Patents by Inventor Mathuranathan Viswanathan

Mathuranathan Viswanathan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • In-line analyzer for wavelet based defect scanning
    Patent number: 9915944
    Abstract: A method and system for providing simultaneous localization of defects in both the time and frequency domain. A high frequency repeating pattern is written on media, and the pattern is read to generate a readback signal, which is converted into ADC samples. The ADC samples are analyzed, in-line, to determine the type of wavelet, level of decomposition, and threshold level for a wavelet transform of the particular readback signal. The wavelet transform provides details and/or approximations (wavelet coefficients) that are analyzed to determine the type, location, and duration of any identified defects. Any noise in the details and/or approximations (wavelet coefficients) is removed by a wavelet based denoising operation. Flags indicating the type, location, and duration of any defects are generated so that the defects may be mapped.
    Type: Grant
    Filed: August 17, 2011
    Date of Patent: March 13, 2018
    Assignee: SEAGATE TECHNOLOGY LLC
    Inventors: Mathuranathan Viswanathan, Myint Ngwe, Quek Leong Choo
  • IN-LINE ANALYZER FOR WAVELET BASED DEFECT SCANNING
    Publication number: 20130046491
    Abstract: A method and system for providing simultaneous localization of defects in both the time and frequency domain. A high frequency repeating pattern is written on media, and the pattern is read to generate a readback signal, which is converted into ADC samples. The ADC samples are analyzed, in-line, to determine the type of wavelet, level of decomposition, and threshold level for a wavelet transform of the particular readback signal. The wavelet transform provides details and/or approximations (wavelet coefficients) that are analyzed to determine the type, location, and duration of any identified defects. Any noise in the details and/or approximations (wavelet coefficients) is removed by a wavelet based denoising operation. Flags indicating the type, location, and duration of any defects are generated so that the defects may be mapped.
    Type: Application
    Filed: August 17, 2011
    Publication date: February 21, 2013
    Applicant: SEAGATE TECHNOLOGY LLC
    Inventors: Mathuranathan Viswanathan, Myint Ngwe, Quek Leong Choo