Patents by Inventor Matt Boubin

Matt Boubin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Non-invasive diagnostic systems and methods for using the same
    Patent number: 12216147
    Abstract: A method of measuring electromagnetic interference (EMI) to noninvasively identify component degradation or failure in power electronics circuitry. The method involves characterizing the degradation or failure characteristics of the component and modeling those characteristics to enable a machine learning algorithm to identify EMI frequency distribution characteristics that correspond to the degradation or failure. The EMI frequency distribution is measured and the data provided to the machine learning algorithm whereupon the algorithm identifies degradation or failures indicated by the measured data.
    Type: Grant
    Filed: June 8, 2023
    Date of Patent: February 4, 2025
    Assignee: Miami University
    Inventors: Mark Scott, Matt Boubin
  • NON-INVASIVE DIAGNOSTIC SYSTEMS AND METHODS FOR USING THE SAME
    Publication number: 20240159811
    Abstract: A method of measuring electromagnetic interference (EMI) to noninvasively identify component degradation or failure in power electronics circuitry. The method involves characterizing the degradation or failure characteristics of the component and modeling those characteristics to enable a machine learning algorithm to identify EMI frequency distribution characteristics that correspond to the degradation or failure. The EMI frequency distribution is measured and the data provided to the machine learning algorithm whereupon the algorithm identifies degradation or failures indicated by the measured data.
    Type: Application
    Filed: June 8, 2023
    Publication date: May 16, 2024
    Applicant: Miami University
    Inventors: Mark Scott, Matt Boubin
  • Non-invasive diagnostic systems and methods for using the same
    Patent number: 11714114
    Abstract: A method of measuring electromagnetic interference (EMI) to noninvasively identify component degradation or failure in power electronics circuitry. The method involves characterizing the degradation or failure characteristics of the component and modeling those characteristics to enable a machine learning algorithm to identify EMI frequency distribution characteristics that correspond to the degradation or failure. The EMI frequency distribution is measured and the data provided to the machine learning algorithm whereupon the algorithm identifies degradation or failures indicated by the measured data.
    Type: Grant
    Filed: May 20, 2020
    Date of Patent: August 1, 2023
    Assignee: Miami University
    Inventors: Mark Scott, Matt Boubin