Patents by Inventor Masaya Takatsugu

Masaya Takatsugu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Flaw-detection apparatus and flaw-detection method
    Patent number: 9494558
    Abstract: Noise included in detection signals is distinguished with a simple configuration. Provided is a flaw-detection apparatus (1) including a flaw-detection sensor group (11) in which two flaw-detection sensors (11a and 11b) are arranged substantially in one row in a scanning direction with a distance therebetween and a processing device (15) that detects a defect in an inspection object on the basis of detection signals detected by the individual flaw-detection sensors (11a and 11b), wherein, with regard to the detection signals detected by the flaw-detection sensors (11a and 11b), when signal values detected at substantially a same positional coordinate in the scanning direction are not similar to each other, and, additionally, when signal values measured at a same time are similar to each other, the processing device (15) determines that the detection signals are not defect signals.
    Type: Grant
    Filed: October 25, 2010
    Date of Patent: November 15, 2016
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kayoko Kawata, Masaaki Kurokawa, Masayoshi Higashi, Masaya Takatsugu, Yoshihiro Asada
  • FLAW-DETECTION APPARATUS AND FLAW-DETECTION METHOD
    Publication number: 20120123699
    Abstract: Noise included in detection signals is distinguished with a simple configuration. Provided is a flaw-detection apparatus (1) including a flaw-detection sensor group (11) in which two flaw-detection sensors (11a and 11b) are arranged substantially in one row in a scanning direction with a distance therebetween and a processing device (15) that detects a defect in an inspection object on the basis of detection signals detected by the individual flaw-detection sensors (11a and 11b), wherein, with regard to the detection signals detected by the flaw-detection sensors (11a and 11b), when signal values detected at substantially a same positional coordinate in the scanning direction are not similar to each other, and, additionally, when signal values measured at a same time are similar to each other, the processing device (15) determines that the detection signals are not defect signals.
    Type: Application
    Filed: October 25, 2010
    Publication date: May 17, 2012
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Kayoko Kawata, Masaaki Kurokawa, Masayoshi Higashi, Masaya Takatsugu, Yoshihiro Asada
  • PIPE INNER SURFACE INSPECTION APPARATUS
    Publication number: 20110314918
    Abstract: A pipe inner surface inspection apparatus that can accurately inspect the inlet portion of a pipe is provided.
    Type: Application
    Filed: June 20, 2011
    Publication date: December 29, 2011
    Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Seiichi Kawanami, Masayoshi Nakai, Masaya Takatsugu, Masaharu Michihashi