Patents by Inventor Masaya Tabaru

Masaya Tabaru has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10378416
    Abstract: It is aimed to analyze a gas component of a to-be-analyzed gas with a reduced influence of a liquid component contained in the to-be-analyzed gas. Provided is an analyzing apparatus for analyzing a gas component of an exhaust gas that has passed through a scrubber apparatus and the like. The analyzing apparatus includes a collecting nozzle configured to collect a to-be-analyzed gas, a liquid collecting unit configured to collect a liquid component contained in the to-be-analyzed gas collected by the collecting nozzle and to allow the to-be-analyzed gas to pass therethrough, a liquid discharging unit configured to discharge the liquid component collected by the liquid collecting unit, and an analyzing unit configured to analyze a gas component of the to-be-analyzed gas that has passed through the liquid collecting unit.
    Type: Grant
    Filed: May 26, 2016
    Date of Patent: August 13, 2019
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Ryoichi Higashi, Masaya Tabaru, Kazuhiro Koizumi, Michiyasu Okada, Kozo Akao
  • Patent number: 9851292
    Abstract: A particle detection device includes a scattered light detector detecting an intensity of light scattered by a particle irradiated with a laser, an incandescent light detector detecting an intensity of incandescent light from the particle being irradiated with the laser, and a signal processor including: a first peak hold circuit holding a peak in the intensity of the light scattered by the particle; a second peak hold circuit holding a peak in the intensity of the incandescent light from the particle; and a threshold value comparison circuit comparing the peak in the first peak hold circuit to a threshold and, when the peak in the first peak hold circuit exceeds the threshold, outputs a reset signal to the second peak hold circuit immediately thereafter so the peak previously in the second peak hold circuit is reset immediately after the peak in the first peak hold circuit exceeds the threshold.
    Type: Grant
    Filed: June 9, 2016
    Date of Patent: December 26, 2017
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Masaya Tabaru, Naoki Takeda, Kazuhiro Koizumi, Noritomo Hirayama
  • Patent number: 9574984
    Abstract: A particle beam forming device for forming either a linear or conical particle beam from a particle source in which particles are dispersed in a gas, includes: a reduced-pressure vessel in which pressure is reduced; a particle beam generating unit, which has one end arranged outside of the reduced-pressure vessel and an other end arranged inside the reduced-pressure vessel, and which captures the particle source from outside the reduced-pressure vessel and introduces the particle beam into the reduced-pressure vessel; and a particle beam evaluating unit for evaluating a spatial distribution of the particle beam inside the reduced-pressure vessel.
    Type: Grant
    Filed: October 17, 2013
    Date of Patent: February 21, 2017
    Assignees: FUJI ELECTRIC CO., LTD, THE UNIVERSITY OF TOKYO
    Inventors: Naoki Takeda, Masaya Tabaru, Kazuhiro Koizumi, Noritomo Hirayama, Nobuyuki Takegawa, Takuma Miyakawa
  • Publication number: 20170016820
    Abstract: A particle detection device includes a scattered light detector detecting an intensity of light scattered by a particle irradiated with a laser, an incandescent light detector detecting an intensity of incandescent light from the particle being irradiated with the laser, and a signal processor including: a first peak hold circuit holding a peak in the intensity of the light scattered by the particle; a second peak hold circuit holding a peak in the intensity of the incandescent light from the particle; and a threshold value comparison circuit comparing the peak in the first peak hold circuit to a threshold and, when the peak in the first peak hold circuit exceeds the threshold, outputs a reset signal to the second peak hold circuit immediately thereafter so the peak previously in the second peak hold circuit is reset immediately after the peak in the first peak hold circuit exceeds the threshold.
    Type: Application
    Filed: June 9, 2016
    Publication date: January 19, 2017
    Applicant: Fuji Electric Co., Ltd.
    Inventors: Masaya TABARU, Naoki TAKEDA, Kazuhiro KOIZUMI, Noritomo HIRAYAMA
  • Publication number: 20160348561
    Abstract: It is aimed to analyze a gas component of a to-be-analyzed gas with a reduced influence of a liquid component contained in the to-be-analyzed gas. Provided is an analyzing apparatus for analyzing a gas component of an exhaust gas that has passed through a scrubber apparatus and the like. The analyzing apparatus includes a collecting nozzle configured to collect a to-be-analyzed gas, a liquid collecting unit configured to collect a liquid component contained in the to-be-analyzed gas collected by the collecting nozzle and to allow the to-be-analyzed gas to pass therethrough, a liquid discharging unit configured to discharge the liquid component collected by the liquid collecting unit, and an analyzing unit configured to analyze a gas component of the to-be-analyzed gas that has passed through the liquid collecting unit.
    Type: Application
    Filed: May 26, 2016
    Publication date: December 1, 2016
    Inventors: Ryoichi HIGASHI, Masaya TABARU, Kazuhiro KOIZUMI, Michiyasu OKADA, Kozo AKAO
  • Patent number: 9310295
    Abstract: Aspects of a laser-type gas analyzer can include a mid-infrared light reception signal processing and computing unit that calculates a gas concentration of the first gas to be measured on the basis of a mid-infrared light reception signal, a near-infrared light reception signal processing and computing unit that detects, at respective times, the gas concentration of the second gas to be measured, water concentration in a space, and alight amount decrement due to dust, on the basis of near-infrared light reception signal. Also included can be a gas concentration correcting unit that corrects the gas concentrations of the first and second gases to be measured using the water concentration and the light amount decrement.
    Type: Grant
    Filed: June 5, 2015
    Date of Patent: April 12, 2016
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Masaya Tabaru, Kazuhiro Koizumi, Hideyuki Konishi, Takashi Inui
  • Publication number: 20150268159
    Abstract: Aspects of a laser-type gas analyzer can include a mid-infrared light reception signal processing and computing unit that calculates a gas concentration of the first gas to be measured on the basis of a mid-infrared light reception signal, a near-infrared light reception signal processing and computing unit that detects, at respective times, the gas concentration of the second gas to be measured, water concentration in a space, and alight amount decrement due to dust, on the basis of near-infrared light reception signal. Also included can be a gas concentration correcting unit that corrects the gas concentrations of the first and second gases to be measured using the water concentration and the light amount decrement.
    Type: Application
    Filed: June 5, 2015
    Publication date: September 24, 2015
    Inventors: Masaya TABARU, Kazuhiro KOIZUMI, Hideyuki KONISHI, Takashi INUI
  • Publication number: 20150260629
    Abstract: A particle beam forming device for forming either a linear or conical particle beam from a particle source in which particles are dispersed in a gas, includes: a reduced-pressure vessel in which pressure is reduced; a particle beam generating unit, which has one end arranged outside of the reduced-pressure vessel and an other end arranged inside the reduced-pressure vessel, and which captures the particle source from outside the reduced-pressure vessel and introduces the particle beam into the reduced-pressure vessel; and a particle beam evaluating unit for evaluating a spatial distribution of the particle beam inside the reduced-pressure vessel.
    Type: Application
    Filed: October 17, 2013
    Publication date: September 17, 2015
    Applicants: THE UNIVERSITY OF TOKYO, FUJI ELECTRIC CO., LTD.
    Inventors: Naoki Takeda, Masaya Tabaru, Kazuhiro Koizumi, Noritomo Hirayama, Nobuyuki Takegawa, Takuma Miyakawa