Patents by Inventor Mathijs P.W. van den Boogaard

Mathijs P.W. van den Boogaard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuit probe for charged particle beam system
    Patent number: 9709600
    Abstract: A probe assembly can be connected and disconnected from its electrical harness within a vacuum chamber so that the probe assembly with the work piece mounted can be rotated and tilted without interference from a cable, and can then be reconnected without opening the vacuum chamber. Also described is a means of grounding a sample and probes when the probe assembly is disconnected from its electrical harness and a means of preventing damage to the probe mechanism and the probe itself by ensuring that the probes are not sticking up too far during operations.
    Type: Grant
    Filed: August 14, 2014
    Date of Patent: July 18, 2017
    Assignee: FEI Company
    Inventors: Paul Johannes L. Barends, Mathijs P. W. van den Boogaard, Philip Brundage
  • Circuit Probe for Charged Particle Beam System
    Publication number: 20150048815
    Abstract: A probe assembly can be connected and disconnected from its electrical harness within a vacuum chamber so that the probe assembly with the work piece mounted can be rotated and tilted without interference from a cable, and can then be reconnected without opening the vacuum chamber. Also described is a means of grounding a sample and probes when the probe assembly is disconnected from its electrical harness and a means of preventing damage to the probe mechanism and the probe itself by ensuring that the probes are not sticking up too far during operations.
    Type: Application
    Filed: August 14, 2014
    Publication date: February 19, 2015
    Applicant: FEI Company
    Inventors: Paul Johannes L. Barends, Mathijs P.W. van den Boogaard, Philip Brundage