Abstract: Methods and systems for predicting electromechanical device failure are disclosed. In an example method, an analytic model, configured to implement predictive diagnostics for an electromechanical device, may be provided. Sensor data may be received from the electromechanical device, which may comprise a plurality of time series for a sensor-measurable parameter associated with operation of the electromechanical device. One or more machine learning processes may be used to update the analytic model. The one or more machine learning processes may comprise determining one or more data anomalies in the plurality of time series. The updated analytic method may be deployed to implement updated predictive diagnostics for the electromechanical device.