Abstract: An amorphous alloy soft magnetic powder contains a particle having a composition with a compositional formula (Fe1-xCrx) a (Si1-yBy)100-a-bCb expressed by an atomic ratio, in which 0<x?0.06, 0.3?y?0.7, 70.0?a?81.0, and 0<b?3.0, and when XAFS measurement is performed with an analysis depth set to a bulk, an obtained Fe—K absorption edge XANES spectrum has a first absorption edge structure having a peak A present in a range of 7113±1 eV and a first continuous band structure positioned at a higher energy side than the first absorption edge structure, and an intensity of the peak A at 7113 eV is 0.60 or more and 0.90 or less when an intensity of the first continuous band structure is 1.

Abstract: An amorphous alloy soft magnetic powder contains a particle having a composition with a compositional formula Fea(Si1-xBx)bCc expressed by an atomic ratio, in which 76.0?a?81.0, 16.0?b?22.0, 0<c?3.0, and 0.5?x?0.9. When XAFS measurement is performed with an analysis depth set to a surface, an obtained Si—K absorption edge XANES spectrum has a peak A having an energy in a range of 1845±1 eV and a peak B having an energy in a range of 1848±1 eV, and an intensity ratio A/B is 0.25 or less where A is an intensity of the peak A and B is an intensity of the peak B.

Abstract: An amorphous alloy soft magnetic powder has a composition represented by (FexCo1-x)100-(a+b)(SiyB1-y)aMb, where M is at least one selected from the group consisting of C, S, P, Sn, Mo, Cu, and Nb, and x, y, a, and b satisfy 0.73?x?0.85, 0.02?y?0.10, 13.0?a?19.0, and 0?b?2.0. A Si—K absorption edge XANES spectrum obtained when performing an XAFS measurement on particles has a peak A present in a range of 1842±1 eV, a peak B present in a range of 1845±1 eV, and a peak C present in a range of 1848±1 eV. An intensity ratio A/C is 0.40 or less, and an intensity ratio B/C is 0.60 or less.

Abstract: A piezoelectric element including an electrode and a piezoelectric layer provided on the electrode and having a perovskite structure including lead, zirconium, and titanium is provided. A radial distribution function obtained from an extended X-ray absorption fine structure of an L3 absorption edge of lead in an X-ray absorption spectrum of the piezoelectric layer at an interface with the electrode satisfies a formula (1) below A/B?1??(1) (in the formula (1), A represents an intensity of a peak attributable to oxygen atoms closest to lead atoms; and B represents an intensity of a peak attributable to oxygen atoms second closest to the lead atoms).

Abstract: A piezoelectric element includes: a first electrode provided on a base; a piezoelectric layer provided on the first electrode and containing a complex oxide which has a perovskite structure and contains potassium, sodium, and niobium; and a second electrode provided on the piezoelectric layer, in which the first electrode contains platinum, the first electrode is (111) preferentially oriented, and a platinum atom contained in the first electrode is bonded to an oxygen atom at an interface between the first electrode and the piezoelectric layer.

Abstract: A piezoelectric element includes: a first electrode provided on a base; a piezoelectric layer provided on the first electrode and containing a complex oxide which has a perovskite structure and contains potassium, sodium, and niobium; and a second electrode provided on the piezoelectric layer, in which the first electrode contains platinum, the first electrode is (111) preferentially oriented, and a platinum atom contained in the first electrode is bonded to an oxygen atom at an interface between the first electrode and the piezoelectric layer.

Abstract: A piezoelectric element includes a substrate; a first electrode formed above the substrate; a piezoelectric layer which contains a composite oxide having a perovskite crystal structure and which is formed above the first electrode; and a second electrode formed above the piezoelectric layer, and the amount of carbon contained in the substrate is 0.26 to less than 14.00 percent by atom.

Abstract: Provided is a liquid ejecting head that ejects a liquid in a pressure chamber by a piezoelectric device, the piezoelectric device including a vibration plate, a piezoelectric layer containing lead, a first electrode provided between the vibration plate and the piezoelectric layer, and a second electrode provided on a side opposite to a side of the first electrode as viewed from the piezoelectric layer. The piezoelectric layer is preferentially oriented in a (100) plane, a lattice constant c defined by a crystal plane of the piezoelectric layer parallel to a film surface of the piezoelectric layer and a lattice constant a defined by a crystal plane perpendicular to the film surface satisfy 0.9945?c/a?1.012, and the thickness of the piezoelectric device is twice or more the thickness t (t<5 ?m) of the piezoelectric layer.

Abstract: A piezoelectric element includes a substrate; a first electrode formed above the substrate; a piezoelectric layer which contains a composite oxide having a perovskite crystal structure and which is formed above the first electrode; and a second electrode formed above the piezoelectric layer, and the amount of carbon contained in the substrate is 0.26 to less than 14.00 percent by atom.

Abstract: A piezoelectric element including an electrode and a piezoelectric layer provided on the electrode and having a perovskite structure including lead, zirconium, and titanium is provided. A radial distribution function obtained from an extended X-ray absorption fine structure of an L3 absorption edge of lead in an X-ray absorption spectrum of the piezoelectric layer at an interface with the electrode satisfies a formula (1) below A/B?1??(1) (in the formula (1), A represents an intensity of a peak attributable to oxygen atoms closest to lead atoms; and B represents an intensity of a peak attributable to oxygen atoms second closest to the lead atoms).

Abstract: There is provided a piezoelectric element which includes a first electrode which is formed on a substrate, a piezoelectric layer which is formed on the first electrode, and is formed from a compound oxide having an ABO3 type perovskite structure in which potassium (K), sodium (Na), niobium (Nb), and manganese (Mn) are provided, and a second electrode which is formed on the piezoelectric layer. The manganese includes bivalent manganese (Mn2+), trivalent manganese (Mn3+), and tetravalent manganese (Mn4+). A molar ratio (Mn2+/Mn3++Mn4+) of the bivalent manganese to a sum of the trivalent manganese and the tetravalent manganese is equal to or greater than 0.31.

Abstract: Provided is a liquid ejecting head that ejects a liquid in a pressure chamber by a piezoelectric device, the piezoelectric device including a vibration plate, a piezoelectric layer containing lead, a first electrode provided between the vibration plate and the piezoelectric layer, and a second electrode provided on a side opposite to a side of the first electrode as viewed from the piezoelectric layer. The piezoelectric layer is preferentially oriented in a (100) plane, a lattice constant c defined by a crystal plane of the piezoelectric layer parallel to a film surface of the piezoelectric layer and a lattice constant a defined by a crystal plane perpendicular to the film surface satisfy 0.9945?c/a?1.012, and the thickness of the piezoelectric device is twice or more the thickness t (t<5 ?m) of the piezoelectric layer.

Abstract: A method for evaluating a piezoelectric film containing a perovskite oxide containing a lead atom, a zirconium atom, and a titanium atom, and the method includes a process of irradiating the piezoelectric film with X-rays to acquire an extended X-ray absorption fine structure (EXAFS) spectrum at the L3 absorption edge of the lead atom, a process of Fourier-transforming the extended X-ray absorption fine structure (EXAFS) spectrum to acquire a radial distribution function, and a process of acquiring the intensity of a first peak having a distance from the lead atom of 1.4±0.2 ?, the intensity of a second peak having a distance from the lead atom of 2.0±0.2 ?, and the intensity of a third peak having a distance from the lead atom of 2.6±0.

Abstract: A method for evaluating a piezoelectric film containing a perovskite oxide containing a lead atom, a zirconium atom, and a titanium atom, and the method includes a process of irradiating the piezoelectric film with X-rays to acquire an extended X-ray absorption fine structure (EXAFS) spectrum at the L3 absorption edge of the lead atom, a process of Fourier-transforming the extended X-ray absorption fine structure (EXAFS) spectrum to acquire a radial distribution function, and a process of acquiring the intensity of a first peak having a distance from the lead atom of 1.4±0.2 ?, the intensity of a second peak having a distance from the lead atom of 2.0±0.2 ?, and the intensity of a third peak having a distance from the lead atom of 2.6±0.

Abstract: There is provided a piezoelectric element which includes a first electrode which is formed on a substrate, a piezoelectric layer which is formed on the first electrode, and is formed from a compound oxide having an ABO3 type perovskite structure in which potassium (K), sodium (Na), niobium (Nb), and manganese (Mn) are provided, and a second electrode which is formed on the piezoelectric layer. The manganese includes bivalent manganese (Mn2+), trivalent manganese (Mn3+), and tetravalent manganese (Mn4+). A molar ratio (Mn2+/Mn3++Mn4+) of the bivalent manganese to a sum of the trivalent manganese and the tetravalent manganese is equal to or greater than 0.31.

Abstract: Provided is a piezoelectric element including a first electrode, a piezoelectric layer, and a second electrode, wherein the piezoelectric layer is formed of a complex oxide having a perovskite structure containing bismuth, barium, iron and titanium, binding energy of C—C and C—H states of a peak due to C 1s in an X-ray photoelectron spectroscopy measurement is standardized as 284.8 eV, when a peak obtained in a range of a binding energy of 775 eV or more and 785 eV or less is separated using a Gauss function, the binding energy has the peak in 779.0±0.8 eV, and one or more peak having intensity lower than that of the peak is included at the high binding energy side.