Patents by Inventor Masayuki Ooe

Masayuki Ooe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9134608
    Abstract: A positive photosensitive resin composition including: (a) a resin capable of being dissolved in an aqueous alkaline solution; (b) a compound having two or more oxetanyl groups; (c) a diazonaphthoquinone compound; and (d) a solvent.
    Type: Grant
    Filed: January 18, 2011
    Date of Patent: September 15, 2015
    Assignee: HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD.
    Inventors: Masashi Kotani, Masayuki Ooe, Taku Konno, Tomonori Minegishi, Keishi Ono
  • Patent number: 8852726
    Abstract: A photosensitive polymer composition includes (a) a polyamide having a repeating unit represented by the following general formula (I): wherein U represents a tetravalent organic group, V represents a bivalent organic group and p is an integer representing a number of the repeating unit; (b) a compound which generates an acid upon receiving light; and (c) a compound represented by the following general formula (II): wherein m and n are each independently integer of 1 or 2, Rs are each independently hydrogen, alkyl group or acyl group, and R1 and R2 each independently represents fluoroalkyl group having 1 to 3 carbon atoms.
    Type: Grant
    Filed: June 21, 2012
    Date of Patent: October 7, 2014
    Assignee: Hitachi Chemical Dupont Microsystems Ltd.
    Inventors: Masayuki Ooe, Hiroshi Komatsu, Yoshiko Tsumaru, Dai Kawasaki, Kouji Katou, Takumi Ueno
  • Publication number: 20120288798
    Abstract: A positive photosensitive resin composition including: (a) a resin capable of being dissolved in an aqueous alkaline solution; (b) a compound having two or more oxetanyl groups; (c) a diazonaphthoquinone compound; and (d) a solvent.
    Type: Application
    Filed: January 18, 2011
    Publication date: November 15, 2012
    Applicant: HITACHI CHEMICAL DUPONT MICROSYSTEMS, LTD.
    Inventors: Masashi Kotani, Masayuki Ooe, Taku Konno, Tomonori Minegishi, Keishi Ono
  • Patent number: 8304149
    Abstract: A photosensitive polymer composition, having (a) a polymer selected from polyimide precursors and polyimides having an acid group protected by a protecting group and having no amino group (—NH2) at the end; and (b) a compound that generates an acid when exposed to light and capable of deprotecting the protecting group from the acid group, is employed to form layers of a semiconductor device.
    Type: Grant
    Filed: December 7, 2010
    Date of Patent: November 6, 2012
    Assignees: Hitachi Chemical Dupont Microsystems Ltd., Hitachi Chemical Dupont Microsystems L.L.C.
    Inventors: Masataka Nunomura, Masayuki Ooe, Hajime Nakano, Yoshiko Tsumaru, Takumi Ueno
  • Publication number: 20120263920
    Abstract: A photosensitive polymer composition includes (a) a polyamide having a repeating unit represented by the following general formula (I): wherein U represents a tetravalent organic group, V represents a bivalent organic group and p is an integer representing a number of the repeating unit; (b) a compound which generates an acid upon receiving light; and (c) a compound represented by the following general formula (II): wherein m and n are each independently integer of 1 or 2, Rs are each independently hydrogen, alkyl group or acyl group, and R1 and R2 each independently represents fluoroalkyl group having 1 to 3 carbon atoms.
    Type: Application
    Filed: June 21, 2012
    Publication date: October 18, 2012
    Inventors: Masayuki Ooe, Hiroshi Komatsu, Yoshiko Tsumaru, Dai Kawasaki, Kouji Katou, Takumi Ueno
  • Patent number: 8231959
    Abstract: A photosensitive polymer composition includes (a) a polyamide having a repeating unit represented by the following general formula (I): wherein U represents a tetravalent organic group, V represents a bivalent organic group and p is an integer representing a number of the repeating unit; (b) a compound which generates an acid upon receiving light; and (c) a compound represented by the following general formula (II): wherein m and n are each independently integer of 1 or 2, Rs are each independently hydrogen, alkyl group or acyl group, and R1 and R2 each independently represents fluoroalkyl group having 1 to 3 carbon atoms.
    Type: Grant
    Filed: December 16, 2004
    Date of Patent: July 31, 2012
    Assignee: Hitachi Chemical Dupont Microsystems Ltd.
    Inventors: Masayuki Ooe, Hiroshi Komatsu, Yoshiko Tsumaru, Dai Kawasaki, Kouji Katou, Takumi Ueno
  • Publication number: 20110076458
    Abstract: A photosensitive polymer composition, having (a) a polymer selected from polyimide precursors and polyimides having an acid group protected by a protecting group and having no amino group (—NH2) at the end; and (b) a compound that generates an acid when exposed to light and capable of deprotecting the protecting group from the acid group, is employed to form layers of a semiconductor device.
    Type: Application
    Filed: December 7, 2010
    Publication date: March 31, 2011
    Inventors: Masataka NUNOMURA, Masayuki Ooe, Hajime Nakano, Yoshiko Tsumaru, Takumi Ueno
  • Patent number: 7851128
    Abstract: A photosensitive polymer composition, having (a) a polymer selected from polyimide precursors and polyimides having an acid group protected by a protecting group and having no amino group (—NH2) at the end; and (b) a compound that generates an acid when exposed to light and capable of deprotecting the protecting group from the acid group, is employed to form layers of a semiconductor device.
    Type: Grant
    Filed: November 29, 2006
    Date of Patent: December 14, 2010
    Assignees: Hitachi Chemical Dupont Microsystems Ltd., Hitachi Chemical Dupont Microsystems L.L.C.
    Inventors: Masataka Nunomura, Masayuki Ooe, Hajime Nakano, Yoshiko Tsumaru, Takumi Ueno
  • Patent number: 7638254
    Abstract: Provided is a positive photosensitive resin composition which is advantageous not only in excellent sensitivity, resolution and adhesion, but also in excellent heat resistance even when the composition is cured by a low-temperature process at equal to or lower than 280° C., as well as low water absorption and capability to give a pattern with favorable configuration. The positive photosensitive resin composition contains: (a) alkaline aqueous solution-soluble polyamide having a polyoxazole precursor structure; (b) an o-quinonediazide compound; and (c) a latent acid generator which generates acid upon heating. The composition optionally further contains (d) a compound having a phenolic hydroxyl group or (e) a solvent.
    Type: Grant
    Filed: September 10, 2008
    Date of Patent: December 29, 2009
    Assignee: Hitachi Chemical Dupont Microsystems Ltd
    Inventors: Takashi Hattori, Yasuharu Murakami, Hiroshi Matsutani, Masayuki Ooe, Hajime Nakano
  • Publication number: 20090011364
    Abstract: Provided is a positive photosensitive resin composition which is advantageous not only in excellent sensitivity, resolution and adhesion, but also in excellent heat resistance even when the composition is cured by a low-temperature process at equal to or lower than 280° C., as well as low water absorption and capability to give a pattern with favorable configuration. The positive photosensitive resin composition contains: (a) alkaline aqueous solution-soluble polyamide having a polyoxazole precursor structure; (b) an o-quinonediazide compound; and (c) a latent acid generator which generates acid upon heating. The composition optionally further contains (d) a compound having a phenolic hydroxyl group or (e) a solvent.
    Type: Application
    Filed: September 10, 2008
    Publication date: January 8, 2009
    Inventors: Takashi HATTORI, Yasuharu Murakami, Hiroshi Matsutani, Masayuki Ooe, Hajime Nakano
  • Patent number: 7435525
    Abstract: Provided is a positive photosensitive resin composition which is advantageous not only in excellent sensitivity, resolution and adhesion, but also in excellent heat resistance even when the composition is cured by a low-temperature process at equal to or lower than 280° C., as well as low water absorption and capability to give a pattern with favorable configuration. The positive photosensitive resin composition contains: (a) alkaline aqueous solution-soluble polyamide having a polyoxazole precursor structure; (b) an o-quinonediazide compound; and (c) a latent acid generator which generates acid upon heating. The composition optionally further contains (d) a compound having a phenolic hydroxyl group or (e) a solvent.
    Type: Grant
    Filed: March 11, 2005
    Date of Patent: October 14, 2008
    Assignee: Hitachi Chemical Dupont Microsystems Ltd.
    Inventors: Takashi Hattori, Yasuharu Murakami, Hiroshi Matsutani, Masayuki Ooe, Hajime Nakano
  • Publication number: 20070122733
    Abstract: Provided is a positive photosensitive resin composition which is advantageous not only in excellent sensitivity, resolution and adhesion, but also in excellent heat resistance even when the composition is cured by a low-temperature process at equal to or lower than 280° C., as well as low water absorption and capability to give a pattern with favorable configuration. The positive photosensitive resin composition contains: (a) alkaline aqueous solution-soluble polyamide having a polyoxazole precursor structure; (b) an o-quinonediazide compound; and (c) a latent acid generator which generates acid upon heating. The composition optionally further contains (d) a compound having a phenolic hydroxyl group or (e) a solvent.
    Type: Application
    Filed: March 11, 2005
    Publication date: May 31, 2007
    Inventors: Takashi Hattori, Yasaharu Murakami, Hiroshi Matsutani, Masayuki Ooe, Hajime Nakano
  • Publication number: 20070072122
    Abstract: A photosensitive polymer composition, having (a) a polymer selected from polyimide precursors and polyimides having an acid group protected by a protecting group and having no amino group (—NH2) at the end; and (b) a compound that generates an acid when exposed to light and capable of deprotecting the protecting group from the acid group, is employed to form layers of a semiconductor device.
    Type: Application
    Filed: November 29, 2006
    Publication date: March 29, 2007
    Inventors: Masataka Nunomura, Masayuki Ooe, Hajime Nakano, Yoshiko Tsumaru, Takumi Ueno
  • Patent number: 7150947
    Abstract: A photosensitive polymer composition, having (a) a polymer selected from polyimide precursors and polyimides having an acid group protected by a protecting group and having no amino group (—NH2) at the end; and (b) a compound that generates an acid when exposed to light and capable of deprotecting the protecting group from the acid group, is employed to form layers of a semiconductor device.
    Type: Grant
    Filed: May 19, 2003
    Date of Patent: December 19, 2006
    Assignees: Hitachi Chemical Dupont Microsystems Ltd., Hitachi Chemical Dupont Microsystems LLC.
    Inventors: Masataka Nunomura, Masayuki Ooe, Hajime Nakano, Yoshiko Tsumaru, Takumi Ueno
  • Publication number: 20040029045
    Abstract: A photosensitive polymer composition, having (a) a polymer selected from polyimide precursors and polyimides having an acid group protected by a protecting group and having no amino group (—NH2) at the end; and (b) a compound that generates an acid when exposed to light and capable of deprotecting the protecting group from the acid group, is employed to form layers of a semiconductor device.
    Type: Application
    Filed: May 19, 2003
    Publication date: February 12, 2004
    Inventors: Masataka Nunomura, Masayuki Ooe, Hajime Nakano, Yoshiko Tsumaru, Takumi Ueno
  • Patent number: 4987261
    Abstract: The invention relates to diaminoindane derivatives represented by the following formula: ##STR1## wherein R.sub.1 and R.sub.2 are each selected from the group consisting of a hydrogen atom and a lower alkyl group having from 1 to 4 carbon atoms, and a process for preparing same.
    Type: Grant
    Filed: August 15, 1989
    Date of Patent: January 22, 1991
    Assignee: Mitsui Toatsu Chemicals, Inc.
    Inventors: Keizaburo Yamaguchi, Masayuki Ooe, Akihiro Yamaguchi