Patents by Inventor Masuyuki Sugiyama
Masuyuki Sugiyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10921296Abstract: A separation column connecting device includes: a column holder for retaining a separation column; a first fitting holder carrying a first fitting which includes a seal portion to be connected to an upstream seal portion of the separation column and connected with an upstream pipe; a second fitting holder carrying a second fitting which includes a seal portion to be connected to a downstream seal portion of the separation column and connected with a downstream pipe; a body member to which either one of the first fitting holder and the second fitting holder is fixed; a driver for moving, relative to the body member, the first fitting holder or the second fitting holder not fixed to the body member; a guide for guiding the column holder in a direction of movement driven by the driver; and an elastic body disposed between the column holder and the second fitting holder.Type: GrantFiled: May 17, 2016Date of Patent: February 16, 2021Assignee: HITACHI HIGH-TECH CORPORATIONInventors: Hideki Hasegawa, Masako Ishimaru, Masuyuki Sugiyama
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Publication number: 20200319061Abstract: In order to detach substances stably from an inspection object, an adhering substance collecting device includes: ejection openings configured to eject gas; a housing on which the ejection openings are provided; and supporting portions which are installed on a surface of the housing on which the ejection openings are provided, and have a prescribed height. The supporting portions include protruded portions formed on the housing. The supporting portions each have a cuboid shape, and are installed such that a distance therebetween becomes smaller toward a direction of a recovery opening that is configured to collect substances having been detached from an inspection object, from the gas.Type: ApplicationFiled: May 29, 2017Publication date: October 8, 2020Inventors: Shun KUMANO, Masuyuki SUGIYAMA, Hisashi NAGANO, Makoto NAMAI, Takahiro ITOU
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Publication number: 20200193545Abstract: To achieve inspection with both a high security level and high throughput, the present invention comprises: a step of acquiring personal information of a subject; a step of calculating a terrorism risk of the subject by referring the acquired personal information to a database storing a relationship between the personal information and the terrorism risk; and a step of using an inspection device for collecting an adhered matter on the subject or on an inspection object carried by the subject and/or a vapor from the adhered matter, ionizing and analyzing the collected matter, and determining whether or not the adhered matter is a dangerous material by referring the analysis result to the database; wherein inspection condition and/or judgement condition of the inspection device is changed on a per-subject basis so that a true positive rate of an inspection is varied according to a level of the calculated terrorism risk.Type: ApplicationFiled: January 16, 2018Publication date: June 18, 2020Inventors: Shun KUMANO, Yuichiro HASHIMOTO, Masuyuki SUGIYAMA, Yasuaki TAKADA
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Patent number: 10684256Abstract: In order to make an analyzer with an ion mobility separation part have high durability and robustness, the analyzer includes an ion source, an ion mobility separation part which includes a pair of facing electrodes to which a high frequency voltage and a DC voltage are applied, and a shielding electrode which is provided between the ion source and the ion mobility separation part and to which a DC voltage is applied, wherein the shielding electrode includes an ion flow path connecting an inlet from which ions from the ion source are introduced and an outlet from which the ions are discharged thereinside, and the ion flow path is bent so that the outlet is unable to be seen from the inlet.Type: GrantFiled: February 28, 2017Date of Patent: June 16, 2020Assignee: Hitachi High-Tech CorporationInventors: Hiroyuki Satake, Kazushige Nishimura, Hideki Hasegawa, Masuyuki Sugiyama
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Patent number: 10551346Abstract: An ion analysis device includes: an ion source that ionizes an analyte in a liquid sample; an ion guide into which droplets and ions produced in the ion source are introduced, the ion guide having different outlets, one outlet being an ion outlet for the ions and the other outlet being a droplet outlet for the droplets; an ion analysis unit that analyzes ions ejected from the ion outlet; a droplet measurement unit that is placed on an axis of the droplet outlet, and measures the amount of droplets; and an analysis control section that compares the amount of droplets measured at the droplet measurement unit with a threshold.Type: GrantFiled: August 19, 2016Date of Patent: February 4, 2020Assignee: Hitachi High-Technologies CorporationInventors: Kazushige Nishimura, Masuyuki Sugiyama, Hideki Hasegawa, Yuichiro Hashimoto
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Publication number: 20200025727Abstract: A separation column connecting device includes: a column holder for retaining a separation column; a first fitting holder carrying a first fitting which includes a seal portion to be connected to an upstream seal portion of the separation column and connected with an upstream pipe; a second fitting holder carrying a second fitting which includes a seal portion to be connected to a downstream seal portion of the separation column and connected with a downstream pipe; a body member to which either one of the first fitting holder and the second fitting holder is fixed; a driver for moving, relative to the body member, the first fitting holder or the second fitting holder not fixed to the body member; a guide for guiding the column holder in a direction of movement driven by the driver; and an elastic body disposed between the column holder and the second fitting holder.Type: ApplicationFiled: May 17, 2016Publication date: January 23, 2020Inventors: Hideki HASEGAWA, Masako ISHIMARU, Masuyuki SUGIYAMA
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Patent number: 10466214Abstract: In order to implement a high-sensitivity mass spectrometry through an improvement in solvent removal efficiency during electrospray ionization and the like, an ionization device is provided with a light guide path 28 which guides light from a light source to sample microparticles generated by a micronization device to irradiate the microparticles. A closest distance d2 between a spatial area 34 in which the sample microparticles are present and a distal end 29 of the light guide path is greater than or equal to 0.1 mm and less than or equal to 20 mm. A closest distance d1 between an area of light irradiation 35 by the light guide path and any of a sample surface, a micronization device, and a sample holding unit that is the closest is greater than or equal to 0.01 mm and less than or equal to 10 mm.Type: GrantFiled: December 9, 2015Date of Patent: November 5, 2019Assignee: HITACHI, LTD.Inventors: Masako Ishimaru, Masao Kamahori, Masuyuki Sugiyama, Kazushige Nishimura, Hiroyuki Satake, Hideki Hasegawa
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Patent number: 10431445Abstract: To reduce contamination of the apparatus with an additive and to quickly switch spraying and stopping of the additive, provided is an ion analyzer including: an ion source for ionizing a measurement target substance, a spray unit for atomizing and spraying toward the measurement target substance a liquid containing an additive that reacts with the measurement target substance; a separation analysis unit for separately analyzing an ion generated by a reaction between the measurement target substance and the additive; a detector for detecting the ion that has been separately analyzed by the separation analysis unit; and a control unit for lowering a flow rate of the additive supplied to the spray unit during a time when the additive is not necessary.Type: GrantFiled: October 9, 2015Date of Patent: October 1, 2019Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Kazushige Nishimura, Hiroyuki Satake, Masuyuki Sugiyama, Hideki Hasegawa, Tomoyuki Sakai
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Patent number: 10424472Abstract: A first rod electrode set has a first center axis, into which ions and air current are introduced. A second rod electrode set has a second center axis at a distance from the first center axis, from which the ions are discharged. A power supply applies voltages to the first rod electrode set and the second rod electrode set. The first rod electrode set and the second rod electrode set have a region where the sets overlap each other in the longitudinal direction, and form a single multipole ion guide by being combined to each other in the region. Different offset DC voltages are applied to the first rod electrode set and the second rod electrode set, respectively, and a DC potential for moving the ions to the second rod electrode set in the region is formed, the ions having been guided by the first rod electrode set.Type: GrantFiled: December 21, 2018Date of Patent: September 24, 2019Assignee: Hitachi High-Technologies CorporationInventors: Masuyuki Sugiyama, Hideki Hasegawa, Masao Suga, Hiroyuki Satake, Yuichiro Hashimoto
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Publication number: 20190178841Abstract: An ion analysis device includes: an ion source that ionizes an analyte in a liquid sample; an ion guide into which droplets and ions produced in the ion source are introduced, the ion guide having different outlets, one outlet being an ion outlet for the ions and the other outlet being a droplet outlet for the droplets; an ion analysis unit that analyzes ions ejected from the ion outlet; a droplet measurement unit that is placed on an axis of the droplet outlet, and measures the amount of droplets; and an analysis control section that compares the amount of droplets measured at the droplet measurement unit with a threshold.Type: ApplicationFiled: August 19, 2016Publication date: June 13, 2019Inventors: Kazushige NISHIMURA, Masuyuki SUGIYAMA, Hideki HASEGAWA, Yuichiro HASHIMOTO
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Publication number: 20190148122Abstract: A first rod electrode set has a first center axis, into which ions and air current are introduced. A second rod electrode set has a second center axis at a distance from the first center axis, from which the ions are discharged. A power supply applies voltages to the first rod electrode set and the second rod electrode set. The first rod electrode set and the second rod electrode set have a region where the sets overlap each other in the longitudinal direction, and form a single multipole ion guide by being combined to each other in the region. Different offset DC voltages are applied to the first rod electrode set and the second rod electrode set, respectively, and a DC potential for moving the ions to the second rod electrode set in the region is formed, the ions having been guided by the first rod electrode set.Type: ApplicationFiled: December 21, 2018Publication date: May 16, 2019Inventors: Masuyuki SUGIYAMA, Hideki HASEGAWA, Masao SUGA, Hiroyuki SATAKE, Yuichiro HASHIMOTO
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Publication number: 20190079051Abstract: In order to make an analyzer with an ion mobility separation part have high durability and robustness, the analyzer includes an ion source, an ion mobility separation part which includes a pair of facing electrodes to which a high frequency voltage and a DC voltage are applied, and a shielding electrode which is provided between the ion source and the ion mobility separation part and to which a DC voltage is applied, wherein the shielding electrode includes an ion flow path connecting an inlet from which ions from the ion source are introduced and an outlet from which the ions are discharged thereinside, and the ion flow path is bent so that the outlet is unable to be seen from the inlet.Type: ApplicationFiled: February 28, 2017Publication date: March 14, 2019Inventors: Hiroyuki SATAKE, Kazushige NISHIMURA, Hideki HASEGAWA, Masuyuki SUGIYAMA
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Patent number: 10204773Abstract: A first rod electrode set has a first center axis, into which ions and air current are introduced. A second rod electrode set has a second center axis at a distance from the first center axis, from which the ions are discharged. A power supply applies voltages to the first rod electrode set and the second rod electrode set. The first rod electrode set and the second rod electrode set have a region where the sets overlap each other in the longitudinal direction, and form a single multipole ion guide by being combined to each other in the region. Different offset DC voltages are applied to the first rod electrode set and the second rod electrode set, respectively, and a DC potential for moving the ions to the second rod electrode set in the region is formed, the ions having been guided by the first rod electrode set.Type: GrantFiled: February 23, 2015Date of Patent: February 12, 2019Assignee: Hitachi High-Technologies CorporationInventors: Masuyuki Sugiyama, Hideki Hasegawa, Masao Suga, Hiroyuki Satake, Yuichiro Hashimoto
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Publication number: 20180284083Abstract: In order to implement a high-sensitivity mass spectrometry through an improvement in solvent removal efficiency during electrospray ionization and the like, an ionization device is provided with a light guide path 28 which guides light from a light source to sample microparticles generated by a micronization device to irradiate the microparticles. A closest distance d2 between a spatial area 34 in which the sample microparticles are present and a distal end 29 of the light guide path is greater than or equal to 0.1 mm and less than or equal to 20 mm. A closest distance d1 between an area of light irradiation 35 by the light guide path and any of a sample surface, a micronization device, and a sample holding unit that is the closest is greater than or equal to 0.01 mm and less than or equal to 10 mm.Type: ApplicationFiled: December 9, 2015Publication date: October 4, 2018Inventors: Masako ISHIMARU, Masao KAMAHORI, Masuyuki SUGIYAMA, Kazushige NISHIMURA, Hiroyuki SATAKE, Hideki HASEGAWA
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Publication number: 20180286658Abstract: To reduce contamination of the apparatus with an additive and to quickly switch spraying and stopping of the additive, provided is an ion analyzer including: an ion source for ionizing a measurement target substance, a spray unit for atomizing and spraying toward the measurement target substance a liquid containing an additive that reacts with the measurement target substance; a separation analysis unit for separately analyzing an ion generated by a reaction between the measurement target substance and the additive; a detector for detecting the ion that has been separately analyzed by the separation analysis unit; and a control unit for lowering a flow rate of the additive supplied to the spray unit during a time when the additive is not necessary.Type: ApplicationFiled: October 9, 2015Publication date: October 4, 2018Inventors: Kazushige NISHIMURA, Hiroyuki SATAKE, Masuyuki SUGIYAMA, Hideki HASEGAWA, Tomoyuki SAKAI
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Publication number: 20180149563Abstract: An object of the invention is to improve uniformity of a standard sample used for evaluating a gas flow type analysis system. The invention includes weighing a background into a container; adding a sample solution to the background; drying the sample solution; adding a solvent that can dissolve the sample into the container; and drying the solvent added to the container. The invention is also characterized in that the solvent is an organic solvent, in particular, acetone.Type: ApplicationFiled: November 27, 2017Publication date: May 31, 2018Inventors: Yasuaki TAKADA, Shun KUMANO, Masuyuki SUGIYAMA, Hisashi NAGANO, Tatsuo NOJIRI, Hiroki MIZUNO, Yuichiro HASHIMOTO
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Publication number: 20180025896Abstract: A first rod electrode set has a first center axis, into which ions and air current are introduced. A second rod electrode set has a second center axis at a distance from the first center axis, from which the ions are discharged. A power supply applies voltages to the first rod electrode set and the second rod electrode set. The first rod electrode set and the second rod electrode set have a region where the sets overlap each other in the longitudinal direction, and form a single multipole ion guide by being combined to each other in the region. Different offset DC voltages are applied to the first rod electrode set and the second rod electrode set, respectively, and a DC potential for moving the ions to the second rod electrode set in the region is formed, the ions having been guided by the first rod electrode set.Type: ApplicationFiled: February 23, 2015Publication date: January 25, 2018Inventors: Masuyuki SUGIYAMA, Hideki HASEGAWA, Masao SUGA, Hiroyuki SATAKE, Yuichiro HASHIMOTO
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Patent number: 9601321Abstract: A measurement state in a mass spectrometer device is determined so that the measurement method for the next round of measurement can be automatically determined. The mass spectrometer device (1) is provided with: a first calculation unit (6) that calculates the total amount of ion in a mass spectrum; a second calculation unit (6) that calculates the half-value width of a representative peak selected from peaks appearing in the mass spectrum; and a control unit (7) that determines the measurement method for use in the next round of measurement on the basis of the total amount of ion and the half-value width of the representative peak.Type: GrantFiled: June 14, 2013Date of Patent: March 21, 2017Assignee: Hitachi High-Technologies CorporationInventors: Akihito Kaneko, Yohei Kawaguchi, Masuyuki Sugiyama, Kazushige Nishimura
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Patent number: 9543135Abstract: A mass spectrometer for efficiently ionizing a sample with less carry-over. The ratio of the amount of sample gas to that of a whole headspace gas is increased by decreasing the pressure inside of a sample vessel in which the sample is sealed thereby efficiently ionizing the sample.Type: GrantFiled: July 31, 2012Date of Patent: January 10, 2017Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Shun Kumano, Masuyuki Sugiyama, Yuichiro Hashimoto, Hideki Hasegawa, Masuyoshi Yamada, Kazushige Nishimura, Hidetoshi Morokuma
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Patent number: 9390900Abstract: A mass spectrometer of ionizing a sample by a dielectric barrier discharge under a reduced pressure. An ionization with inconsiderable fragmentation can be carried out highly sensitively by the present invention.Type: GrantFiled: January 21, 2011Date of Patent: July 12, 2016Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATIONInventors: Masuyuki Sugiyama, Yuichiro Hashimoto, Hideki Hasegawa