Patents by Inventor Matthew B. Marzynski

Matthew B. Marzynski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9651606
    Abstract: A fluorescent lamp testing device 10 has a microcontroller 100 that controls tests for ballast discrimination as well as gas integrity, ballast operation, filament continuity and line voltage. The ballast discrimination test is performed by the microcontroller 100 in combination with a photodiode 30 and high/low pass filter 32. Gas integrity is tested with pulse width modulation and a high-voltage, step-up transformer (PWM/T) circuit 42 and an antenna 40. A built in continuity tester has input pins 52, 54 to test the continuity of the filaments in the fluorescent lamp 12. The antenna 40 and a voltage-divider/voltage-sensor connected to the secondary coil in the transformer test for ballast operation. A PCB conductive loop 18, rectifier 20 and op amp 22 test for line voltage.
    Type: Grant
    Filed: June 16, 2014
    Date of Patent: May 16, 2017
    Assignee: Fluke Corporation
    Inventors: Matthew B. Marzynski, Ricardo Rodriguez
  • Publication number: 20150362545
    Abstract: A fluorescent lamp testing device 10 has a microcontroller 100 that controls tests for ballast discrimination as well as gas integrity, ballast operation, filament continuity and line voltage. The ballast discrimination test is performed by the microcontroller 100 in combination with a photodiode 30 and high/low pass filter 32. Gas integrity is tested with pulse width modulation and a high-voltage, step-up transformer (PWM/T) circuit 42 and an antenna 40. A built in continuity tester has input pins 52, 54 to test the continuity of the filaments in the fluorescent lamp 12. The antenna 40 and a voltage-divider/voltage-sensor connected to the secondary coil in the transformer test for ballast operation. A PCB conductive loop 18, rectifier 20 and op amp 22 test for line voltage.
    Type: Application
    Filed: June 16, 2014
    Publication date: December 17, 2015
    Inventors: Matthew B. Marzynski, Ricardo Rodriguez
  • Patent number: D673062
    Type: Grant
    Filed: May 18, 2012
    Date of Patent: December 25, 2012
    Assignee: Fluke Corporation
    Inventor: Matthew B. Marzynski
  • Patent number: D683248
    Type: Grant
    Filed: January 27, 2012
    Date of Patent: May 28, 2013
    Assignee: Fluke Corporation
    Inventor: Matthew B. Marzynski
  • Patent number: D683250
    Type: Grant
    Filed: February 27, 2012
    Date of Patent: May 28, 2013
    Assignee: Fluke Corporation
    Inventors: Matthew B. Marzynski, Huang Wei
  • Patent number: D753639
    Type: Grant
    Filed: July 3, 2014
    Date of Patent: April 12, 2016
    Assignee: Fluke Corporation
    Inventors: Matthew B. Marzynski, Paul A. Richer
  • Patent number: D780609
    Type: Grant
    Filed: March 23, 2016
    Date of Patent: March 7, 2017
    Assignee: Fluke Corporation
    Inventors: Paul A. Richer, Matthew B. Marzynski
  • Patent number: D811910
    Type: Grant
    Filed: January 19, 2017
    Date of Patent: March 6, 2018
    Assignee: Fluke Corporation
    Inventors: Paul A. Richer, Matthew B. Marzynski
  • Patent number: D816070
    Type: Grant
    Filed: February 24, 2016
    Date of Patent: April 24, 2018
    Assignee: Fluke Corporation
    Inventors: Matthew B. Marzynski, Paul A. Richer
  • Patent number: D862527
    Type: Grant
    Filed: February 3, 2017
    Date of Patent: October 8, 2019
    Assignee: Fluke Corporation
    Inventors: David W. Farley, Matthew B. Marzynski
  • Patent number: D926233
    Type: Grant
    Filed: August 23, 2019
    Date of Patent: July 27, 2021
    Assignee: Fluke Corporation
    Inventors: David W. Farley, Matthew B. Marzynski