Patents by Inventor Masayuki Kohno

Masayuki Kohno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10504698
    Abstract: A plasma processing apparatus is provided that is configured to supply a gas into a chamber, generate a plasma from the gas using a power of an electromagnetic wave, and perform a predetermined plasma process on a substrate that is held by a mounting table. The plasma processing apparatus includes a dielectric window through which the electromagnetic wave that is output from an electromagnetic wave generator is propagated and transmitted into the chamber, a support member that supports the dielectric window, a partition member that separates a space where the support member is arranged from a plasma generation space and includes a protrusion abutting against the dielectric window, and a conductive member that is arranged between the partition member and the dielectric window and is protected from being exposed to the plasma generation space by the protrusion.
    Type: Grant
    Filed: September 29, 2015
    Date of Patent: December 10, 2019
    Assignee: Tokyo Electron Limited
    Inventors: Masayuki Kohno, Ryou Son, Naoki Matsumoto, Jun Yoshikawa, Michitaka Aita, Ippei Shimizu, Yusuke Yoshida, Koji Koyama, Masami Sudayama, Yukiyoshi Aramaki
  • Patent number: 10312057
    Abstract: A plasma processing apparatus includes a processing chamber, a table disposed in the processing chamber, a dielectric window provided at the processing chamber, and a surrounding body made of a dielectric material surrounding a processing space between the table and the dielectric window. The dielectric window and the surrounding body are separated from each other in a vertical direction with a predetermined gap therebetween.
    Type: Grant
    Filed: October 14, 2015
    Date of Patent: June 4, 2019
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Masayuki Kohno, Yusuke Yoshida, Naoki Matsumoto, Ippei Shimizu, Naoki Mihara, Jun Yoshikawa, Michitaka Aita, Yoshikazu Azumaya, Junsuke Hoshiya
  • Patent number: 9412607
    Abstract: An isotropic etching process can be performed with high uniformity. A plasma etching method of etching an etching target layer containing silicon includes preparing a processing target object having the etching target layer in a processing chamber; removing an oxide film on a surface of the etching target layer by generating plasma of a first processing gas that contains a fluorocarbon gas or a fluorohydrocarbon gas but does not contain oxygen; removing a carbon-based reaction product generated when the removing of the oxide film by generating plasma of a second processing gas that does not contain oxygen; and etching the etching target layer without applying a high frequency bias power to a lower electrode serving as a mounting table configured to mount the processing target object thereon by generating plasma of a third processing gas containing a fluorocarbon gas or a fluorohydrocarbon gas with a microwave.
    Type: Grant
    Filed: May 7, 2014
    Date of Patent: August 9, 2016
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Tomiko Kamada, Akinori Kitamura, Hiroto Ohtake, Yutaka Osada, Yuji Otsuka, Masayuki Kohno, Yusuke Takino, Eiji Suzuki
  • Patent number: 9412565
    Abstract: A temperature measuring method for measuring a temperature of a member corresponding to a measuring object arranged within a chamber of a plasma processing apparatus is provided. The temperature measuring method involves obtaining a function (f) for correcting a correction target temperature (Tmeas) according to a measurement window temperature (Tw), the function (f) being computed based on the correction target temperature (Tmeas) corresponding to a temperature of the measuring object measured via a measurement window arranged at the chamber, a reference temperature (Tobj) corresponding to a temperature of the measuring object measured without using the measurement window, and the measurement window temperature (Tw) corresponding to a temperature of the measurement window.
    Type: Grant
    Filed: January 30, 2015
    Date of Patent: August 9, 2016
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Yusuke Yoshida, Ryou Son, Takahiro Senda, Masayuki Kohno, Naoki Matsumoto
  • Publication number: 20160126114
    Abstract: A plasma processing apparatus includes a processing chamber, a table disposed in the processing chamber, a dielectric window provided at the processing chamber, and a surrounding body made of a dielectric material surrounding a processing space between the table and the dielectric window. The dielectric window and the surrounding body are separated from each other in a vertical direction with a predetermined gap therebetween.
    Type: Application
    Filed: October 14, 2015
    Publication date: May 5, 2016
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Masayuki KOHNO, Yusuke YOSHIDA, Naoki MATSUMOTO, Ippei SHIMIZU, Naoki MIHARA, Jun YOSHIKAWA, Michitaka AITA, Yoshikazu AZUMAYA, Junsuke HOSHIYA
  • Publication number: 20160118224
    Abstract: A plasma processing apparatus is provided that is configured to supply a gas into a chamber, generate a plasma from the gas using a power of an electromagnetic wave, and perform a predetermined plasma process on a substrate that is held by a mounting table. The plasma processing apparatus includes a dielectric window through which the electromagnetic wave that is output from an electromagnetic wave generator is propagated and transmitted into the chamber, a support member that supports the dielectric window, a partition member that separates a space where the support member is arranged from a plasma generation space and includes a protrusion abutting against the dielectric window, and a conductive member that is arranged between the partition member and the dielectric window and is protected from being exposed to the plasma generation space by the protrusion.
    Type: Application
    Filed: September 29, 2015
    Publication date: April 28, 2016
    Inventors: Masayuki KOHNO, Ryou SON, Naoki MATSUMOTO, Jun YOSHIKAWA, Michitaka AITA, Ippei SHIMIZU, Yusuke YOSHIDA, Koji KOYAMA, Masami SUDAYAMA, Yukiyoshi ARAMAKI
  • Publication number: 20150221482
    Abstract: A temperature measuring method for measuring a temperature of a member corresponding to a measuring object arranged within a chamber of a plasma processing apparatus is provided. The temperature measuring method involves obtaining a function (f) for correcting a correction target temperature (Tmeas) according to a measurement window temperature (Tw), the function (f) being computed based on the correction target temperature (Tmeas) corresponding to a temperature of the measuring object measured via a measurement window arranged at the chamber, a reference temperature (Tobj) corresponding to a temperature of the measuring object measured without using the measurement window, and the measurement window temperature (Tw) corresponding to a temperature of the measurement window.
    Type: Application
    Filed: January 30, 2015
    Publication date: August 6, 2015
    Inventors: Yusuke YOSHIDA, Ryou SON, Takahiro SENDA, Masayuki KOHNO, Naoki MATSUMOTO
  • Patent number: 8940862
    Abstract: It is an object of the present invention to provide a substance usable as an anticancer agent or DDS, which has intracellular stability, which is capable of evading side effects from functional disorder with respect to normal cells, or which has instantaneous effect. The inventors developed a novel chimeric peptide targeting cancer cells which overexpress EGFR or the like using a binding peptide such as a peptide sequence binding to EGFR, and a lytic peptide sequence, thereby solving such an object. Particularly, by using a chimeric peptide including an EGF receptor-binding peptide or the like and a cytotoxic peptide, this object was solved.
    Type: Grant
    Filed: April 5, 2013
    Date of Patent: January 27, 2015
    Assignees: Stella Pharma Corporation
    Inventors: Koji Kawakami, Masayuki Kohno, Tomohisa Horibe, Oumi Nakajima, Mari Haramoto, Liying Yang
  • Patent number: 8940863
    Abstract: It is an object of the present invention to provide a substance usable as an anticancer agent or DDS, which has intracellular stability, which is capable of evading side effects from functional disorder with respect to normal cells, or which has instantaneous effect. The inventors developed a novel chimeric peptide targeting cancer cells which overexpress EGFR or the like using a binding peptide such as a peptide sequence binding to EGFR, and a lytic peptide sequence, thereby solving such an object. Particularly, by using a chimeric peptide including an EGF receptor-binding peptide or the like and a cytotoxic peptide, this object was solved.
    Type: Grant
    Filed: April 5, 2013
    Date of Patent: January 27, 2015
    Assignees: Stella Pharma Corporation
    Inventors: Koji Kawakami, Masayuki Kohno, Tomohisa Horibe, Oumi Nakajima, Mari Haramoto, Liying Yang
  • Publication number: 20140332372
    Abstract: An isotropic etching process can be performed with high uniformity. A plasma etching method of etching an etching target layer containing silicon includes preparing a processing target object having the etching target layer in a processing chamber; removing an oxide film on a surface of the etching target layer by generating plasma of a first processing gas that contains a fluorocarbon gas or a fluorohydrocarbon gas but does not contain oxygen; removing a carbon-based reaction product generated when the removing of the oxide film by generating plasma of a second processing gas that does not contain oxygen; and etching the etching target layer without applying a high frequency bias power to a lower electrode serving as a mounting table configured to mount the processing target object thereon by generating plasma of a third processing gas containing a fluorocarbon gas or a fluorohydrocarbon gas with a microwave.
    Type: Application
    Filed: May 7, 2014
    Publication date: November 13, 2014
    Applicant: Tokyo Electron Limited
    Inventors: Tomiko Kamada, Akinori Kitamura, Hiroto Ohtake, Yutaka Osada, Yuji Otsuka, Masayuki Kohno, Yusuke Takino, Eiji Suzuki
  • Patent number: 8569186
    Abstract: A plasma processing apparatus generates plasma by introducing microwaves into a processing chamber by using a planar antenna having a plurality of slots. By using the plasma processing apparatus, a nitrogen containing gas and a silicon containing gas introduced into the processing chamber are brought into the plasma state, and at the time of depositing by using the plasma a silicon nitride film on the surface of the a substrate to be processed, stress to the silicon nitride film to be formed is controlled by the combination of the type and the processing pressure of the nitrogen containing gas.
    Type: Grant
    Filed: November 13, 2012
    Date of Patent: October 29, 2013
    Assignee: Tokyo Electron Limited
    Inventors: Masayuki Kohno, Tatsuo Nishita, Toshio Nakanishi
  • Publication number: 20130274200
    Abstract: It is an object of the present invention to provide a substance usable as an anticancer agent or DDS, which has intracellular stability, which is capable of evading side effects from functional disorder with respect to normal cells, or which has instantaneous effect. The inventors developed a novel chimeric peptide targeting cancer cells which overexpress EGFR or the like using a binding peptide such as a peptide sequence binding to EGFR, and a lytic peptide sequence, thereby solving such an object. Particularly, by using a chimeric peptide including an EGF receptor-binding peptide or the like and a cytotoxic peptide, this object was solved.
    Type: Application
    Filed: April 5, 2013
    Publication date: October 17, 2013
    Inventors: Koji Kawakami, Masayuki Kohno, Tomohisa Horibe, Oumi Nakajima, Mari Haramoto, Liying Yang
  • Publication number: 20130274201
    Abstract: It is an object of the present invention to provide a substance usable as an anticancer agent or DDS, which has intracellular stability, which is capable of evading side effects from functional disorder with respect to normal cells, or which has instantaneous effect. The inventors developed a novel chimeric peptide targeting cancer cells which overexpress EGFR or the like using a binding peptide such as a peptide sequence binding to EGFR, and a lytic peptide sequence, thereby solving such an object. Particularly, by using a chimeric peptide including an EGF receptor-binding peptide or the like and a cytotoxic peptide, this object was solved.
    Type: Application
    Filed: April 5, 2013
    Publication date: October 17, 2013
    Inventors: Koji Kawakami, Masayuki Kohno, Tomohisa Horibe, Oumi Nakajima, Mari Haramoto, Liying Yang
  • Patent number: 8546320
    Abstract: Disclosed is a substance which is not accumulated stably in cells, does not cause the dysfunction of normal cells, and so on, and therefore can be used as an anti-cancer agent or in a DDS without having any adverse side effects. It is found that Hsp90 alone cannot exhibit its function as a chaperone in assisting the refolding of a protein such as survivin, but can exhibit this function when Hop (which is one of the partner proteins of Hsp90) binds to Hsp90. Thus, specifically disclosed herein is a chimeric peptide comprising of an Hsp90 TPR domain binding peptide and a cell-penetrating peptide.
    Type: Grant
    Filed: November 13, 2009
    Date of Patent: October 1, 2013
    Assignee: Kyoto University
    Inventors: Koji Kawakami, Masayuki Kohno, Tomohisa Horibe
  • Patent number: 8436137
    Abstract: It is an object of the present invention to provide a substance usable as an anticancer agent or DDS, which has intracellular stability, which is capable of evading side effects from functional disorder with respect to normal cells, or which has instantaneous effect. The inventors developed a novel chimeric peptide targeting cancer cells which overexpress EGFR or the like using a binding peptide such as a peptide sequence binding to EGFR, and a lytic peptide sequence, thereby solving such an object. Particularly, by using a chimeric peptide including an EGF receptor-binding peptide or the like and a cytotoxic peptide, this object was solved.
    Type: Grant
    Filed: December 3, 2009
    Date of Patent: May 7, 2013
    Inventors: Koji Kawakami, Masayuki Kohno, Tomohisa Horibe, Oumi Nakajima, Mari Haramoto, Liying Yang
  • Patent number: 8366953
    Abstract: A plasma cleaning method is performed in a plasma CVD apparatus for depositing a silicon nitride film on a surface of a target substrate, and includes a stage (S1) of supplying a cleaning gas containing NF3 gas into a process container, thereby removing extraneous deposits formed on portions inside the process container; a stage (S2) of supplying a gas containing hydrogen gas into the process container and generating plasma thereof, thereby removing residual fluorine inside the process container; and a stage (S3) of supplying a gas containing a rare gas into the process container and generating plasma thereof, thereby removing residual hydrogen inside the process container.
    Type: Grant
    Filed: September 18, 2007
    Date of Patent: February 5, 2013
    Assignee: Tokyo Electron Limited
    Inventors: Masayuki Kohno, Tatsuo Nishita, Toshio Nakanishi
  • Publication number: 20120315745
    Abstract: A high-quality crystalline silicon film can be formed at a high film forming rate by performing a plasma CVD process. In a crystalline silicon film forming method for forming a crystalline silicon film on a surface of a processing target object by using a plasma CVD apparatus for introducing microwave into a processing chamber through a planar antenna having a multiple number of holes and generating plasma, the crystalline silicon film forming method includes generating plasma by exciting a film forming gas containing a silicon compound represented as SinH2n+2 (n is equal to or larger than 2) by the microwave; and depositing a crystalline silicon film on the surface of the processing target substrate by performing the plasma CVD process with the plasma.
    Type: Application
    Filed: September 28, 2010
    Publication date: December 13, 2012
    Applicant: TOKYO ELECTRON LIMITED
    Inventors: Daisuke Katayama, Minoru Honda, Masayuki Kohno, Toshio Nakanishi
  • Patent number: 8329596
    Abstract: A plasma processing apparatus generates plasma by introducing microwaves into a processing chamber by using a planar antenna having a plurality of slots. By using the plasma processing apparatus, a nitrogen containing gas and a silicon containing gas introduced into the processing chamber are brought into the plasma state, and at the time of depositing by using the plasma a silicon nitride film on the surface of the a substrate to be processed, stress to the silicon nitride film to be formed is controlled by the combination of the type and the processing pressure of the nitrogen containing gas.
    Type: Grant
    Filed: March 19, 2012
    Date of Patent: December 11, 2012
    Assignee: Tokyo Electron Limited
    Inventors: Masayuki Kohno, Tatsuo Nishita, Toshio Nakanishi
  • Patent number: 8318614
    Abstract: A Plasma processing apparatus (100) introduces microwaves into a chamber (1) by a plane antenna (31) which has a plurality of holes. A material gas, which contains a nitrogen-containing compound and a silicon-containing compound, is introduced into the chamber (1) by using the plasma processing apparatus, and plasma is generated by the microwaves. Then, a silicon nitride film is deposited by the plasma on a surface of an object to be processed. The trap density of the silicon nitride film is controlled by adjusting the conditions of the plasma CVD process.
    Type: Grant
    Filed: March 25, 2008
    Date of Patent: November 27, 2012
    Assignee: Tokyo Electron Limited
    Inventors: Masayuki Kohno, Tatsuo Nishita, Toshio Nakanishi, Yoshihiro Hirota
  • Patent number: 8258571
    Abstract: The invention provides a MOS semiconductor memory device that achieves excellent data retention characteristics while also achieving high-speed data write performance, low-power operation performance, and high reliability. A MOS semiconductor memory device 601 includes a first insulating film 111 and fifth insulating film 115 having large bandgaps 111a and 115a, a third insulating film 113 having the smallest bandgap 113a, and a second insulating film 112 and fourth insulating film 114 interposed between the third insulating film 113 and the first and fifth insulating films 111 and 115, respectively, and having intermediate bandgaps 112a and 114a.
    Type: Grant
    Filed: June 20, 2008
    Date of Patent: September 4, 2012
    Assignees: Tokyo Electron Limited, Tohoku University
    Inventors: Tetsuo Endoh, Masayuki Kohno, Tatsuo Nishita, Minoru Honda, Toshio Nakanishi, Yoshihiro Hirota