Patents by Inventor Masato Chiba

Masato Chiba has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9254758
    Abstract: A control apparatus for a vehicle having an idle stop function includes a measurement unit that measures the characteristic of a battery provided in the vehicle, an identification unit that identifies the type of the battery based on the measured characteristic, and a control unit that stops the idle stop function in a case where the identified type of the battery indicates that the battery is not for an idle-stop vehicle, and permits execution of the idle stop function in a case where the execution of the idle stop function is permitted by an input of a predetermined signal from an external terminal even when the identified type of the battery indicates that the battery is not for the idle-stop vehicle.
    Type: Grant
    Filed: October 1, 2013
    Date of Patent: February 9, 2016
    Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Hiroshi Sato, Hiroaki Tabuchi, Ken Koibuchi, Masato Chiba, Kazuhiko Sakakibara, Nobuyuki Okabe
  • Publication number: 20140091739
    Abstract: A control apparatus for a vehicle having an idle stop function includes a measurement unit that measures the characteristic of a battery provided in the vehicle, an identification unit that identifies the type of the battery based on the measured characteristic, and a control unit that stops the idle stop function in a case where the identified type of the battery indicates that the battery is not for an idle-stop vehicle, and permits execution of the idle stop function in a case where the execution of the idle stop function is permitted by an input of a predetermined signal from an external terminal even when the identified type of the battery indicates that the battery is not for the idle-stop vehicle.
    Type: Application
    Filed: October 1, 2013
    Publication date: April 3, 2014
    Applicant: Toyota Jidosha Kabushiki Kaisha
    Inventors: Hiroshi SATO, Hiroaki TABUCHI, Ken KOIBUCHI, Masato CHIBA, Kazuhiko SAKAKIBARA, Nobuyuki OKABE
  • Patent number: 8410803
    Abstract: A test apparatus according to the present invention includes a probe card recognition unit that recognizes positions of at least two probe card marks formed to a probe card and assumes a probe card mark connection line connecting the positions of the probe card marks, a backing material recognition unit that recognizes positions of at least two backing material marks formed to a backing material where a semiconductor chip is fixed thereto and assumes a backing material mark connection line connecting the positions of the backing material mark, a positional relationship recognition unit that recognizes a positional relationship between the probe card and the backing material according to the probe card mark connection line and the backing material mark connection line, and a correction unit that corrects the position of at least one of the probe card and the backing material according to the positional relationship.
    Type: Grant
    Filed: June 22, 2010
    Date of Patent: April 2, 2013
    Assignees: Renesas Electronics Corporation, Kabushiki Kaisha Nihon Micronics
    Inventors: Nobuhiro Sawa, Kouichi Minami, Masato Chiba
  • Publication number: 20110018569
    Abstract: A test apparatus according to the present invention includes a probe card recognition unit that recognizes positions of at least two probe card marks formed to a probe card and assumes a probe card mark connection line connecting the positions of the probe card marks, a backing material recognition unit that recognizes positions of at least two backing material marks formed to a backing material where a semiconductor chip is fixed thereto and assumes a backing material mark connection line connecting the positions of the backing material mark, a positional relationship recognition unit that recognizes a positional relationship between the probe card and the backing material according to the probe card mark connection line and the backing material mark connection line, and a correction unit that corrects the position of at least one of the probe card and the backing material according to the positional relationship.
    Type: Application
    Filed: June 22, 2010
    Publication date: January 27, 2011
    Applicants: NEC ELECTRONICS CORPORATION, KABUSHIKI KAISHA NIHON MICRONICS
    Inventors: Nobuhiro SAWA, Kouichi MINAMI, Masato CHIBA
  • Publication number: 20090075319
    Abstract: A method of detecting a reactive metabolite which comprises steps of conducting a metabolic reaction of a test compound in the presence of two labeled nucleophiles, and detecting the label of the nucleophiles bound to the reactive metabolite, and a method of detecting a reactive metabolite which further comprises separating liquid layer using ammonium acetate to obtain an organic layer after the aforementioned reaction step are disclosed. In these detection methods, a reactive metabolite can be quantitatively detected by easy preparation. Furthermore, generation of a false positive signal can be prevented, and generation of a false negative signal can be decreased. Accordingly, screening of a test compound can be efficiently performed with higher accuracy.
    Type: Application
    Filed: September 13, 2006
    Publication date: March 19, 2009
    Inventors: Hiroyuki Takahashi, Kazuko Inoue, Yoshihiro Shibata, Masato Chiba, Yasuyuki Ishii
  • Patent number: 7304072
    Abstract: Compounds represented by the general formula (I) wherein Ar1 represents an aryl or heteroaryl which may be substituted; n represents 0 or 1; T, U, V and W each independently represent a nitrogen atom or a methine group which may have a substituent selected from the group consisting of halogen, lower alkyl, hydroxy and lower alkoxy, wherein at least two of which represent said methine group; X represents methine, hydroxy substituted methine or nitrogen atom; Y represents an imino which may be substituted with lower alkyl, or oxygen; and a salt, ester or N-oxide derivative thereof. The compounds exhibit NPY antagonistic activities and are useful as agents for the treatment of various diseases related to NPY, for example, cardiovascular disorders, central nervous system disorders, metabolic diseases, sexual and reproductive dysfunctions, gastro-intestinal disorders, respiratory disorders, inflammation or glaucoma, and the like.
    Type: Grant
    Filed: August 23, 2004
    Date of Patent: December 4, 2007
    Assignee: Banyu Pharmaceutical Co., Ltd.
    Inventors: Takehiro Fukami, Akio Kanatani, Akane Ishihara, Yasuyuki Ishii, Toshiyuki Takahashi, Yuji Haga, Toshihiro Sakamoto, Takahiro Itoh, Masato Chiba
  • Publication number: 20050032820
    Abstract: A Compound represented by the general formula (I): wherein AR1 represents an aryl or heteroaryl which may be substituted, the substituent being selected from the group consisting of hydroxy, halogen, nitro, lower alkyl, halo(lower)alkyl, hydroxy(lower)alkyl, cyclo(lower)alkyl, lower alkenyl, lower alkoxy, halo(lower)alkoxy, lower alkylthio, carboxyl, lower alkanoyl, lower alkoxycarbonyl, lower alkylene optionally substituted with oxo, and a group represented by the formula —Q—Ar2; Ar2represents an aryl or heteroaryl which may be substituted, the substituent being selected from the group consisting of halogen, cyano, lower alkyl, halo(lower)alkyl, hydroxy(lower)alkyl, hydroxy, lower alkoxy, halo(lower)alkoxy, lower alkylamino, di-lower alkylamino, lower alkanoyl and aryl; n represents 0 or 1; Q represents a single bond or carbonyl; T, U, V and W each independently represent a nitrogen atom or a methine group which may have a substituent selected from the group consisting of halogen, lower alkyl, hydrox
    Type: Application
    Filed: August 23, 2004
    Publication date: February 10, 2005
    Inventors: Takehiro Fukami, Akio Kanatani, Akane Ishihara, Yasuyuki Ishii, Toshiyuki Takahashi, Yuji Haga, Toshihiro Sakamoto, Takahiro Itoh, Masato Chiba