Abstract: Described herein are systems and techniques for evaluating whether components of a sensing device are functioning properly. An example method includes obtaining a first set of measurements corresponding to a pixel from a first image frame captured by a sensor, wherein each respective measurement from the first set of measurements is associated with a different signal phase; converting the first set of measurements using an analog to digital converter (ADC) to yield a first set of digitized measurements; and determining, based on the first set of digitized measurements, a first confidence map value that corresponds to the pixel from the first image frame, wherein the first confidence map value is indicative of at least one defect in the sensor.

Abstract: Systems and techniques are provided for predicting precision of time-of-flight (TOF) sensor measurements. An example process includes receiving depth data associated with a frame, the depth data being captured by a TOF camera by illuminating a modulated signal of the TOF camera and receiving a reflected signal at the TOF camera, wherein the depth data comprises a plurality of correlation samples based on the reflected signal; receiving, from the TOF camera, grayscale image data corresponding to the frame; determining a modulation amplitude of the modulated signal based on the plurality of correlation samples; determining one or more parameters associated with at least one of the depth data and the grayscale image data; and determining a reliability of the depth data based on the modulation amplitude of the modulated signal, the grayscale image data, and the one or more parameters.