Patents by Inventor Masumi Nomura
Masumi Nomura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11900642Abstract: An inspection device having a plurality of functions is achieved. The performance of an inspection device is improved. A structure of an inspection device is simplified. A structure of an imaging device is simplified. The inspection device includes a light source having a function of emitting infrared light, a light source having a function of emitting visible light, and an imaging portion which are provided over a substrate having flexibility, and inspects a fruit or vegetable. A first image based on light including reflected light of the infrared light, and a second image and a third image based on tight including reflected light of the visible light are captured by the imaging portion. The inspection device has a function of detecting one or more of the sugar content, the acidity, and a physiological disorder of a fruit or vegetable on the basis of the first image.Type: GrantFiled: October 1, 2019Date of Patent: February 13, 2024Assignee: Semiconductor Energy Laboratory Co., Ltd.Inventors: Masumi Nomura, Seiichi Yoneda
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Publication number: 20230315028Abstract: An estimation device includes an observation system constraint determination unit configured to determine data within constraints that is data within a first constraint based on time series data of each observation value of a first observation value observed by a first observation system and a second observation value observed by a second observation system, a model estimation unit configured to estimate parameters of a plurality of models including an observation model that is a model of each of the observation systems and a physical model that is a model within an apparatus provided with each of the observation systems based on the data within constraints, and a consistency determination unit configured to determine consistency of the models based on a deviation between a first predicted observation value predicted from the second observation system based on the estimated parameters and the first observation value.Type: ApplicationFiled: July 29, 2021Publication date: October 5, 2023Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Hirotaka Oka, Masumi Nomura, Tatsuo Ishiguro, Katsuaki Morita, Ryuji Ikeda, Kenichi Nagahara, Sota Kogawa, Noriyuki Matsukura, Satoshi Nikaido, Yuki Nishizaki
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Publication number: 20230280240Abstract: An abnormality diagnosis device includes an abnormality determination unit configured to determine whether or not there is an abnormality with respect to a state quantity acquired from equipment and a cause estimation unit configured to estimate a cause of the abnormality in the equipment from a state quantity determined to be abnormal by the abnormality determination unit using a cause correspondence table in which a cause of an abnormal mode of the equipment identified in fault tree analysis is associated with the state quantity that is abnormal when the cause has occurred.Type: ApplicationFiled: July 29, 2021Publication date: September 7, 2023Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Hirotaka Oka, Masumi Nomura, Tatsuo Ishiguro, Katsuaki Morita, Ryuji Ikeda, Kenichi Nagahara, Sota Kogawa, Noriyuki Matsukura, Satoshi Nikaido, Yuki Nishizaki
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Publication number: 20230280735Abstract: A monitoring device includes: an operation record acquisition unit configured to acquire operation records indicating a transition in a load factor or a load change factor with respect to operation time leading up to failure in failure cases; a threshold setting unit configured to set a threshold to be contrasted with the load factor or the load change factor in the operation records of the failure cases; a wear rate acquisition unit configured to acquire a wear rate that is a value derived from a relation between the load factor or the load change factor and the threshold and indicates a degree of progress of wear of a device according to operation time; and a failure rate cumulative frequency acquisition unit configured to acquire a transition in a failure rate cumulative frequency of the failure cases with respect to the wear rate.Type: ApplicationFiled: July 29, 2021Publication date: September 7, 2023Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Hirotaka Oka, Masumi Nomura, Tatsuo Ishiguro, Katsuaki Morita, Ryuji Ikeda, Kenichi Nagahara, Sota Kogawa, Noriyuki Matsukura, Satoshi Nikaido, Yuki Nishizaki
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Patent number: 11566983Abstract: A state quantity acquisition unit acquires a state quantity of a target apparatus including a temperature of the target apparatus. A load specification unit specifies a load history of the target apparatus, based on the state quantity. A remaining life calculation unit calculates a parameter related to a remaining life of the target apparatus for each of a plurality of degradation types, based on the load history specified by the load specification unit.Type: GrantFiled: November 28, 2017Date of Patent: January 31, 2023Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Kuniaki Aoyama, Hideaki Kaneko, Masumi Nomura, Yasuoki Tomita, Katsuhiko Abe
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Patent number: 11480948Abstract: A monitoring target selecting device configured to output a measurement parameter to an abnormality diagnosis device to diagnose an abnormal event of a plant based on a correlation value representing a mutual correlation between measurement parameters, and includes a classification unit to acquire a plurality of measurement parameters measured in the plant, classify a change behavior of measured value over a time for each of the plurality of measurement parameters in a first period, and classify a change behavior of a measured value over a time for each of the plurality of measurement parameters in each of the first period and a second period, and a selection unit to select the measurement parameter as a measurement parameter to be output to the abnormality diagnosis device on the basis of a result of comparing a behavior of the measurement parameters in the first period to the second period.Type: GrantFiled: August 7, 2018Date of Patent: October 25, 2022Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Susumu Shiizuka, Masumi Nomura
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Patent number: 11416705Abstract: An image acquisition unit acquires image data in which an image of a normal monitoring target is captured. An image processing unit generates a plurality of duplicate image data pieces by performing different image processing causing a change in color tone on the image data within a range not exceeding a normal range of the monitoring target. A learning unit trains a model so as to output a value used for determining normality of the monitoring target from the image data, in which the image of the monitoring target is captured, using the plurality of duplicate image data pieces as training data.Type: GrantFiled: July 13, 2018Date of Patent: August 16, 2022Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Masumi Nomura, Koki Tateishi, Motoshi Takasu
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Publication number: 20220187805Abstract: It is judged whether a first predicted value of an operation index obtained by inputting a scheduled change value of a manipulation parameter of a plant meets an operation criterion, and whether a second predicted value of the operation index obtained by inputting a virtual change value with a greater change amount from a current value than the scheduled change value to a prediction model meets the operation criterion. If it is judged that the first predicted value and the second predicted value meet the operation criterion, the scheduled change value is output as a command value of the manipulation parameter.Type: ApplicationFiled: March 24, 2020Publication date: June 16, 2022Inventors: Yusuke HAZUI, Masumi NOMURA, Shigeru ANO, Kenta WADA, Koshiro FUKUMOTO
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Publication number: 20210358120Abstract: An inspection device having a plurality of functions is achieved. The performance of an inspection device is improved. A structure of an inspection device is simplified. A structure of an imaging device is simplified. The inspection device includes a light source having a function of emitting infrared light, a light source having a function of emitting visible light, and an imaging portion which are provided over a substrate having flexibility, and inspects a fruit or vegetable. A first image based on light including reflected light of the infrared light, and a second image and a third image based on tight including reflected light of the visible light are captured by the imaging portion. The inspection device has a function of detecting one or more of the sugar content, the acidity, and a physiological disorder of a fruit or vegetable on the basis of the first image.Type: ApplicationFiled: October 1, 2019Publication date: November 18, 2021Inventors: Masumi NOMURA, Seiichi YONEDA
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Publication number: 20210287122Abstract: Provided is a prediction device that outputs a prediction value of process data in consideration of a prediction error of a prediction model. A prediction device includes a data collection unit that collects process data of a device; a prediction model construction unit that constructs a prediction model having a predetermined input variable of first process data as an input value and having a predetermined output variable as an output value, and an error calculation model which calculates a prediction error of the prediction model, based on the first process data collected by the data collection unit; and a prediction unit that outputs a prediction value which is corrected based on a prediction value of the output variable for second process data and a prediction error for the prediction value of the output variable, the prediction value being predicted based on the input variable of the second process data collected by the data collection unit, the prediction model, and the error calculation model.Type: ApplicationFiled: July 24, 2019Publication date: September 16, 2021Inventors: Masumi NOMURA, Yusuke HAZUI, Shigeru ANO, Kenta WADA, Koshiro FUKUMOTO
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Publication number: 20210108999Abstract: A state quantity acquisition unit acquires a state quantity of a target apparatus including a temperature of the target apparatus. A load specification unit specifies a load history of the target apparatus, based on the state quantity. A remaining life calculation unit calculates a parameter related to a remaining life of the target apparatus for each of a plurality of degradation types, based on the load history specified by the load specification unit.Type: ApplicationFiled: November 28, 2017Publication date: April 15, 2021Inventors: Kuniaki AOYAMA, Hideaki KANEKO, Masumi NOMURA, Yasuoki TOMITA, Katsuhiko ABE
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Patent number: 10969305Abstract: A planning device according to the present invention includes a remaining life specifying unit that specifies a remaining life of a component for a turbine. On the basis of the specified remaining life, a usage plan generating unit generates a usage plan that indicates the timing at which the component is to be incorporated into the turbine, such that the remaining life of the component becomes equal to or less than an allowable error value at a predetermined timing.Type: GrantFiled: October 25, 2016Date of Patent: April 6, 2021Assignee: MITSUBISHI POWER, LTD.Inventors: Toru Tanaka, Akihisa Endo, Yusuke Hazui, Masumi Nomura
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Patent number: 10883427Abstract: A turbine analysis device includes a state quantity acquiring unit configured to acquire a state quantity of a turbine, the state quantity including at least a temperature of the turbine. A load specifying unit is configured to calculate a history of a load of the turbine, based on the state quantity. A load and time calculating unit is configured to derive a relationship between the load of the turbine and an operable time when the turbine is operated at the load, based on a designed service life of the turbine and the history of the load that has been calculated by the load specifying unit.Type: GrantFiled: October 25, 2016Date of Patent: January 5, 2021Assignee: MITSUBISHI POWER, LTD.Inventors: Toru Tanaka, Akihisa Endo, Yusuke Hazui, Masumi Nomura
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Publication number: 20200225644Abstract: A monitoring target selecting device configured to output a measurement parameter to an abnormality diagnosis device to diagnose an abnormal event of a plant based on a correlation value representing a mutual correlation between measurement parameters, and includes a classification unit to acquire a plurality of measurement parameters measured in the plant, classify a change behavior of measured value over a time for each of the plurality of measurement parameters in a first period, and classify a change behavior of a measured value over a time for each of the plurality of measurement parameters in each of the first period and a second period, and a selection unit to select the measurement parameter as a measurement parameter to be output to the abnormality diagnosis device on the basis of a result of comparing a behavior of the measurement parameters in the first period to the second period.Type: ApplicationFiled: August 7, 2018Publication date: July 16, 2020Applicant: MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Susumu Shiizuka, Masumi Nomura
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Publication number: 20200184265Abstract: An image acquisition unit acquires image data in which an image of a normal monitoring target is captured. An image processing unit generates a plurality of duplicate image data pieces by performing different image processing causing a change in color tone on the image data within a range not exceeding a normal range of the monitoring target. A learning unit trains a model so as to output a value used for determining normality of the monitoring target from the image data, in which the image of the monitoring target is captured, using the plurality of duplicate image data pieces as training data.Type: ApplicationFiled: July 13, 2018Publication date: June 11, 2020Inventors: Masumi NOMURA, Koki TATEISHI, Motoshi TAKASU
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Patent number: 10255886Abstract: An inspection record apparatus includes: a display unit; a memory unit configured to store inspection record data including image information concerning a subject and information concerning a damaged state of the subject, and information indicating whether the information concerning the damaged state is in a confirmed status or not; a display control unit configured to read the inspection record data to develop the information concerning the damaged state on an image corresponding to the image information, and display the resultant image onto the display unit; a detection unit configured to detect an operation for the information concerning the damaged state; a storage unit configured to store the information indicating that the information concerning the damaged state is in the confirmed status into the memory unit; and a changing unit configured to change a display manner of the information concerning the damaged state.Type: GrantFiled: October 9, 2014Date of Patent: April 9, 2019Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.Inventors: Shingo Ito, Koki Tateishi, Masumi Nomura, Tatsuya Sakai
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Publication number: 20180328290Abstract: A turbine analysis device according to the present application includes a state quantity acquiring unit configured to acquire a state quantity of a turbine, the state quantity including a temperature of the turbine. A load specifying unit specifies a history of a load of the turbine, based on the state quantity. A load and time calculating unit calculates a relationship between the load of the turbine and an operable time when the turbine is operated at the load, based on a designed service life of the turbine and on a history of the load that has been specified by the load specifying unit.Type: ApplicationFiled: October 25, 2016Publication date: November 15, 2018Inventors: Toru TANAKA, Akihisa ENDO, Yusuke HAZUI, Masumi NOMURA
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Publication number: 20180313720Abstract: A planning device according to the present invention includes a remaining life specifying unit that specifies a remaining life of a component for a turbine. On the basis of the specified remaining life, a usage plan generating unit generates a usage plan that indicates the timing at which the component is to be incorporated into the turbine, such that the remaining life of the component becomes equal to or less than an allowable error value at a predetermined timing.Type: ApplicationFiled: October 25, 2016Publication date: November 1, 2018Inventors: Toru TANAKA, Akihisa ENDO, Yusuke HAZUI, Masumi NOMURA
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Patent number: 9660518Abstract: A switching converter in which deterioration and breakage can be suppressed is provided. A switching converter whose area can be reduced is provided. The switching converter includes a switch connected to a power supply portion; a transformer connected to the power supply portion; a first rectifying and smoothing circuit and a second rectifying and smoothing circuit each connected to at least the transformer; and a switching control circuit which is connected to the first rectifying and smoothing circuit and the second rectifying and smoothing circuit and which controls operation of the switch. The switching control circuit includes a control circuit controlling on/off of the switch and operation of a starter circuit; and the starter circuit controlling startup of the control circuit. The starter circuit includes a transistor and a resistor each including a wide-gap semiconductor.Type: GrantFiled: May 2, 2013Date of Patent: May 23, 2017Assignee: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.Inventors: Masumi Nomura, Kosei Noda
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Patent number: 9490241Abstract: A semiconductor device which is downsized while a short-channel effect is suppressed and whose power consumption is reduced is provided. A downsized SRAM circuit is formed, which includes a first inverter including a first transistor and a second transistor overlapping with each other; a second inverter including a third transistor and a fourth transistor overlapping with each other; a first selection transistor; and a second selection transistor. An output terminal of the first inverter, an input terminal of the second inverter, and one of a source and a drain of the first selection transistor are connected to one another, and an output terminal of the second inverter, an input terminal of the first inverter, and one of a source and a drain of the second selection transistor are connected to one another.Type: GrantFiled: June 26, 2012Date of Patent: November 8, 2016Assignee: Semiconductor Energy Laboratory Co., Ltd.Inventors: Masumi Nomura, Tatsuji Nishijima, Kosei Noda