Patents by Inventor Mathieu Peyssard

Mathieu Peyssard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and arrangement for detecting surface and structural defects of a long moving product
    Patent number: 7970202
    Abstract: A method for detecting defects of a material moving in a rolling mill generally comprises illuminating product, obtaining (ACQ) image thereof in at least one spectral band, in pre-processing the formed image, in detecting and extracting (DTEXTR) eventually suspected areas of the pre-processed image, and in classifying (CLASS) the suspected areas into one or several defect or defect-free categories. For hot-rolled materials, the product is inspected in three disjointed spectral bands, including infrared, red and, for instance, green band in such a way that the suspected areas are classified into one or several defect-free or defect categories including the surface and structural defects.
    Type: Grant
    Filed: June 12, 2006
    Date of Patent: June 28, 2011
    Assignee: Siemens VAI Metals Technologies SAS
    Inventors: Pierre-Jean Janin, Mathieu Peyssard
  • Method and Arrangement for Detecting Surface and Structural Defects of a Long Moving Product
    Publication number: 20090245622
    Abstract: A method for detecting defects of a material moving in a rolling mill generally comprises illuminating product, obtaining (ACQ) image thereof in at least one spectral band, in pre-processing the formed image, in detecting and extracting (DTEXTR) eventually suspected areas of the pre-processed image, and in classifying (CLASS) the suspected areas into one or several defect or defect-free categories. For hot-rolled materials, the product is inspected in three disjointed spectral bands, including infrared, red and, for instance, green band in such a way that the suspected areas are classified into one or several defect-free or defect categories including the surface and structural defects.
    Type: Application
    Filed: June 12, 2006
    Publication date: October 1, 2009
    Inventors: Pierre-Jean Janin, Mathieu Peyssard