Abstract: Methods, systems, and devices for latency reduction of boot procedures for memory systems are described. A memory system may receive a first command to perform a first reset of one or more components as part of a first phase of a boot procedure of a host system. The memory system may initiate an initialization process of a second phase of the boot procedure upon determining whether the value of a flag has been set from a first value to a second value. Upon completing the initialization process, the flag may be set to the first value. Parameters corresponding to the characteristics of the memory system may be communicated to the host system based on receiving a second command. The memory system may perform a configuration operation of a logical-to-physical mapping concurrently with communicating the parameters with the host system.

Abstract: A computing system (100) having a storage system that includes a storage device (130) and a host device (105), where the host device (105) is configured to issue memory access commands to the storage device (130). The computing system (100) further includes a prediction system (190) comprising processing circuitry that is configured to perform operations that cause the prediction system (190) to identify one or more components of the storage system (918) that limit random rad performance of the storage system (918). The operations further cause the prediction system (190) to obtain characterization data that is indicative of the impact of the one or more components on random read performance and generate a model based on the characterization data to predict random read performance of the storage system (918).

Abstract: A memory device includes an interface to communicate with a host, an array of memory cells, and a controller. The controller is configured to access the array of memory cells in response to commands from the host. The controller is further configured to enter an idle time in response to no commands from the host with queue empty, receive a first command from the host, and exit the idle time in response receiving a second command from the host. The controller is further configured to for a plurality of idle times, generate a history indicating a length of each idle time. The controller is further configured to predict the length of a subsequent idle time based on the history.

Abstract: A computing system (100) having a storage system that includes a storage device (130) and a host device (105), where the host device (105) is configured to issue memory access commands to the storage device (130). The computing system (100) further includes a prediction system (190) comprising processing circuitry that is configured to perform operations that cause the prediction system (190) to identify one or more components of the storage system (918) that limit random rad performance of the storage system (918). The operations further cause the prediction system (190) to obtain characterization data that is indicative of the impact of the one or more components on random read performance and generate a model based on the characterization data to predict random read performance of the storage system (918).

Abstract: An output buffer includes an output stage formed by a pull-up transistor and a pull-down transistor connected in series between a supply line set at a supply potential and a ground line set at a ground potential. The output buffer further includes a pre-biasing stage for pre-biasing the control terminal of the pull-up transistor and a pre-biasing stage for pre-biasing the control terminal of the pull-down transistor in order to bring these transistors to the turning-on threshold.

Abstract: Described herein is an output buffer including an output stage formed by a pull-up transistor and a pull-down transistor connected in series between a supply line set at a supply potential and a ground line set at a ground potential. The output buffer further including a pre-biasing stage for pre-biasing the control terminal of the pull-up transistor and a pre-biasing stage for pre-biasing the control terminal of the pull-down transistor in order to bring these transistors to the turning-on threshold.