Patents by Inventor Masato Haruta

Masato Haruta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8203347
    Abstract: A reflection element determination device derives error factors in a first signal source and a second signal source based on measurement results of a signal in respective states in which reflection elements are respectively connected to the first signal source and the second signal source, and measurement results of a signal in a state in which the first signal source and the second signal source are connected with each other via a transmission element, derives transmission characteristics of the transmission element based on the measurement results of a signal in the state in which the first signal source and the second signal source are connected with each other via the transmission element and the derived error factors, and determines whether the reflection elements realize predetermined reflection states based on the derived transmission characteristics of the transmission element and transmission characteristics of the transmission element which have been known before the derivation, where the transmissi
    Type: Grant
    Filed: August 24, 2007
    Date of Patent: June 19, 2012
    Assignee: Advantest Corporation
    Inventors: Yoshikazu Nakayama, Takao Kawahara, Masato Haruta
  • Patent number: 8076947
    Abstract: An error factor determination device includes an error factor recording unit which records error factors Eija in a signal generation system which includes a signal generation unit for generating a signal and an output terminal for outputting the signal, a reflection coefficient deriving unit which derives a reflection coefficient Xm of the output terminal based on measurement results R1 and R2 of the signal while the signal is being output from the output terminal and the error factors Eija recorded in the error factor recording unit, and a true/false determination unit which determines whether the recorded error factors Eija are true or false based on the derived reflection coefficient Xm, and a true value of the reflection coefficient.
    Type: Grant
    Filed: August 15, 2007
    Date of Patent: December 13, 2011
    Assignee: Advantest Corporation
    Inventors: Yoshikazu Nakayama, Masato Haruta, Hiroyuki Sekine
  • Publication number: 20100225301
    Abstract: An error factor determination device includes an error factor recording unit which records error factors Eija in a signal generation system which includes a signal generation unit for generating a signal and an output terminal for outputting the signal, a reflection coefficient deriving unit which derives a reflection coefficient Xm of the output terminal based on measurement results R1 and R2 of the signal while the signal is being output from the output terminal and the error factors Eija recorded in the error factor recording unit, and a true/false determination unit which determines whether the recorded error factors Eija are true or false based on the derived reflection coefficient Xm, and a true value of the reflection coefficient.
    Type: Application
    Filed: August 15, 2007
    Publication date: September 9, 2010
    Applicant: ADVANTEST CORPORATION
    Inventors: Yoshikazu Nakayama, Masato Haruta, Hiroyuki Sekine
  • Publication number: 20100042347
    Abstract: A reflection element determination device derives error factors in a first signal source and a second signal source based on measurement results of a signal in respective states in which reflection elements are respectively connected to the first signal source and the second signal source, and measurement results of a signal in a state in which the first signal source and the second signal source are connected with each other via a transmission element, derives transmission characteristics of the transmission element based on the measurement results of a signal in the state in which the first signal source and the second signal source are connected with each other via the transmission element and the derived error factors, and determines whether the reflection elements realize predetermined reflection states based on the derived transmission characteristics of the transmission element and transmission characteristics of the transmission element which have been known before the derivation, where the transmissi
    Type: Application
    Filed: August 24, 2007
    Publication date: February 18, 2010
    Applicant: ADVANTEST CORPORATION
    Inventors: Yoshikazu Nakayama, Takao Kawahara, Masato Haruta
  • Patent number: 7652482
    Abstract: The error of a measurement system can be corrected even if the frequency of an input signal of a device under test is different from that of the output signal. A signal output acquiring section acquires the power of the input signal by a power meter not shown in the drawing. Thus, errors due to frequency tracking can be separated depending on the direction in a signal flow graph. Since a receiver measures the parameter concerning the received signal when a signal source is directly connected to a receiver, the measurement system error factor of the receiver can be acquired. The parameter of a device under test can be measured while the error is corrected when the results of measurement, concerning the device under test of receivers are combined.
    Type: Grant
    Filed: April 17, 2003
    Date of Patent: January 26, 2010
    Assignee: Advantest Corporation
    Inventors: Yoshikazu Nakayama, Masato Haruta
  • Patent number: 7519509
    Abstract: There is reduced labor to directly connect two ports selected from ports of a network analyzer in order to measure transmission tracking errors. A network analyzer, to which a test set which branches four ports to nine ports (main port group: three ports, and sub port groups: three ports ×2) is connected, includes transmission/reception ports, a transmission tracking error determining unit which determines transmission tracking errors of a combination of one of possible connections in the main port group and one of possible connections in the sub port groups for all the possible connections in the main port group based on signals before transmitted by the transmission/reception ports and reception signals, and a transmission tracking error deriving unit which derives other transmission tracking errors based on the transmission tracking errors determined by the transmission tracking error determining unit.
    Type: Grant
    Filed: March 15, 2005
    Date of Patent: April 14, 2009
    Assignee: Advantest Corporation
    Inventors: Yoshikazu Nakayama, Masato Haruta
  • Patent number: 7511508
    Abstract: There are measured characteristics of a jig (fixture) used to calculate and measure circuit parameters of a device under test. There is provided a jig characteristic measuring device which measures the jig characteristics of a jig which includes signal lines used to connect a DUT and a network analyzer with each other (namely, the reflection characteristics of the signal lines, and the transmission S parameters), measures the reflection coefficients of the signal lines in an open state where the DUT is not connected to the signal lines measures the reflection coefficients of the signal lines in a short-circuit state where all the signal lines are grounded, and derives the jig characteristics of the jig based on these measured results.
    Type: Grant
    Filed: June 13, 2005
    Date of Patent: March 31, 2009
    Assignee: Advantest Corporation
    Inventors: Masato Haruta, Hiroyuki Konno, Naoya Kimura, Yoshikazu Nakayama
  • Patent number: 7348784
    Abstract: A measurement system for circuit parameters of a device under test (DUT) that reduces the number of attachments and detachments of calibration kits. An error factor acquisition device includes a first calibrator connected to ports of a network analyzer that has a first state realization unit that determines open-circuit, short-circuit, and standard load states for the ports. Second calibrators connected to the first calibrator and the DUT have a second state realization unit that determines open-circuit, short-circuit, and standard load states for the ports. The first calibrator includes first connection units that connect the ports to the first state realization unit or to the respective second calibrators, while the second calibrators respectively include a second connection unit that connects the ports to the second state realization unit or the DUT.
    Type: Grant
    Filed: September 14, 2004
    Date of Patent: March 25, 2008
    Assignee: ADVANTEST Corporation
    Inventors: Masato Haruta, Hiroyuki Sato, Takeshi Tanabe, Yoshikazu Nakayama
  • Publication number: 20070285108
    Abstract: There is reduced labor to directly connect two ports selected from ports of a network analyzer in order to measure transmission tracking errors. A network analyzer, to which a test set which branches four ports to nine ports (main port group: three ports, and sub port groups: three ports×2) is connected, includes transmission/reception ports, a transmission tracking error determining unit which determines transmission tracking errors of a combination of one of possible connections in the main port group and one of possible connections in the sub port groups for all the possible connections in the main port group based on signals before transmitted by the transmission/reception ports and reception signals, and a transmission tracking error deriving unit which derives other transmission tracking errors based on the transmission tracking errors determined by the transmission tracking error determining unit.
    Type: Application
    Filed: March 15, 2005
    Publication date: December 13, 2007
    Applicant: ADVANTEST CORPORATION
    Inventors: Yoshikazu Nakayama, Masato Haruta
  • Patent number: 7302351
    Abstract: It is possible to apply a correct power to a load even when the output impedance and a load impedance of a signal source are different from a characteristic impedance of a transmission line. The power applied to the load can be expressed by a measurement system error factor, a load coefficient X of the load, and an S parameter of the input signal R. Accordingly, a target input signal decision can decide a target value of the S parameter of the input signal R according to the power desired to be applied to the load, the measurement system error factor, and the load coefficient X of the load. Furthermore, an input signal level control section controls the input signal level so that the S parameter of the input signal R has this target value. This is performed by changing the amplification ratio of an amplification ratio variable amplifier. Thus, it is possible to apply a desired power to the load not depending on whether the impedance is matched or not.
    Type: Grant
    Filed: November 19, 2003
    Date of Patent: November 27, 2007
    Assignee: Advantest Corporation
    Inventors: Masato Haruta, Yoshikazu Nakayama
  • Publication number: 20070222455
    Abstract: There are measured characteristics of a jig (fixture) used to calculate and measure circuit parameters of a device under test. There is provided a jig characteristic measuring device which measures the jig characteristics of a jig 3 which includes signal lines 3a, 3b, 3c, and 3d used to connect a DUT 2 and a network analyzer 1 with each other (namely, the reflection characteristics of signal lines 3a, 3b, 3c, and 3d, and the transmission S parameters), measures the reflection coefficients of the signal lines 3a, 3b, 3c, and 3d in an open state where the DUT 2 is not connected to the signal lines 3a, 3b, 3c, and 3d, measures the reflection coefficients of the signal lines 3a, 3b, 3c, and 3d in a short-circuit state where all the signal lines 3a, 3b, 3c, and 3d are grounded, and derives the jig characteristics of the jig 3 based on these measured results.
    Type: Application
    Filed: June 13, 2005
    Publication date: September 27, 2007
    Applicant: ADVANTEST CORPORATION
    Inventors: Masato Haruta, Hiroyuki Konno, Naoya Kimura, Yoshikazu Nakayama
  • Publication number: 20070029989
    Abstract: It is possible to calibrate a measurement system for circuit parameters of a DUT (device under test) by reducing the number of attachments and detachments of calibration kits. An error factor acquisition device includes: a first calibrator (100) connected to ports (18, 28) of a network analyzer and having a first state realization unit (120) for realizing open-circuit, short-circuit, and standard load states for the ports (18, 28) or short-circuiting the ports (18, 28); and second calibrators (200) connected to the first calibrator (100) and the DUT (400) and respectively having a second state realization unit (220) for realizing open-circuit, short-circuit, and standard load states for the ports (18, 28).
    Type: Application
    Filed: September 14, 2004
    Publication date: February 8, 2007
    Applicant: ADVANTEST CORPORATION
    Inventors: Masato Haruta, Hiroyuki Sato, Takeshi Tanabe, Yoshikazu Nakayama
  • Publication number: 20060005065
    Abstract: The error of a measurement system can be corrected even if the frequency of an input signal of a device under test is different from that of the output signal. A signal output acquiring section acquires the power of the input signal by means of a power meter not shown in the drawing. Thus, errors due to frequency tracking can be separated depending on the direction in a signal flow graph. Since a receiver measures the parameter concerning the received signal when a signal source is directly connected to receiving means, the measurement system error factor of the receiving means can be acquired. The parameter of a device under test can be measured while the error is corrected when the results of measurement, concerning the device under test of receivers are combined.
    Type: Application
    Filed: April 17, 2003
    Publication date: January 5, 2006
    Applicant: ADVANTEST CORPORATION
    Inventors: Yoshikazu Nakayama, Masato Haruta
  • Publication number: 20050289392
    Abstract: It is possible to apply a correct power to a load even when the output impedance and a load impedance of a signal source are different from a characteristic impedance of a transmission line. The power applied to the load can be expressed by a measurement system error factor, a load coefficient X of the load, and an S parameter of the input signal R. Accordingly, a target input signal decision can decide a target value of the S parameter of the input signal R according to the power desired to be applied to the load, the measurement system error factor, and the load coefficient X of the load. Furthermore, an input signal level control section controls the input signal level so that the S parameter of the input signal R has this target value. This is performed by changing the amplification ratio of an amplification ratio variable amplifier. Thus, it is possible to apply a desired power to the load not depending on whether the impedance is matched or not.
    Type: Application
    Filed: November 19, 2003
    Publication date: December 29, 2005
    Inventors: Masato Haruta, Yoshikazu Nakayama