Patents by Inventor Matthew Fornes

Matthew Fornes has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10707585
    Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: July 7, 2020
    Assignee: KYMETA CORPORATION
    Inventors: Tom Hower, Lamin Ceesay, Benjamin Ash, Matthew Fornes, William Pedler, Mohsen Sazegar, Jacob Tyler Repp
  • Publication number: 20190229434
    Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.
    Type: Application
    Filed: March 29, 2019
    Publication date: July 25, 2019
    Inventors: Tom Hower, Lamin Ceesay, Benjamin Ash, Matthew Fornes, William Pedler, Mohsen Sazegar, Jacob Tyler Repp
  • Patent number: 10312600
    Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.
    Type: Grant
    Filed: May 16, 2017
    Date of Patent: June 4, 2019
    Assignee: KYMETA CORPORATION
    Inventors: Tom Hower, Lamin Ceesay, Benjamin Ash, Matthew Fornes, William Pedler, Mohsen Sazegar, Jacob Tyler Repp
  • Publication number: 20170338569
    Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.
    Type: Application
    Filed: May 16, 2017
    Publication date: November 23, 2017
    Inventors: Tom Hower, Lamin Ceesay, Benjamin Ash, Matthew Fornes, William Pedler, Mohsen Sazegar, Jacob Tyler Repp
  • Patent number: D843356
    Type: Grant
    Filed: April 12, 2017
    Date of Patent: March 19, 2019
    Assignee: KYMETA CORPORATION
    Inventors: Ryan Stevenson, Steven Linn, Robert Morey, Mohsen Sazegar, Stephen Olfert, Benjamin Ash, Matthew Fornes, Ken Harp, Tom Hower, David Levesque, Mike Slota, Alex Truesdale Perry, Colin Stuart Short, Tung Pham, Andrew Turner, Mohamed Sabri
  • Patent number: D923612
    Type: Grant
    Filed: February 12, 2019
    Date of Patent: June 29, 2021
    Assignee: KYMETA CORPORATION
    Inventors: Ryan Stevenson, Steven Linn, Robert E. Morey, Mohsen Sazegar, Stephen Olfert, Benjamin Ash, Matthew Fornes, Ken Harp, Tom Hower, David Levesque, Michael W. Slota, Alex Truesdale Perry, Colin Stuart Short, Tung Pham, Andrew Turner, Mohamed Sabri