Abstract: A method for evaluating test results for a memory module. Contents of a data stream are reviewed for one or more sections of the memory module. A plurality of counters is incremented when a defective portion is encountered in the data stream for a first section of the memory module. Values of the plurality of counters are compared to corresponding threshold values. Provided two or more counter values are at or above their threshold values, the first section is marked as bad, all defective portions of the first section are removed from the test data stream, and a failure header indicating that the first section is bad is stored and because of which counters in an error cache, otherwise each defective portion of the first section is marked as good in the data stream provided an error correction counter value of the plurality of counter values is equal to or below a first threshold value.

Abstract: A method according to one embodiment of the present invention for evaluating test results for a memory module. The method comprises reviewing contents of a test data stream for one or more sections of the memory module. A first counter is incremented when a defective portion is encountered in the test data stream for a first section of the one or more sections of the memory module. Each defective portion of the first section is marked as good in the test data stream so long as a first counter value is equal to or below a first threshold value. Data from the test data stream identifying defective portions of the first section are stored in an error cache for each remaining defective portion of the first section identified after the first counter passes a first threshold value.