Patents by Inventor Matthew Earl Wallace Reed

Matthew Earl Wallace Reed has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scatter Melt Detection Systems and Methods of Using the Same
    Publication number: 20230360937
    Abstract: High bandwidth time-and-space resolved scatter phase transition microscopy systems configured to detect melt onset in a wafer being processed by laser annealing systems with ultra-short dwell times and spot size.
    Type: Application
    Filed: April 10, 2023
    Publication date: November 9, 2023
    Inventors: Matthew Earl Wallace Reed, Xiaohua Shen
  • Melt detection systems and methods of using the same
    Patent number: 11417551
    Abstract: High bandwidth time-and-space resolved phase transition microscopy systems configured to detect melt onset in a wafer being processed by laser annealing systems with ultra-short dwell times and spot size.
    Type: Grant
    Filed: June 30, 2020
    Date of Patent: August 16, 2022
    Assignee: Veeco Instruments Inc.
    Inventor: Matthew Earl Wallace Reed
  • Melt Detection Systems and Methods of Using the Same
    Publication number: 20210013070
    Abstract: High bandwidth time-and-space resolved phase transition microscopy systems configured to detect melt onset in a wafer being processed by laser annealing systems with ultra-short dwell times and spot size.
    Type: Application
    Filed: June 30, 2020
    Publication date: January 14, 2021
    Inventor: Matthew Earl Wallace Reed