Abstract: An object of the present invention is to provide a mass-storage nonvolatile memory device capable of performing high speed operation. The nonvolatile memory device comprises a memory array comprising a plurality of memory cells arranged in a matrix, each of the memory cells comprising a variable resistor element formed of a manganese-containing oxide having a perovskite structure in which an electric resistance is varied by application of a voltage pulse and a variation amount of the electric resistance is variable depending on the magnitude of the voltage amplitude; and a program pulse generation circuit that, in order to program 3-level or larger multi-level data corresponding to one erase state and two or more program states into the variable resistor element, is capable of performing generation of program pulses having two or more different voltage amplitudes corresponding to the program states, the generation being separately performed corresponding to program data.

Abstract: A semiconductor testing apparatus and a semiconductor testing method are provided which permit an apparatus having an inexpensive configuration to perform, with precision, the acceptance-or-rejection determination and measurement test of a semiconductor integrated circuit having a large number of output terminals each for outputting a multi-gradation level output voltage. The semiconductor testing apparatus includes output voltage testing device and comparison voltage generation data inputting device. The output voltage testing device includes test voltage inputting device, comparison voltage generating device, a high level comparator, a low level comparator, and comparison result outputting device. The high level comparator and the low level comparator constitute comparing device for comparing a voltage to be tested, with a comparison voltage.

Abstract: There are provided a first casing 100A that has a photosensor section 113 for capturing an image, a second casing 100B that has a lens section 122 for projecting the image of a subject onto the photosensor section 113 of the first casing 100A and a connection section 100C that foldably connects the first casing 100A with the second casing 100B. The photosensor section 113 and the lens section 122 are arranged so that the photosensor section 113 and the lens section 122 are superposed on each other in a state in which the first casing 100A and the second casing 100B are folded together. With this arrangement, the folding type camera device and the folding type portable telephone equipped with this device can be reduced in thickness.

Abstract: An object of the present invention is to provide a mass-storage nonvolatile memory device capable of performing high speed operation. The nonvolatile memory device comprises a memory array comprising a plurality of memory cells arranged in a matrix, each of the memory cells comprising a variable resistor element formed of a manganese-containing oxide having a perovskite structure in which an electric resistance is varied by application of a voltage pulse and a variation amount of the electric resistance is variable depending on the magnitude of the voltage amplitude; and a program pulse generation circuit that, in order to program 3-level or larger multi-level data corresponding to one erase state and two or more program states into the variable resistor element, is capable of performing generation of program pulses having two or more different voltage amplitudes corresponding to the program states, the generation being separately performed corresponding to program data.

Abstract: An electronic seal includes an input section for inputting a random number encrypted based on a prescribed key; a secret key memory section for storing a secret key related to the prescribed key; a decoding section for decoding the input random number based on the secret key; an encryption section for encrypting the decoded random number based on the secret key; and an output section for outputting the random number encrypted based on the secret key.

Abstract: A semiconductor testing apparatus and a semiconductor testing method are provided which permit an apparatus having an inexpensive configuration to perform, with precision, the acceptance-or-rejection determination and measurement test of a semiconductor integrated circuit having a large number of output terminals each for outputting a multi-gradation level output voltage. The semiconductor testing apparatus comprises output voltage testing means and comparison voltage generation data inputting means. The output voltage testing means comprises test voltage inputting means, comparison voltage generating means, a high level comparator, a low level comparator, and comparison result outputting means. The high level comparator and the low level comparator constitute comparing means for comparing a voltage to be tested, with a comparison voltage.

Abstract: A pay television IC card includes a storage unit prestoring fingerprint information that allows identification of a registrant, a fingerprint information input unit accepting input of physical description data of a user, a comparison determination unit comparing fingerprint information accepted by the fingerprint information input unit with fingerprint information stored in the storage unit to determine whether the user is the registrant, and a descramble key generation unit providing a descramble key based on the determination result by the comparison determination unit. A descramble key is output by determining whether the user and the registrant are the same person based on fingerprint information, and determination of the sameness between the user and the registrant is established.

Abstract: When information is received specifying a desired product and a desired light source type, e.g. a type of a light source used in an environment in which the product, if purchased, would actually be used, a server device provides a color reproducing correction process for original image data obtained by shooting the desired product. Specifically, component data corresponding to a color of the light source at shooting and that corresponding to a color of the light source of the desired type are used to correct original image data to attain image data obtained when the product is shot under the desired light source type. The data obtained by the correction is transmitted to a consumer terminal and displayed on a screen. The consumer confirms the displayed image, and if satisfied with e.g. how the product would present color, the process moves on to an on-line transaction process for product purchasing.

Abstract: An imaging device includes a convex mirror for reflecting first incident light representing an object, the convex mirror having a shape of solid of revolution; an imaging mechanism for taking a reflected image represented by light reflected in the convex mirror; and an optical member for guiding the first incident light toward the convex mirror and guiding the reflected light toward the imaging mechanism, the optical member having an attenuation section for attenuating second incident light which is incident on an outer circumferential surface of the optical member in an opposite direction to the first incident light, passes through the optical member, is reflected by an inner circumferential surface of the optical member so as to be directed toward the convex rotational mirror, and is superimposed on the first incident light.

Abstract: A server apparatus includes a receiving circuit receiving order-acceptance information from a user, a user management database storing the order-acceptance information and expectation information of production and distribution, a production management database storing production state information and production instruction information, a distribution management database storing distribution state information and distribution instruction information, a standard process step database storing production standard process step information and distribution standard process step information, and a schedule control unit controlling the expectation information, the distribution instruction information and the production instruction information based on the order-acceptance information, the distribution state information, the production state information, the production standard process step information and the distribution standard process step information.

Abstract: A transfer terminal transferring information through a storage medium is separately provided for a game terminal executing a game. The transfer terminal communicates with a server, for example, through a data communication path. When an acquisition request for additional data related to a game program is transmitted from the transfer terminal to the server, the server transmits the additional data together with advertisement data related to the game program. The transfer terminal receives the contents transmitted from the server and writes to the storage medium. Thereafter, the storage medium is mounted on the game terminal and accessed, so that the additional data and the advertisement data are supplied to the game terminal. When the user executes the game using the additional data by operating the game terminal, advertisement image based on the supplied advertisement data is displayed for the user.

Abstract: The server device includes a first storage unit that stores an application divided into sub-applications, a second storage unit that stores information for each sub-application; a third storage unit that stores user information, a fourth storage unit that stores prepayment information, and a control unit that controls the entire server device. Some of the sub-applications can be executed alone. The control unit receives a send request from a user, and sends the sub-application through a data communication path. The user terminal which received the sub-application can start execution thereof immediately. Thus, an application communication system allowing utilization of a desired application in a short period of time after the start of communication is provided.

Abstract: To measure the threshold characteristics of an integrated circuit processing a Schmitt circuit at the input side, a clock signal generated from a signal generator is fed to the integrated circuit, and a change of a power source current supplied from a power source circuit to the integrated circuit is detected by a change detector. A control circuit sets the amplitude of a clock signal generated by a driver circuit through digital-to-analog converting circuits. Initially, the voltages of the signal at the high level side and low level side are both set at 0.00 V, and when the voltage of the signal at the high level side, increasing by 0.01 V at a time, reaches the threshold of the Schmitt circuit, a large power source current flows, and a voltage change between the ends of a resistor is detected. As a part of a function test of a test apparatus, the threshold characteristic of the integrated circuit is measured.

Abstract: A current detecting resistance is inserted somewhere in a path for feeding a power source current to a supply voltage terminal VDD of a DUT from a power source of a testing apparatus, and from the potential difference at both ends, a pulse form change due to the state transition of a CMOS circuit in the DUT contained in the power source current is detected. The number of pulse form changes is counted by a counter. In the DUT, a test pattern is applied from a driver, an expected value preset according to the test pattern and the count of the counter are compared, and it is judged whether or not the DUT is in good quality. The current due to a pulse form transition to be detected by the current detecting resistance is larger than the current flowing when the CMOS circuit in the DUT is in a static state, and therefore, the resistance value of the current detecting resistance may be set smaller, so that the time required for testing may be shortened.

Abstract: An integrated circuit device is provided with: a substrate; and a plurality of integrated circuit elements formed on the substrate and insulated to each other. Each of the integrated circuit elements includes an internal circuit for performing a predetermined operation when a predetermined electric power is supplied thereto, and an electric source terminal connected to the internal circuit for supplying the predetermined electric power. The integrated circuit device is also provided with a connecting device for electrically connecting one electric source terminal of one integrated circuit element to another electric source terminal of another integrated circuit element, wherein the predetermined electric power is supplied to both of one and another electric source terminals simultaneously through the connecting device so as to simultaneously perform a burn-in process of one and another integrated circuit elements.