inhibiting unit.Type: ApplicationFiled: March 14, 2023Publication date: September 21, 2023Applicant: TDK CORPORATIONInventors: Shotaro HAMAMOTO, Masataka MIDORI, Hiroshi KURIHARA
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Publication number: 20230168286Abstract: A reverberation chamber capable of performing an EMS test having high accuracy in a wider frequency band is provided. There is provided a reverberation chamber including an electromagnetic stirrer, in which the electromagnetic stirrer includes: a first stirring blade; and a holding body disposed on a first wall face of the reverberation chamber, extending in a first direction intersecting with the first wall face, and configured to hold the first stirring blade, and the first stirring blade is electrically insulated from the first wall face.Type: ApplicationFiled: November 22, 2022Publication date: June 1, 2023Applicant: TDK CorporationInventors: Masataka MIDORI, Shotaro HAMAMOTO, Hiroshi KURIHARA
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Patent number: 11656260Abstract: An electromagnetic wave measurement point calculation program causing a computer to execute: a correction coefficient calculating function of calculating a correction coefficient for which an interval of heights of an antenna satisfies a sampling theorem based on a relative positional relation between a test body including a radiation source radiating a radiation interference wave and the antenna performing measurement of at least one of an electric field and a magnetic field of the radiation interference wave and a reflection coefficient of the radiation interference wave on a floor face on which the test body is placed; and a measurement height calculating function of sequentially calculating the heights of the antenna in a case in which the measurement is performed using the correction coefficient.Type: GrantFiled: February 26, 2020Date of Patent: May 23, 2023Assignee: TDK CORPORATIONInventors: Tomohiro Honya, Masataka Midori, Hiroshi Kurihara
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Patent number: 11486917Abstract: An electromagnetic wave measurement point calculation device of the present invention is an electromagnetic wave measurement point calculation device that is configured to calculate a plurality of measurement points of an electromagnetic wave set on a surface surrounding a radiation source of the electromagnetic wave. The electromagnetic wave measurement point calculation device includes an arithmetic processing unit configured to calculate a measurement interval between a first measurement point and a second measurement point adjacent to the first measurement point using a correction coefficient determined according to the first measurement point and execute an electromagnetic wave measurement point calculation process for sequentially calculating the plurality of measurement points in a measurement range.Type: GrantFiled: March 18, 2019Date of Patent: November 1, 2022Assignee: TDK CORPORATIONInventors: Masataka Midori, Hiroshi Kurihara, Tomohiro Honya
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Publication number: 20220291270Abstract: An electromagnetic stirrer including: a shaft body extending in a first direction; and a plurality of stirring blades disposed on the shaft body, in which the plurality of stirring blades include a first stirring blade and a second stirring blade, the first stirring blade and the second stirring blade are aligned from a reference position of the shaft body in the first direction in order of the first stirring blade and the second stirring blade, a shape of the first stirring blade and a shape of the second stirring blade are similar to each other, and a size of the first stirring blade is different from a size of the second stirring blade.Type: ApplicationFiled: July 15, 2020Publication date: September 15, 2022Applicant: TDK CORPORATIONInventors: Masataka MIDORI, Hiroshi KURIHARA, Yutaka SAKAI, Hiroyuki NEDATE
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Publication number: 20220155358Abstract: An electromagnetic wave measurement point calculation program causing a computer to execute: a correction coefficient calculating function of calculating a correction coefficient for which an interval of heights of an antenna satisfies a sampling theorem based on a relative positional relation between a test body including a radiation source radiating a radiation interference wave and the antenna performing measurement of at least one of an electric field and a magnetic field of the radiation interference wave and a reflection coefficient of the radiation interference wave on a floor face on which the test body is placed; and a measurement height calculating function of sequentially calculating the heights of the antenna in a case in which the measurement is performed using the correction coefficient.Type: ApplicationFiled: February 26, 2020Publication date: May 19, 2022Applicant: TDK CORPORATIONInventors: Tomohiro HONYA, Masataka MIDORI, Hiroshi KURIHARA
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Publication number: 20190293702Abstract: An electromagnetic wave measurement point calculation device of the present invention is an electromagnetic wave measurement point calculation device that is configured to calculate a plurality of measurement points of an electromagnetic wave set on a surface surrounding a radiation source of the electromagnetic wave. The electromagnetic wave measurement point calculation device includes an arithmetic processing unit configured to calculate a measurement interval between a first measurement point and a second measurement point adjacent to the first measurement point using a correction coefficient determined according to the first measurement point and execute an electromagnetic wave measurement point calculation process for sequentially calculating the plurality of measurement points in a measurement range.Type: ApplicationFiled: March 18, 2019Publication date: September 26, 2019Applicant: TDK CORPORATIONInventors: Masataka MIDORI, Hiroshi KURIHARA, Tomohiro HONYA
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Patent number: 10317446Abstract: A radiated emission measuring device includes: an electric field measuring device and an arithmetic processing unit. The arithmetic processing unit performs: a first arithmetic process of creating at least one of an electric field distribution and an electric field strength distribution of the plurality of measurement points measured by the electric field measuring device and inputting zero to at least one of an electric field and electric field strengths at a certain point between two neighboring measurement points; a second arithmetic process of applying a digital low pass filter to at least one of the electric field distribution and the electric field strength distribution obtained in the first arithmetic process; and a third arithmetic process of specifying a position at a maximum electric field strength from at least one of an electric field distribution and an electric field strength distribution obtained in the second arithmetic process.Type: GrantFiled: March 1, 2017Date of Patent: June 11, 2019Assignee: TDK CORPORATIONInventors: Masataka Midori, Hiroshi Kurihara
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Publication number: 20170276712Abstract: A radiated emission measuring device includes: an electric field measuring device and an arithmetic processing unit. The arithmetic processing unit performs: a first arithmetic process of creating at least one of an electric field distribution and an electric field strength distribution of the plurality of measurement points measured by the electric field measuring device and inputting zero to at least one of an electric field and electric field strengths at a certain point between two neighboring measurement points; a second arithmetic process of applying a digital low pass filter to at least one of the electric field distribution and the electric field strength distribution obtained in the first arithmetic process; and a third arithmetic process of specifying a position at a maximum electric field strength from at least one of an electric field distribution and an electric field strength distribution obtained in the second arithmetic process.Type: ApplicationFiled: March 1, 2017Publication date: September 28, 2017Applicant: TDK CORPORATIONInventors: Masataka MIDORI, Hiroshi KURIHARA
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Patent number: 9335359Abstract: A far electromagnetic field estimation method includes assuming a measurement surface, setting a plurality of measurement points on the measurement surface, and measuring electromagnetic fields at the plurality of measurement points. The measurement surface in combination with a ground plane forms a closed surface surrounding a radiation source. A virtual observation point is outside a space formed inside the closed surface. Further, electromagnetic fields at a plurality of mirror image measurement points on a mirror image measurement surface having a plane-symmetrical relationship with the measurement surface are calculated on the basis of the electromagnetic fields at the plurality of measurement points. Then, a far electromagnetic field at the virtual observation point is estimated on the basis of the electromagnetic fields at the plurality of measurement points and at the plurality of mirror image measurement points.Type: GrantFiled: August 8, 2014Date of Patent: May 10, 2016Assignee: TDK CORPORATIONInventors: Hiroshi Kurihara, Masataka Midori, Masashi Torii
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Publication number: 20150042309Abstract: A far electromagnetic field estimation method includes assuming a measurement surface, setting a plurality of measurement points on the measurement surface, and measuring electromagnetic fields at the plurality of measurement points. The measurement surface in combination with a ground plane forms a closed surface surrounding a radiation source. A virtual observation point is outside a space formed inside the closed surface. Further, electromagnetic fields at a plurality of mirror image measurement points on a mirror image measurement surface having a plane-symmetrical relationship with the measurement surface are calculated on the basis of the electromagnetic fields at the plurality of measurement points. Then, a far electromagnetic field at the virtual observation point is estimated on the basis of the electromagnetic fields at the plurality of measurement points and at the plurality of mirror image measurement points.Type: ApplicationFiled: August 8, 2014Publication date: February 12, 2015Inventors: Hiroshi KURIHARA, Masataka MIDORI, Masashi TORII