Abstract: A bin-module based automated storage and retrieval system (ASRS) includes a plurality of storage shelves, each removably supporting a plurality of bin modules. Each bin module includes multiple bins. The system also includes a collection shelf configured to removably support bin modules. The system further includes a dolly including: (a) a dolly frame, (b) a drive module configured to propel the dolly, and (c) an actuator configured to move a coupler to couple to the bin module supported in one of the plurality of storage shelves when the dolly is positioned adjacent to said storage shelf, the actuator being further configured to remove said bin module from said storage shelf to the dolly frame, and to move said bin module from the dolly frame to the collection shelf when the dolly is positioned adjacent to the collection shelf.

Abstract: A bin-module based automated storage and retrieval system (ASRS) includes a plurality of storage shelves, each removably supporting a plurality of bin modules. Each bin module includes multiple bins. The system also includes a collection shelf configured to removably support bin modules. The system further includes a dolly including: (a) a dolly frame, (b) a drive module configured to propel the dolly, and (c) an actuator configured to move a coupler to couple to the bin module supported in one of the plurality of storage shelves when the dolly is positioned adjacent to said storage shelf the actuator being further configured to remove said bin module from said storage shelf to the dolly frame, and to move said bin module from the dolly frame to the collection shelf when the dolly is positioned adjacent to the collection shelf.

Abstract: An insulated probe pin 10 includes a conductor probe pin 11 and an insulator coating 12 covering a periphery of the conductor probe pin 10 such that a sensing-side end portion of the conductor probe pin 10 is exposed. An end portion 12a of the insulator coating 12 toward the sensing-side end of the conductor probe pin 11 has a thickness larger than that of an end portion of the insulator coating 12 toward a connection-side end of the conductor probe pin 11 in an entire periphery of the insulator coating 12.