Abstract: A circuit and method of testing an analog driver circuit using digital scan-based test methodologies. The circuit of the present invention comprises a control circuit for generating signals in response to a test enable signal, a differential driver circuit for receiving a differential input signal, amplifying the differential input signal and transmitting a differential output signal in response to the differential input signal and the signals generated by the control circuit, a programmable termination impedance circuit for generating a differential termination impedance at the output node of the differential driver circuit in response the signals generated by the control circuit, and a differential receiver circuit for receiving the differential output from the differential driver circuit, convert the differential output signal to a single ended signal and transmitting the single ended signal, all in response to the test enable signal.

Abstract: An apparatus, method, microprocessor device and computer program for configuring a termination network of a communication device includes a voltage comparator for comparing a voltage across the termination network with a reference voltage; a logic arrangement for setting a digital control vector in response to a state returned by said voltage comparator; and a first switching apparatus for activating a first weighted-value resistor in response to the setting of the digital control vector. At least a second switching apparatus for activating a second weighted-value resistor, and wherein each of the first and the second weighted-value resistors is represented by a value in the digital control vector may be provided, the first and second resistors are connected in series or in parallel. The digital control vector may be stored in a logic register and distributed to a plurality of termination networks. The logic arrangement may include a finite state machine.