Patents by Inventor Matt Adsitt

Matt Adsitt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System for evaluating and reporting semiconductor test processes
    Patent number: 6256593
    Abstract: A system is disclosed for evaluating relevant data across independent test sequences and providing a consumable output to give a tester an accurate account of the test data. A method for reporting the results of the test processes includes several steps. First, repair, trending, characterization, timing and engineering data for two separate test sequences are read. Next, the data is compared. Also, an analytical report of the test data comparisons is assembled and output.
    Type: Grant
    Filed: February 24, 2000
    Date of Patent: July 3, 2001
    Assignee: Micron Technology Inc.
    Inventors: Tim Damon, Blane Holden, Matt Adsitt, Dan Dean, Mike Pearson
  • System for evaluating and reporting semiconductor test processes
    Patent number: 6070131
    Abstract: A system is disclosed for evaluating relevant data across independent test sequences and providing a consumable output to give a tester an accurate account of the test data. A method for reporting the results of the test processes includes several steps. First, repair, trending, characterization, timing and engineering data for two separate test sequences are read. Next, the data is compared. Also, an analytical report of the test data comparisons is assembled and output.
    Type: Grant
    Filed: September 26, 1997
    Date of Patent: May 30, 2000
    Assignee: Micron Technology, Inc.
    Inventors: Tim Damon, Blane Holden, Matt Adsitt, Dan Dean, Mike Pearson