Patents by Inventor Matthew D. Turner

Matthew D. Turner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8842291
    Abstract: Systems and method are disclosed for measuring small angular deflections of a target using weak value amplification. A system includes a beam source, a beam splitter, a target reflecting surface, a photodetector, and a processor. The beam source generates an input beam that is split into first and second beams by the beam splitter. The first and second beams are propagated to the target reflecting surface, at least partially superimposed at the target reflecting surface, and incident to the target reflecting surface normal to the target reflecting surface. The first beam is reflected an additional even number of times during propagation to the photodetector. The second beam is reflected an additional odd number of times during propagation to the photodetector. The first and second beams interfere at the photodetector so as to produce interference patterns. The interference patterns are interpreted to measure angular deflections of the target reflecting surface.
    Type: Grant
    Filed: March 21, 2012
    Date of Patent: September 23, 2014
    Assignee: University of Washington Through Its Center for Commercialization
    Inventors: Matthew D. Turner, Jens H. Gundlach, Charles A. Hagedorn, Stephan Schlamminger
  • Publication number: 20120242999
    Abstract: Systems and method are disclosed for measuring small angular deflections of a target using weak value amplification. A system includes a beam source, a beam splitter, a target reflecting surface, a photodetector, and a processor. The beam source generates an input beam that is split into first and second beams by the beam splitter. The first and second beams are propagated to the target reflecting surface, at least partially superimposed at the target reflecting surface, and incident to the target reflecting surface normal to the target reflecting surface. The first beam is reflected an additional even number of times during propagation to the photodetector. The second beam is reflected an additional odd number of times during propagation to the photodetector. The first and second beams interfere at the photodetector so as to produce interference patterns. The interference patterns are interpreted to measure angular deflections of the target reflecting surface.
    Type: Application
    Filed: March 21, 2012
    Publication date: September 27, 2012
    Applicant: University of Washington through its Center for Commercialization
    Inventors: Matthew D. Turner, Jens H. Gundlach, Charles A. Hagedorn, Stephan Schlamminger
  • Patent number: 7880675
    Abstract: Mitigation of the effects of multipath signals is provided. Such mitigation can include electronically steering the main beam of a receive pattern associated with a phased array antenna away from a transmitting antenna. In addition, a phase taper is applied to groups of antenna elements to create a null in the main beam, bifurcating that beam. The multipath signal may be placed in or towards the null, while the direct path signal may be placed on one of the halves of the main beam adjacent the null, such that the signal strength of the multipath signal is attenuated as compared to the signal strength of the direct path signal.
    Type: Grant
    Filed: December 16, 2008
    Date of Patent: February 1, 2011
    Assignee: Ball Aerospace & Technologies Corp.
    Inventors: Dean A. Paschen, Matthew D. Turner