Abstract: A wafer having ?LEDs is inspected using cathodoluminescence microscopes. A fast scan is enabled by splitting the CL beam into several beams and sensing the beams with point detectors. Optical filters are inserted in the optical path upstream of the detectors, such that each detector senses a different frequency band. The signals are ratioed and the ratios are compared to expected reference. Regions of extreme value are identified and, if desired, a high resolution scan is performed on the regions or a sample of the regions. Viability score is calculated for each identified region.

Abstract: A system for manufacturing a 3-D display device is disclosed. The system includes a lenticular image former capable of generating a color lenticular image from a plurality of two dimensional color images, and an electrophotographic printing apparatus configured to receive the color lenticular image from the lenticular image former and to print a CMYK half tone color lenticular image on a surface of a polymeric lenticular lens medium using a powder type toner such that each color when it is printed on the surface of the lenticular lens medium has a printing density of at least 1.0.