Patents by Inventor Mathias WIENTAPPER

Mathias WIENTAPPER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for checking an electronic component
    Patent number: 10571413
    Abstract: The invention relates to a method for testing an electronic component for defects, by examining the electronic component in a production line by means of automatic optical inspection; determining the coordinates of regions in which an examination using automatic optical inspection is not possible; transmitting the coordinates of these regions from the production line to a computer; transporting the electronic component from the production line into an X-ray device which is arranged outside the production line, for non-destructive material testing; transmitting the coordinates of the regions from the computer to this X-ray device; examining the electronic component by means of the X-ray device only in the regions in which an examination using automatic optical inspection is not possible; transmitting the results of the examination in the X-ray device to the computer; returning the electronic component to the production line if the result indicates that it is not defective.
    Type: Grant
    Filed: April 14, 2016
    Date of Patent: February 25, 2020
    Assignee: YXLON INTERNATIONAL GMBH
    Inventors: Keith Bryant, Bernhard Murkens, Mathias Wientapper
  • METHOD FOR CHECKING AN ELECTRONIC COMPONENT
    Publication number: 20180136145
    Abstract: The invention relates to a method for testing an electronic component for defects, by examining the electronic component in a production line by means of automatic optical inspection; determining the coordinates of regions in which an examination using automatic optical inspection is not possible; transmitting the coordinates of these regions from the production line to a computer; transporting the electronic component from the production line into an X-ray device which is arranged outside the production line, for non-destructive material testing; transmitting the coordinates of the regions from the computer to this X-ray device; examining the electronic component by means of the X-ray device only in the regions in which an examination using automatic optical inspection is not possible; transmitting the results of the examination in the X-ray device to the computer; returning the electronic component to the production line if the result indicates that it is not defective.
    Type: Application
    Filed: April 14, 2016
    Publication date: May 17, 2018
    Applicant: Yxlon International GMBH
    Inventors: Keith BRYANT, Bernhard MURKENS, Mathias WIENTAPPER