Patents by Inventor Masayoshi Yamasaki

Masayoshi Yamasaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190145623
    Abstract: In a structure for cooling a constituent member of a gas turbine engine using a working gas of the gas turbine engine as a cooling medium, on a wall surface of a passage wall formed from a part of the constituent member and facing a cooling medium passage through which the cooling medium flows, a recess formed on the wall surface of the passage wall and a projection formed on at least a part of a peripheral edge of the recess are provided.
    Type: Application
    Filed: January 15, 2019
    Publication date: May 16, 2019
    Applicant: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Kenichiro FUKUMOTO, Yoshihiro Yamasaki, Masayoshi Kinugawa, Kazuhiko Tanimura, Katsuhiko Ishida, Tomoko Tsuru, Takayuki Murata
  • Patent number: 10281264
    Abstract: A three-dimensional measurement apparatus including: a projection unit configured to project a pattern onto a measurement target object from one or more projection directions; and an image capturing unit configured to obtain one or more captured images by capturing an image of the measurement target object from one or more view points. The three-dimensional measurement apparatus obtains a position of the pattern projected onto the measurement target object based on the one or more captured images obtained by the image capturing unit, and calculates three-dimensional coordinates of a surface of the measurement target object based on the position of the pattern obtained from the one or more captured images and a position of the pattern estimated based on a parameter set that represents internal scattering of the measurement target object.
    Type: Grant
    Filed: November 25, 2015
    Date of Patent: May 7, 2019
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Tomoaki Higo, Toshihiro Kobayashi, Masayoshi Yamasaki
  • Publication number: 20170289453
    Abstract: An information processing apparatus acquires an image by imaging an imaging apparatus, detects an occurrence of a factor that influences a position and orientation estimation relating to an image, determines whether or not to register the acquired image based on the detected factor, and constructs an image database for estimating the position and orientation of the imaging apparatus from the image acquired by the acquisition unit using a group of images determined to be registered.
    Type: Application
    Filed: March 24, 2017
    Publication date: October 5, 2017
    Inventors: Koji Makita, Masayoshi Yamasaki
  • Publication number: 20170263054
    Abstract: An information processing apparatus determines luminance of a pattern given as an index to an experience area of a real space, based on a threshold in case of detecting a feature of an image, and generates an image of the pattern of the determined luminance.
    Type: Application
    Filed: March 10, 2017
    Publication date: September 14, 2017
    Inventors: Masayoshi YAMASAKI, Koji MAKITA
  • Patent number: 9714826
    Abstract: A shape of an object is measured using a plurality of space encoding patterns each of which includes a light portion and a dark portion. A first and second pattern sets are obtained. The first set comprises patterns each of which has the light portion of each space encoding pattern masked by a pattern mask. The second set comprises patterns each of which has the light portion of each of the space encoding pattern masked by a mask with varying the mask pattern. Captured images of an object on which the patterns of the first and second sets are sequentially projected are inputted. A correspondence between projection coordinates of the projected pattern and image coordinates of a captured image for the projected pattern is detected. A shape of the object is derived based on correspondences.
    Type: Grant
    Filed: June 9, 2015
    Date of Patent: July 25, 2017
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Tomoaki Higo, Toshihiro Kobayashi, Masayoshi Yamasaki
  • Patent number: 9557167
    Abstract: A first image of a space onto which a first light pattern formed from bright and dark portions and a coordinate-detection pattern projected onto each region of the space divided by the first pattern have been projected is acquired. A second image is acquired of the space onto which a second light pattern having a boundary position between bright and dark portions that is different from that of the first pattern, and a coordinate-detection pattern projected onto each region of the space divided by the second pattern have been projected. One of the first image and the second image is selected to perform three-dimensional shape measurement of an object included in the space based on the selection image.
    Type: Grant
    Filed: January 9, 2015
    Date of Patent: January 31, 2017
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Toshihiro Kobayashi, Tomoaki Higo, Masayoshi Yamasaki
  • Publication number: 20160156899
    Abstract: A three-dimensional measurement apparatus including: a projection unit configured to project a pattern onto a measurement target object from one or more projection directions; and an image capturing unit configured to obtain one or more captured images by capturing an image of the measurement target object from one or more view points. The three-dimensional measurement apparatus obtains a position of the pattern projected onto the measurement target object based on the one or more captured images obtained by the image capturing unit, and calculates three-dimensional coordinates of a surface of the measurement target object based on the position of the pattern obtained from the one or more captured images and a position of the pattern estimated based on a parameter set that represents internal scattering of the measurement target object.
    Type: Application
    Filed: November 25, 2015
    Publication date: June 2, 2016
    Inventors: Tomoaki Higo, Toshihiro Kobayashi, Masayoshi Yamasaki
  • Publication number: 20150362312
    Abstract: A shape of an object is measured using a plurality of space encoding patterns each of which includes a light portion and a dark portion. A first and second pattern sets are obtained. The first set comprises patterns each of which has the light portion of each space encoding pattern masked by a pattern mask. The second set comprises patterns each of which has the light portion of each of the space encoding pattern masked by a mask with varying the mask pattern. Captured images of an object on which the patterns of the first and second sets are sequentially projected are inputted. A correspondence between projection coordinates of the projected pattern and image coordinates of a captured image for the projected pattern is detected. A shape of the object is derived based on correspondences.
    Type: Application
    Filed: June 9, 2015
    Publication date: December 17, 2015
    Inventors: Tomoaki Higo, Toshihiro Kobayashi, Masayoshi Yamasaki
  • Publication number: 20150310663
    Abstract: Images are obtained from an imaging device. The images represent patterns projected in a time series by a projection device. Each pattern comprises dashed lines each of which has a predetermined width. A longitudinal direction of each dashed line is substantially perpendicular to a base line defined by a segment connecting optical centers of the projection and imaging devices. Each dashed line repeats light and dark in the longitudinal direction. The dashed lines are discriminated based on combinations of the light and dark in the images. Correspondences between projected coordinates and image coordinates of the dashed lines are detected based on information regarding the patterns and a discrimination result of the dashed lines. A three-dimensional shape of the object is calculated based on the correspondences, and calibration data of the projection and imaging devices.
    Type: Application
    Filed: April 16, 2015
    Publication date: October 29, 2015
    Inventors: Masayoshi Yamasaki, Toshihiro Kobayashi, Tomoaki Higo
  • Publication number: 20150204662
    Abstract: A first image of a space onto which a first light pattern formed from bright and dark portions and a coordinate-detection pattern projected onto each region of the space divided by the first pattern have been projected is acquired. A second image is acquired of the space onto which a second light pattern having a boundary position between bright and dark portions that is different from that of the first pattern, and a coordinate-detection pattern projected onto each region of the space divided by the second pattern have been projected. One of the first image and the second image is selected to perform three-dimensional shape measurement of an object included in the space based on the selection image.
    Type: Application
    Filed: January 9, 2015
    Publication date: July 23, 2015
    Inventors: Toshihiro Kobayashi, Tomoaki Higo, Masayoshi Yamasaki
  • Patent number: 7512501
    Abstract: A defect inspecting apparatus comprising: an inspection region dividing section which divides a defect inspection region of a wafer on which a circuit pattern is formed into a plurality of inspection subregions; a pattern density calculating section which calculates the pattern density of each of the inspection subregions on the basis of design data of the circuit pattern; an inspection execution region and sensitivity rank setting section which assigns a sensitivity rank based on the pattern density to a plurality of inspection execution regions, each including a plurality of the inspection subregions; and a defect inspecting section which sets an inspection parameter on the basis of sensitivity ranks of the inspection execution regions and inspects the inspection execution regions for a defect.
    Type: Grant
    Filed: August 16, 2007
    Date of Patent: March 31, 2009
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Hiroyuki Morinaga, Atsushi Onishi, Masayoshi Yamasaki, Takema Ito, Yasuhiro Kaga
  • Publication number: 20080052021
    Abstract: A defect inspecting apparatus comprising: an inspection region dividing section which divides a defect inspection region of a wafer on which a circuit pattern is formed into a plurality of inspection subregions; a pattern density calculating section which calculates the pattern density of each of the inspection subregions on the basis of design data of the circuit pattern; an inspection execution region and sensitivity rank setting section which assigns a sensitivity rank based on the pattern density to a plurality of inspection execution regions, each including a plurality of the inspection subregions; and a defect inspecting section which sets an inspection parameter on the basis of sensitivity ranks of the inspection execution regions and inspects the inspection execution regions for a defect.
    Type: Application
    Filed: August 16, 2007
    Publication date: February 28, 2008
    Inventors: Hiroyuki Morinaga, Atsushi Onishi, Masayoshi Yamasaki, Takema Ito, Yasuhiro Kaga
  • Patent number: 4589518
    Abstract: A revolving block having an inclination correcting mechanism housed therein is adapted to revolvably support a working implement, such as a ladder or boom, mounted on a high place working vehicle.
    Type: Grant
    Filed: August 20, 1985
    Date of Patent: May 20, 1986
    Assignee: Morita Fire Pump Mfg. Co., Ltd.
    Inventors: Tetsuo Kohzai, Naoyuki Murai, Masayoshi Yamasaki