Abstract: Disclosed is a test and measurement switch matrix. The test and measurement switch matrix includes a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system. The solid state switch has a dual tee guard arrangement providing low leakage when off. The solid state switch also includes an optically coupled drive, which further improves isolation and reduces undesirable charge injection when changing switch states.

Abstract: Disclosed is a test and measurement switch matrix. The test and measurement switch matrix includes a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system. The solid state switch has a dual tee guard arrangement providing low leakage when off. The solid state switch also includes an optically coupled drive, which further improves isolation and reduces undesirable charge injection when changing switch states.

Abstract: A switch protection circuit includes a discharging circuit and, optionally, a clamping circuit. The discharge circuit operates prior to the switch completing the switching action to discharge capacitance from a signal line of a cable connected to a device under test to a ground voltage. When not discharging, the discharge circuit presents low leakage to a measurement circuit so as not to interfere with such measurement. If present, the clamping circuit clamps a signal line of the cable to a guard structure of the cable so that the discharge circuit can couple both the signal line and the guard structure to ground. The protection circuit operates without significantly worsening low current performance of the measurement instrument.

Abstract: A switch protection circuit includes a discharging circuit and, optionally, a clamping circuit. The discharge circuit operates prior to the switch completing the switching action to discharge capacitance from a signal line of a cable connected to a device under test to a ground voltage. When not discharging, the discharge circuit presents low leakage to a measurement circuit so as not to interfere with such measurement. If present, the clamping circuit clamps a signal line of the cable to a guard structure of the cable so that the discharge circuit can couple both the signal line and the guard structure to ground. The protection circuit operates without significantly worsening low current performance of the measurement instrument.