Abstract: An optical component for an attenuated total reflection multispectral imaging device, which includes a support substrate and at least two planar waveguides, and wherein the planar waveguides and the support substrate are superimposed together, with the support substrate which covers the planar waveguides; each of the planar waveguides includes at least one diffraction grating; and at least two of the planar waveguides have their diffraction gratings which have values of the average pattern distribution pitch which are distinct from each other; the support substrate includes, on one side opposite the planar waveguides, a face forming an exchange interface with a sample; and an exit face of the optical component corresponds to a lateral face of the support substrate.

Abstract: A method for analysing a sample uses a resonant support having a surface on which a plurality of separated photonic crystals extends. At least two crystals are configured to capture the same analyte. A resonance wavelength associated with each crystal varies with an amount of analyte in contact with the crystal. The wavelengths define a resonance spectral band between 200-1500 nm. The transmission/reflection of the light is maximum at an associated resonance wavelength. The method includes: illuminating the support in the resonance spectral band, the intensity of the lamination being variable in band; acquiring a measurement image using an image sensor, the image having different regions-of-interest each optically coupled to a photonic crystal; using a reference image representative of an image acquired by the image sensor, when the support is illuminated in the resonance spectral band in a reference configuration; and comparing the measurement image with the reference image.

Abstract: Device (1) for observing a sample, comprising a light source (10); an image sensor (35), comprising several pixels (36); a microlens array (30), comprising several convergent microlenses (31), each microlens being disposed facing a pixel, each microlens comprising an image focus, each microlens being configured to form, from light waves being propagated in parallel incidence, a light wave beam (13) converging towards the image focus of said microlens; the device being configured to hold the sample (20) between the light source and the matrix of microlenses; the device being characterized in that it comprises several attenuating elements (32, 32?), each attenuating element being associated with a microlens and with a pixel, each attenuating element being configured to attenuate the light waves converging towards the image focus of the lens with which it is associated.

Abstract: A device includes several distinct laser sources each emitting an individual laser beam, a dispersive element, and a set of deflecting mirrors which, for each laser source, include a deflecting mirror associated to the source, the mirror reflecting the light beam emitted by the source towards the dispersive element, the mirror being positioned and oriented such that, after deflection by the dispersive element, the light beam is substantially centered on a common propagation axis, which is the same for the different light beams, the mirrors being integral with each other.

Abstract: A photonic chip for scene illumination, the photonic chip comprises a substrate comprising a face with an etching, a plurality of waveguides extending parallel to a plane formed by the etched face of the substrate, each waveguide being configured to guide at least one light beam, a plurality of diffraction gratings, respectively formed in a waveguide and each being configured to extract, out of the waveguide in which it is formed and towards the etching of the substrate, the light beam propagating in said waveguide, at least two waveguides being configured to receive light beams of different wavelengths, and wherein the etching of the substrate is configured to extract the light beams out of the substrate, towards the scene to be illuminated, said scene lying against the etched face of the substrate and at the level of the etching of the substrate.

Abstract: An imaging device (100) configured to image a sample (102), comprising: a light source (104) emitting a light; a light deflection device configured to deflect the light emitted by the light source towards the sample, comprising a material portion (106) provided with a first main face (108) arranged opposite the sample (102), a second main face (110), and a first lateral face (112) towards which the light is emitted by the light source; an imager (118) having a detection face (122) arranged opposite the second main face and intended to receive the light backscattered by the sample; wherein one amongst the main faces is provided with oblique portions (114) each configured to deflect a portion of the received light towards the sample (102), and with planar portions (116) configured to let the light backscattered by the sample pass, and wherein each pixel (120) of the imager (118) is arranged opposite one of the planar portions (116) of said one amongst the first and second main faces (108, 110).

Abstract: An optical component for an interferometric imaging device, which comprises: an object arm, including a first planar waveguide and a first diffraction grating formed in the first planar waveguide and capable of extracting light from the object arm; a reference arm, comprising a second planar waveguide and a second diffraction grating formed in the second planar waveguide and capable of extracting light from the reference arm; wherein the optical component is configured such that, in use with an optically reflective surface extending parallel to the plane of the optical component between the object arm and the reference arm, at least part of the light extracted from the object arm interferes with at least part of the light extracted from the reference arm.

Abstract: Methods for characterizing micro-organisms may include (a) depositing micro-organisms on a porous medium with a first and a second surface and pores extending from the first surface to the second surface; (b) arranging the porous medium on the surface of a nutrient medium contained in a chamber, the second surface being arranged in contact with the nutrient medium; (c) moving the porous medium in relation to the chamber; (d) positioning the porous medium between an infrared light source and an image sensor, the light source being configured to emit an incident light wave in an emission wavelength; (e) illuminating micro-organisms retained on the porous medium, using the light source and acquiring an image using the image sensor, the image allowing an observation of at least one colony of micro-organisms; and (f) characterizing the colony of microorganisms from the image acquired in the illuminating (e).

Abstract: A device for observing a biological sample is provided, including: a light source to emit a light beam at a wavelength between 1 ?m and 20 ?m; an image sensor including pixels defining a detection plane; a holder to hold the sample between the source and the sensor at a distance from the plane smaller than 1 mm, such that the source is configured to illuminate an area of the sample larger than 1 mm2, no image-forming optics are placed between the sample and the sensor, and the sensor is configured to acquire an image corresponding to an area of the sample larger than 1 mm2 and representative of an absorption of the beam by the sample at the wavelength; and a processor to determine a map of an amount of analyte in the sample, based on the image acquired by the sensor, the analyte absorbing light at the wavelength.

Abstract: A device for cooling locally, including a cooling member, a crystal having the capacity to cool via absorption of a near-infrared exciting light signal, an illuminating system intended to deliver an exciting light signal, the crystal having an elongate shape about a longitudinal axis between a near end and a far end and having a closed constant outside cross section and containing a central channel formed, from its far end, over at least some of its length, the cooling member including a rod embedded via a first end into the central channel of the crystal and including a protruding second end that forms a cooling finger.

Abstract: A device for detecting (D) at least one predetermined particle (P) includes an interferometric element (EI) arranged so as to be illuminated by an incident radiation (Lin) and comprising at least one so-called thin layer (CM) disposed on top of a so-called substrate layer (Sub), the particle being attached to a surface (Sm) of the thin layer, the interferometric element (EI) forming a Fabry-Pérot cavity with or without attached particle P; a matrix sensor (Det) adapted to detect an image comprising a first portion (P1) deriving from the detection of the incident radiation transmitted (LTBG) by the interferometric element alone and a second portion (P2) deriving from the detection of the incident radiation transmitted (LTP) by the interferometric element and any particle (O, P) attached to a surface (Sm) of the thin layer; a processor (UT) linked to the sensor and configured: to calculate, as a function of wavelengths of the incident radiation ?i i?[1,m], the variation of intensity of at least one first pixel

Abstract: The invention provides a lens-free infrared imaging device (1) intended to image a sample (2), comprising at least one light source (3, 3a, 3b) configured to emit a light according to several wavelengths of the infrared range, and at least one sensor (4) configured to detect some of the light emitted having interacted with the sample, said sensor comprising a plurality of pixels (41), the device being characterised in that the sensor (4) is configured to detect a reflective part of the light emitted. The invention also provides a method for manufacturing this device.

Abstract: A method for analysing a sample uses a resonant support having a surface on which a plurality of separated photonic crystals extends. At least two crystals are configured to capture the same analyte. A resonance wavelength associated with each crystal varies with an amount of analyte in contact with the crystal. The wavelengths define a resonance spectral band between 200-1500 nm. The transmission/reflection of the light is maximum at an associated resonance wavelength. The method includes: illuminating the support in the resonance spectral band, the intensity of the lamination being variable in band; acquiring a measurement image using an image sensor, the image having different regions-of-interest each optically coupled to a photonic crystal; using a reference image representative of an image acquired by the image sensor, when the support is illuminated in the resonance spectral band in a reference configuration; and comparing the measurement image with the reference image.

Abstract: A method for analysing a sample uses a resonant support. The sample extends on the support having a surface on which a plurality of separated photonic crystals extend. The sample extends between a light source and the crystals, wherein a resonance wavelength is associated with each crystal addressing the analyte and the wavelengths of the crystals define a resonance spectral band extending between 2 ?m and 20 ?m. The transmission or reflection of light by each crystal addressing the analyte is maximum at the associated resonance wavelength. The method includes illuminating the support by the light source, the light source emitting an illumination lightwave defining an illumination spectral band which at least partially covers the resonance spectral band, such that a plurality of crystals are simultaneously illuminated; acquiring an image of the support, and then determining the presence of the analyte in the sample from the image.

Abstract: A photonic integrated circuit for an interferometric sensor includes a first waveguide called sensitive arm wherein a first portion of the light radiation is propagated, the sensitive arm being exposed to a first ambient medium and to at least one compound to be detected inducing a modification of the local refractive index perceived by the evanescent part of the electromagnetic field of the first portion of the light radiation, and a second waveguide called reference arm wherein a second portion of the light radiation is propagated, an encapsulation layer encapsulating the reference arm, the encapsulation layer being impermeable to the compound or compounds to be detected, so that the reference arm is exposed only to a second ambient medium, substantially of the same nature as the first ambient medium and without the compound to be detected and interferometric sensor comprising a photonic integrated circuit according to the invention.

Abstract: An optical component for an attenuated total reflection multispectral imaging device, which includes a support substrate and at least two planar waveguides, and wherein the planar waveguides and the support substrate are superimposed together, with the support substrate which covers the planar waveguides; each of the planar waveguides includes at least one diffraction grating; and at least two of the planar waveguides have their diffraction gratings which have values of the average pattern distribution pitch which are distinct from each other; the support substrate includes, on one side opposite the planar waveguides, a face forming an exchange interface with a sample; and an exit face of the optical component corresponds to a lateral face of the support substrate.

Abstract: An optical component for an interferometric imaging device, which comprises: an object arm, including a first planar waveguide and a first diffraction grating formed in the first planar waveguide and capable of extracting light from the object arm; a reference arm, comprising a second planar waveguide and a second diffraction grating formed in the second planar waveguide and capable of extracting light from the reference arm; wherein the optical component is configured such that, in use with an optically reflective surface extending parallel to the plane of the optical component between the object arm and the reference arm, at least part of the light extracted from the object arm interferes with at least part of the light extracted from the reference arm.

Abstract: A device for observing a biological sample is provided, including: a light source to emit a light beam at a wavelength between 1 ?m and 20 ?m; an image sensor including pixels defining a detection plane; a holder to hold the sample between the source and the sensor at a distance from the plane smaller than 1 mm, such that the source is configured to illuminate an area of the sample larger than 1 mm2, no image-forming optics are placed between the sample and the sensor, and the sensor is configured to acquire an image corresponding to an area of the sample larger than 1 mm2 and representative of an absorption of the beam by the sample at the wavelength; and a processor to determine a map of an amount of analyte in the sample, based on the image acquired by the sensor, the analyte absorbing light at the wavelength.

Abstract: A method is provided for observing a biological sample between a light source and a pixelated image sensor, the light emitting an incident light beam, which propagates to the sample along a propagation axis and at an emission wavelength, the method including: illuminating the sample with the source; and acquiring an image of the sample with the sensor, no image-forming optic being placed between the sample and the sensor, the sample absorbing some of the beam, such that the acquired image is representative of an absorption of the beam by the sample at the emission wavelength, the source illuminates an area of the sample larger than 1 mm2, the image acquired of the sample by the sensor corresponds to an area of sample larger than 1 mm2, and pixels of the sensor define a detection plane, the sample being placed at a distance from the plane smaller than 1 mm.

Abstract: A method is provided for observing a biological sample between a light source and a pixelated image sensor, the light emitting an incident light beam, which propagates to the sample along a propagation axis and at an emission wavelength, the method including: illuminating the sample with the source; and acquiring an image of the sample with the sensor, no image-forming optic being placed between the sample and the sensor, the sample absorbing some of the beam, such that the acquired image is representative of an absorption of the beam by the sample at the emission wavelength, the source illuminates an area of the sample larger than 1 mm2, the image acquired of the sample by the sensor corresponds to an area of sample larger than 1 mm2, and pixels of the sensor define a detection plane, the sample being placed at a distance from the plane smaller than 1 mm.