Patents by Inventor Masuaki Murao

Masuaki Murao has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Abnormality determination and estimation method, and abnormality determination and estimation device for weld product
    Patent number: 7939780
    Abstract: An abnormality determination and estimation device for a weld product in a welding process includes a jig device and an AE sensor. The jig device holds the product by a holding face, through which the jig device and the product are in close contact with each other. The AE sensor detects an elastic wave in the jig device. Accordingly, abnormality detection accuracy can be improved, and abnormalities can be discriminated.
    Type: Grant
    Filed: October 4, 2006
    Date of Patent: May 10, 2011
    Assignee: Denso Corporation
    Inventors: Masuaki Murao, Makoto Sakakibara
  • Abnormality determination and estimation method, and abnormality determination and estimation device for weld product
    Publication number: 20070090098
    Abstract: An abnormality determination and estimation device for a weld product in a welding process includes a jig device and an AE sensor. The jig device holds the product by a holding face, through which the jig device and the product are in close contact with each other. The AE sensor detects an elastic wave in the jig device. Accordingly, abnormality detection accuracy can be improved, and abnormalities can be discriminated.
    Type: Application
    Filed: October 4, 2006
    Publication date: April 26, 2007
    Applicant: DENSO Corporation
    Inventors: Masuaki Murao, Makoto Sakakibara
  • Abnormality determination and estimation method for product of plastic working, and an abnormality determination and estimation device
    Patent number: 7054789
    Abstract: The abnormality determination and estimation device (200a) estimates the presence or absence of an abnormality of the product of plastic working with respect to an elastic wave in processing of a non-defective product, based on a first elastic wave A1 that is an elastic wave generated in a processing step immediately before an upper die comes into contact with a lower die after the beginning of plastic working, a second elastic wave A2 that is an elastic wave generated in a processing step when the upper die comes into contact with the lower die, and a third elastic wave A3 that is an elastic wave generated in a processing step after the upper die comes into contact with the lower die. This makes it possible to improve the precision of abnormality detection and discriminate the abnormalities.
    Type: Grant
    Filed: June 2, 2004
    Date of Patent: May 30, 2006
    Assignees: DENSO Corporation, Yonekura Mfg. Co., Ltd.
    Inventors: Masuaki Murao, Yasuhiro Onishi
  • Abnormality determination and estimation method for product of plastic working, and an abnormality determination and estimation device
    Publication number: 20040249611
    Abstract: The abnormality determination and estimation means (200a) estimates the presence or absence of an abnormality of the product of plastic working with respect to an elastic wave in processing of a non-defective product, based on a first elastic wave Al that is an elastic wave generated in a processing step immediately before an upper die comes into contact with a lower die after the beginning of plastic working, a second elastic wave A2 that is an elastic wave generated in a processing step when the upper die comes into contact with the lower die, and a third elastic wave A3 that is an elastic wave generated in a processing step after the upper die comes into contact with the lower die. This makes it possible to improve the precision of abnormality detection and discriminate the abnormalities.
    Type: Application
    Filed: June 2, 2004
    Publication date: December 9, 2004
    Inventors: Masuaki Murao, Yasuhiro Onishi